Atomic force microscopy:
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Oxford [u.a.]
Oxford Univ. Press
2010
|
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | Hier auch später erschienene, unveränderte Nachdrucke |
Beschreibung: | VIII, 248 S. Ill., graph. Darst. 25 cm |
ISBN: | 9780199570454 0199570450 9780198826286 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
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020 | |a 9780199570454 |9 978-0-19-957045-4 | ||
020 | |a 0199570450 |9 0-19-957045-0 | ||
020 | |a 9780198826286 |9 978-0-19-882628-6 | ||
035 | |a (OCoLC)845617147 | ||
035 | |a (DE-599)OBVAC08077140 | ||
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041 | 0 | |a eng | |
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084 | |a UH 6320 |0 (DE-625)145762: |2 rvk | ||
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100 | 1 | |a Eaton, Peter |e Verfasser |4 aut | |
245 | 1 | 0 | |a Atomic force microscopy |c Peter Eaton ; Paul West |
264 | 1 | |a Oxford [u.a.] |b Oxford Univ. Press |c 2010 | |
300 | |a VIII, 248 S. |b Ill., graph. Darst. |c 25 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Hier auch später erschienene, unveränderte Nachdrucke | ||
650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
653 | |a Atomic force microscopy. | ||
689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a West, Paul |e Verfasser |4 aut | |
856 | 4 | 2 | |m Digitalisierung UB Bayreuth |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020319620&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-020319620 |
Datensatz im Suchindex
DE-BY-862_location | 2000 |
---|---|
DE-BY-FWS_call_number | 2000/UH 6320 E14 |
DE-BY-FWS_katkey | 496810 |
DE-BY-FWS_media_number | 083000509234 |
_version_ | 1817024181573779456 |
adam_text | Contents
Preface
vii
1
Introduction
1
1.1
Background
to AFM
2
1.2
AFM
today
6
2
AFM
instrumentation
9
2.1
Basic
concepts in AFM instrumentation
9
2.2
The AFM stage
13
2.3
AFM
electronics
27
2.4
Acquisition
software
33
2.5
AFM
cantilevers and probes
36
2.6
AFM
instrument environment
45
2.7
Scanning
environment
46
3
AFM
modes
49
3.1
Topographic modes
49
3.2
Non-topographic modes
64
3.3
Surface modification
78
4
Measuring AFM images
82
4.1
Sample preparation for AFM
82
4.2
Measuring AFM images in contact mode
87
4.3
Measuring AFM images in oscillating modes
96
4.4
High-resolution imaging
100
4.5
Force curves
101
5
AFM image processing and analysis
103
5.1
Processing AFM images
104
5.2
Displaying AFM images
110
5.3
Analysing AFM images
114
6
AFM image artefacts
121
6.1
Probe artefacts
121
6.2
Scanner artefacts
126
6.3
Image processing artefacts
131
6.4
Vibration noise
133
6.5
Noise from other sources
133
6.6
Other artefacts
135
VI
CONTENTS
7
Applications
of AFM
139
7.1
AFM
applications in physical and materials sciences
139
7.2
AFM applications in nanotechnology
151
7.3
Biological applications of AFM
160
7.4
Industrial AFM applications
177
Appendix A: AFM standards
184
Appendix B: Scanner calibration and certification procedures
192
Appendix C: Third party AFM software
198
Bibliography
201
Index
241
|
any_adam_object | 1 |
author | Eaton, Peter West, Paul |
author_facet | Eaton, Peter West, Paul |
author_role | aut aut |
author_sort | Eaton, Peter |
author_variant | p e pe p w pw |
building | Verbundindex |
bvnumber | BV036447401 |
classification_rvk | UH 6320 |
classification_tum | PHY 136f |
ctrlnum | (OCoLC)845617147 (DE-599)OBVAC08077140 |
dewey-full | 502.82 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502.82 |
dewey-search | 502.82 |
dewey-sort | 3502.82 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik |
format | Book |
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id | DE-604.BV036447401 |
illustrated | Illustrated |
indexdate | 2024-11-29T04:01:34Z |
institution | BVB |
isbn | 9780199570454 0199570450 9780198826286 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020319620 |
oclc_num | 845617147 |
open_access_boolean | |
owner | DE-11 DE-29T DE-91G DE-BY-TUM DE-19 DE-BY-UBM DE-188 DE-355 DE-BY-UBR DE-862 DE-BY-FWS DE-83 DE-92 |
owner_facet | DE-11 DE-29T DE-91G DE-BY-TUM DE-19 DE-BY-UBM DE-188 DE-355 DE-BY-UBR DE-862 DE-BY-FWS DE-83 DE-92 |
physical | VIII, 248 S. Ill., graph. Darst. 25 cm |
publishDate | 2010 |
publishDateSearch | 2010 |
publishDateSort | 2010 |
publisher | Oxford Univ. Press |
record_format | marc |
spellingShingle | Eaton, Peter West, Paul Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
subject_GND | (DE-588)4274473-8 |
title | Atomic force microscopy |
title_auth | Atomic force microscopy |
title_exact_search | Atomic force microscopy |
title_full | Atomic force microscopy Peter Eaton ; Paul West |
title_fullStr | Atomic force microscopy Peter Eaton ; Paul West |
title_full_unstemmed | Atomic force microscopy Peter Eaton ; Paul West |
title_short | Atomic force microscopy |
title_sort | atomic force microscopy |
topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
topic_facet | Rasterkraftmikroskopie |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020319620&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT eatonpeter atomicforcemicroscopy AT westpaul atomicforcemicroscopy |
Inhaltsverzeichnis
THWS Schweinfurt Zentralbibliothek Lesesaal
Signatur: |
2000 UH 6320 E14 |
---|---|
Exemplar 1 | ausleihbar Verfügbar Bestellen |