Electrical characterization of organic electronic materials and devices:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Chichester, West Sussex, United Kingdom
Wiley
2009
|
Ausgabe: | 1. publ. |
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | Hier auch später erschienene, unveränderte Nachdrucke Includes bibliographical references and index |
Beschreibung: | XI, 303 S. graph. Darst. |
ISBN: | 9780470750094 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV036044801 | ||
003 | DE-604 | ||
005 | 20170808 | ||
007 | t | ||
008 | 100222s2009 xxud||| |||| 00||| eng d | ||
010 | |a 2009028761 | ||
020 | |a 9780470750094 |c cloth : alk. paper |9 978-0-470-75009-4 | ||
035 | |a (OCoLC)424555633 | ||
035 | |a (DE-599)BVBBV036044801 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
044 | |a xxu |c US | ||
049 | |a DE-703 |a DE-20 | ||
050 | 0 | |a TK7871 | |
082 | 0 | |a 621.381 | |
084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
100 | 1 | |a Stallinga, Peter |d 1966- |e Verfasser |0 (DE-588)139813675 |4 aut | |
245 | 1 | 0 | |a Electrical characterization of organic electronic materials and devices |c Peter Stallinga |
250 | |a 1. publ. | ||
264 | 1 | |a Chichester, West Sussex, United Kingdom |b Wiley |c 2009 | |
300 | |a XI, 303 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Hier auch später erschienene, unveränderte Nachdrucke | ||
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Electronics |x Materials | |
650 | 4 | |a Organic electronics | |
650 | 4 | |a Organic semiconductors | |
650 | 4 | |a Electronic apparatus and appliances |x Materials | |
856 | 4 | 2 | |m Digitalisierung UB Bayreuth |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018936591&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-018936591 |
Datensatz im Suchindex
_version_ | 1804141078628007936 |
---|---|
adam_text | Contents
Preface
їх
1
General
concepts
1
1.1
Introduction
1
1.2
Conduction
mechanism
6
1.3
Chemistry and the energy diagram
10
1.3.1
Energy diagram of crystalline materials
17
1.3.2
Energy diagram of amorphous materials
24
1.4
Disordered materials and the Meyer-Neldel Rule
27
1.5
Devices
28
1.5.1
Resistor
29
1.5.2
Schottky diode
31
1.5.3
MIS diode and MIS tunnel diode
35
1.5.4
Thin-film transistor
35
1.6
Optoelectronics/photo
voltaice
38
2
Two-terminal devices: DC current
45
2.1
Conductance
45
2.1.1
Ohmic conduction
48
2.1.2
Poole-Frenkel
48
2.1.3
Tunneling
52
2.1.4
Space-charge-limited current
53
2.1.5
Granular materials; grain boundaries
57
2.2
DC current of a Schottky barrier
58
2.2.1
High-current regime
60
2.2.2
Displacement current
60
vi
CONTENTS
2.3
DC measurements
62
2.3.1
van
der Pauw
62
2.3.2
Hall effect
64
3
Two-terminal devices: Admittance spectroscopy
65
3.1
Admittance spectroscopy
65
3.1.1
Low-frequency RCL bridge
71
3.1.2
DC admittance
73
3.2
Geometrical capacitance
74
3.3
Equivalent circuits
74
3.4
Resistor; SCLC
79
3.5
Schottky diodes
80
3.5.1
Schottky diode;
nonuniform
doping
84
3.5.2
Schottky diode; adding an abundant deep
acceptor level
84
3.5.3
Schottky diode; minority levels
88
3.5.4
Schottky barrier; temperature dependence
90
3.6
MIS diodes
91
3.6.1
MIS of doped semiconductors
92
3.6.2
MIS with interface states
99
3.6.3
MIS of low-mobility semiconductors
108
3.7
MIS tunnel diode
115
3.8
Noise measurements
117
4
Two-terminal devices: Transient techniques
119
4.1
Kinetics: Emission and capture of carriers
120
4.1.1
Emission and capture in organic materials
125
4.2
Current transient spectroscopy
126
4.2.1
Example of an emission experiment
126
4.2.2
Example of a capture experiment
130
4.3
Thermally stimulated current
133
4.4
Capacitance transient spectroscopy
138
4.4.1
Case study: Example of a capacitance
transient measurement
145
4.5
Deep-level transient spectroscopy
148
4.6
Q-DLTS
151
5
Time-of-flight
153
5.1
Introduction
153
5.2
Drift transient
155
5.3
Diffusive transient
162
CONTENTS
vii
5.4
Violating Einstein s Relation
168
5.5
Multi-trap-and-release
169
5.6
Anomalous transients
174
5.7
High current (space charge) transients
180
5.8
Summary of the ToF technique
184
6
Thin-film transistors
189
6.1
Field-effect transistors
189
6.2
MOS-FET
191
6.2.1
MOS-FET threshold voltage
194
6.2.2
MOS-FET current
196
6.2.3
Exact solution
196
6.2.4
MOS-FET subthreshold current and
subthreshold swing
199
6.3
