Scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
Weitere Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York [u.a.]
Kluwer Academic/Plenum Publishers
2003
|
Ausgabe: | 3. ed. |
Schlagworte: | |
Online-Zugang: | Cover |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | XIX, 689 S. Ill., graph. Darst. |
ISBN: | 9780306472923 0306472929 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
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010 | |a 2002028276 | ||
020 | |a 9780306472923 |9 978-0-306-47292-3 | ||
020 | |a 0306472929 |9 0-306-47292-9 | ||
035 | |a (OCoLC)249358625 | ||
035 | |a (DE-599)BSZ104052627 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-703 |a DE-11 | ||
082 | 0 | |a 502.825 | |
084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
084 | |a UH 6320 |0 (DE-625)145762: |2 rvk | ||
084 | |a VG 9900 |0 (DE-625)147245:253 |2 rvk | ||
245 | 1 | 0 | |a Scanning electron microscopy and x-ray microanalysis |c Joseph I. Goldstein ... |
250 | |a 3. ed. | ||
264 | 1 | |a New York [u.a.] |b Kluwer Academic/Plenum Publishers |c 2003 | |
300 | |a XIX, 689 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Scanning electron microscopy | |
650 | 4 | |a X-ray microanalysis | |
650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
689 | 1 | |5 DE-604 | |
689 | 2 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
689 | 2 | 1 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
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689 | 3 | 0 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |D s |
689 | 3 | |5 DE-604 | |
700 | 1 | |a Goldstein, Joseph |d 1939-2015 |0 (DE-588)1023852381 |4 ctb | |
856 | 4 | |q text/html |u http://swbplus.bsz-bw.de/bsz104052627cov.htm |3 Cover | |
999 | |a oai:aleph.bib-bvb.de:BVB01-020472924 |
Datensatz im Suchindex
_version_ | 1804143123906953216 |
---|---|
any_adam_object | |
author2 | Goldstein, Joseph 1939-2015 |
author2_role | ctb |
author2_variant | j g jg |
author_GND | (DE-588)1023852381 |
author_facet | Goldstein, Joseph 1939-2015 |
building | Verbundindex |
bvnumber | BV036551378 |
classification_rvk | UH 6310 UH 6320 VG 9900 |
ctrlnum | (OCoLC)249358625 (DE-599)BSZ104052627 |
dewey-full | 502.825 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502.825 |
dewey-search | 502.825 |
dewey-sort | 3502.825 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Chemie / Pharmazie Allgemeine Naturwissenschaft Physik |
edition | 3. ed. |
format | Book |
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id | DE-604.BV036551378 |
illustrated | Illustrated |
indexdate | 2024-07-09T22:42:40Z |
institution | BVB |
isbn | 9780306472923 0306472929 |
language | English |
lccn | 2002028276 |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020472924 |
oclc_num | 249358625 |
open_access_boolean | |
owner | DE-703 DE-11 |
owner_facet | DE-703 DE-11 |
physical | XIX, 689 S. Ill., graph. Darst. |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | Kluwer Academic/Plenum Publishers |
record_format | marc |
spelling | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... 3. ed. New York [u.a.] Kluwer Academic/Plenum Publishers 2003 XIX, 689 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s Goldstein, Joseph 1939-2015 (DE-588)1023852381 ctb text/html http://swbplus.bsz-bw.de/bsz104052627cov.htm Cover |
spellingShingle | Scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd |
subject_GND | (DE-588)4065579-9 (DE-588)4048455-5 (DE-588)4151898-6 (DE-588)4320991-9 |
title | Scanning electron microscopy and x-ray microanalysis |
title_auth | Scanning electron microscopy and x-ray microanalysis |
title_exact_search | Scanning electron microscopy and x-ray microanalysis |
title_full | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... |
title_fullStr | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... |
title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... |
title_short | Scanning electron microscopy and x-ray microanalysis |
title_sort | scanning electron microscopy and x ray microanalysis |
topic | Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd |
topic_facet | Scanning electron microscopy X-ray microanalysis Werkstoff Rasterelektronenmikroskopie Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie |
url | http://swbplus.bsz-bw.de/bsz104052627cov.htm |
work_keys_str_mv | AT goldsteinjoseph scanningelectronmicroscopyandxraymicroanalysis |