Component reliability for electronic systems:
Gespeichert in:
1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Boston [u.a.]
Artech House
2010
|
Schlagworte: | |
Beschreibung: | XIX, 685 S. Ill., graph. Darst. |
ISBN: | 9781596934368 1596934360 |
Internformat
MARC
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003 | DE-604 | ||
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020 | |a 9781596934368 |9 978-1-59693-436-8 | ||
020 | |a 1596934360 |9 1-59693-436-0 | ||
035 | |a (OCoLC)477251747 | ||
035 | |a (DE-599)BVBBV036099123 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-83 |a DE-634 | ||
082 | 0 | |a 621.381 |2 22 | |
084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
100 | 1 | |a Băjenescu, Titu I. |d 1938- |e Verfasser |0 (DE-588)120876124 |4 aut | |
245 | 1 | 0 | |a Component reliability for electronic systems |c Titu-Marius I. Băjenescu ; Marius I. Bâzu |
264 | 1 | |a Boston [u.a.] |b Artech House |c 2010 | |
300 | |a XIX, 685 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Electronic systems / Testing | |
650 | 4 | |a Reliability (Engineering) | |
650 | 4 | |a Component software / Reliability | |
650 | 4 | |a Software architecture / Reliability | |
700 | 1 | |a Bâzu, Marius I. |d 1948- |e Sonstige |0 (DE-588)120876159 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-018989532 |
Datensatz im Suchindex
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any_adam_object | |
author | Băjenescu, Titu I. 1938- |
author_GND | (DE-588)120876124 (DE-588)120876159 |
author_facet | Băjenescu, Titu I. 1938- |
author_role | aut |
author_sort | Băjenescu, Titu I. 1938- |
author_variant | t i b ti tib |
building | Verbundindex |
bvnumber | BV036099123 |
classification_rvk | ZN 4040 |
ctrlnum | (OCoLC)477251747 (DE-599)BVBBV036099123 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV036099123 |
illustrated | Illustrated |
indexdate | 2024-07-09T22:11:34Z |
institution | BVB |
isbn | 9781596934368 1596934360 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018989532 |
oclc_num | 477251747 |
open_access_boolean | |
owner | DE-83 DE-634 |
owner_facet | DE-83 DE-634 |
physical | XIX, 685 S. Ill., graph. Darst. |
publishDate | 2010 |
publishDateSearch | 2010 |
publishDateSort | 2010 |
publisher | Artech House |
record_format | marc |
spelling | Băjenescu, Titu I. 1938- Verfasser (DE-588)120876124 aut Component reliability for electronic systems Titu-Marius I. Băjenescu ; Marius I. Bâzu Boston [u.a.] Artech House 2010 XIX, 685 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic systems / Testing Reliability (Engineering) Component software / Reliability Software architecture / Reliability Bâzu, Marius I. 1948- Sonstige (DE-588)120876159 oth |
spellingShingle | Băjenescu, Titu I. 1938- Component reliability for electronic systems Electronic systems / Testing Reliability (Engineering) Component software / Reliability Software architecture / Reliability |
title | Component reliability for electronic systems |
title_auth | Component reliability for electronic systems |
title_exact_search | Component reliability for electronic systems |
title_full | Component reliability for electronic systems Titu-Marius I. Băjenescu ; Marius I. Bâzu |
title_fullStr | Component reliability for electronic systems Titu-Marius I. Băjenescu ; Marius I. Bâzu |
title_full_unstemmed | Component reliability for electronic systems Titu-Marius I. Băjenescu ; Marius I. Bâzu |
title_short | Component reliability for electronic systems |
title_sort | component reliability for electronic systems |
topic | Electronic systems / Testing Reliability (Engineering) Component software / Reliability Software architecture / Reliability |
topic_facet | Electronic systems / Testing Reliability (Engineering) Component software / Reliability Software architecture / Reliability |
work_keys_str_mv | AT bajenescutitui componentreliabilityforelectronicsystems AT bazumariusi componentreliabilityforelectronicsystems |