Introducing TFTs
200
6.4
Basic model
202
6.4.1
Threshold voltage and subthreshold current
206
6.5
Justification for the two-dimensional approach
208
6.6
Ambipolar materials and devices
211
6.7
Contact effects and other simple nonidealities
215
6.7.1
Insulator leakage
217
6.7.2
Contact resistance
221
6.7.3
Contact barriers
223
6.7.4
Grain boundaries
228
6.7.5
Parallel conductance
229
6.8
Metallic contacts in TFTs
230
6.9
Normally-on TFTs
236
6.9.1
Narrow gap semiconductors
239
6.9.2
Thick TFTs
242
6.9.3
Doped semiconductors and inversion-channel
TFT
244
6.9.4
Metal-insulator-metal TFT
246
6.10
Effects of traps
248
6.10.1
Traps and threshold voltage
249
6.10.2
Traps and output curves
250
6.10.3
Traps and transfer curves
253
6.10.4
Traps and stressing (threshold-voltage shift)
264
6.10.5
Traps and transients
267
6.10.6
The origin of the traps
269
6.10.7
Summary of the effects of traps on the TFT
characteristics
271
vüi CONTENTS
6.11
Admittance spectroscopy for the determination of the
mobility in TFTs
272
6.12
Summary of TFT measurements
275
6.13
Diffusion transistor
275
Appendix A Derivation of Equations
(2.21), (2.25), (6.95)
and
(6.101) 281
Bibliography
285
Index
299
|
any_adam_object | 1 |
author | Stallinga, Peter 1966- |
author_GND | (DE-588)139813675 |
author_facet | Stallinga, Peter 1966- |
author_role | aut |
author_sort | Stallinga, Peter 1966- |
author_variant | p s ps |
building | Verbundindex |
bvnumber | BV036044801 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871 |
callnumber-search | TK7871 |
callnumber-sort | TK 47871 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ZN 4800 |
ctrlnum | (OCoLC)424555633 (DE-599)BVBBV036044801 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 1. publ. |
format | Book |
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id | DE-604.BV036044801 |
illustrated | Illustrated |
indexdate | 2024-07-09T22:10:09Z |
institution | BVB |
isbn | 9780470750094 |
language | English |
lccn | 2009028761 |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018936591 |
oclc_num | 424555633 |
open_access_boolean | |
owner | DE-703 DE-20 |
owner_facet | DE-703 DE-20 |
physical | XI, 303 S. graph. Darst. |
publishDate | 2009 |
publishDateSearch | 2009 |
publishDateSort | 2009 |
publisher | Wiley |
record_format | marc |
spelling | Stallinga, Peter 1966- Verfasser (DE-588)139813675 aut Electrical characterization of organic electronic materials and devices Peter Stallinga 1. publ. Chichester, West Sussex, United Kingdom Wiley 2009 XI, 303 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Hier auch später erschienene, unveränderte Nachdrucke Includes bibliographical references and index Electronics Materials Organic electronics Organic semiconductors Electronic apparatus and appliances Materials Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018936591&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Stallinga, Peter 1966- Electrical characterization of organic electronic materials and devices Electronics Materials Organic electronics Organic semiconductors Electronic apparatus and appliances Materials |
title | Electrical characterization of organic electronic materials and devices |
title_auth | Electrical characterization of organic electronic materials and devices |
title_exact_search | Electrical characterization of organic electronic materials and devices |
title_full | Electrical characterization of organic electronic materials and devices Peter Stallinga |
title_fullStr | Electrical characterization of organic electronic materials and devices Peter Stallinga |
title_full_unstemmed | Electrical characterization of organic electronic materials and devices Peter Stallinga |
title_short | Electrical characterization of organic electronic materials and devices |
title_sort | electrical characterization of organic electronic materials and devices |
topic | Electronics Materials Organic electronics Organic semiconductors Electronic apparatus and appliances Materials |
topic_facet | Electronics Materials Organic electronics Organic semiconductors Electronic apparatus and appliances Materials |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018936591&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT stallingapeter electricalcharacterizationoforganicelectronicmaterialsanddevices |