Semiconductor memory testing: fault models and test considerations for high performance embedded SRAM's
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Saarbrücken
VDM Verl. Müller
2009
|
| Beschreibung: | 51 S. Ill., graph. Darst. |
| ISBN: | 3639194403 9783639194401 |
Internformat
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Gupta, Anuj |
| author_facet | Gupta, Anuj |
| author_role | aut |
| author_sort | Gupta, Anuj |
| author_variant | a g ag |
| building | Verbundindex |
| bvnumber | BV035825422 |
| classification_rvk | ZH 5400 |
| ctrlnum | (OCoLC)634925965 (DE-599)BVBBV035825422 |
| discipline | Architektur |
| format | Book |
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| id | DE-604.BV035825422 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:05:29Z |
| institution | BVB |
| isbn | 3639194403 9783639194401 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018684078 |
| oclc_num | 634925965 |
| open_access_boolean | |
| owner | DE-Aug4 |
| owner_facet | DE-Aug4 |
| physical | 51 S. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | VDM Verl. Müller |
| record_format | marc |
| spelling | Gupta, Anuj Verfasser aut Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's Anuj Gupta Saarbrücken VDM Verl. Müller 2009 51 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier |
| spellingShingle | Gupta, Anuj Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's |
| title | Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's |
| title_auth | Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's |
| title_exact_search | Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's |
| title_full | Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's Anuj Gupta |
| title_fullStr | Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's Anuj Gupta |
| title_full_unstemmed | Semiconductor memory testing fault models and test considerations for high performance embedded SRAM's Anuj Gupta |
| title_short | Semiconductor memory testing |
| title_sort | semiconductor memory testing fault models and test considerations for high performance embedded sram s |
| title_sub | fault models and test considerations for high performance embedded SRAM's |
| work_keys_str_mv | AT guptaanuj semiconductormemorytestingfaultmodelsandtestconsiderationsforhighperformanceembeddedsrams |