CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin
Springer Netherland
2008
Berlin Springer US |
| Ausgabe: | 1. Ed. |
| Schriftenreihe: | Frontiers in Electronic Testing
40 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | 1 Online-Ressource (200 S.) |
| ISBN: | 9781402083624 |
| DOI: | 10.1007/978-1-4020-8363-1 |
Internformat
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Datensatz im Suchindex
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| discipline | Maschinenbau / Maschinenwesen Elektrotechnik |
| doi_str_mv | 10.1007/978-1-4020-8363-1 |
| edition | 1. Ed. |
| format | Electronic eBook |
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| id | DE-604.BV035778779 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:04:20Z |
| institution | BVB |
| isbn | 9781402083624 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018638338 |
| open_access_boolean | |
| physical | 1 Online-Ressource (200 S.) |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer Netherland Springer US |
| record_format | marc |
| series | Frontiers in Electronic Testing |
| series2 | Frontiers in Electronic Testing |
| spelling | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test Andrei Pavlov ; Manoj Sachdev 1. Ed. Berlin Springer Netherland 2008 Berlin Springer US 1 Online-Ressource (200 S.) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 40 Nanoelektronik (DE-588)4732034-5 gnd rswk-swf RAM (DE-588)4176909-0 gnd rswk-swf CMOS (DE-588)4010319-5 gnd rswk-swf CMOS (DE-588)4010319-5 s RAM (DE-588)4176909-0 s Nanoelektronik (DE-588)4732034-5 s DE-604 Pavlov, Andrei Sonstige oth Sachdev, Manoj Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 1-402-08362-9 Frontiers in Electronic Testing 40 (DE-604)BV010836129 40 https://doi.org/10.1007/978-1-4020-8363-1 Verlag Volltext |
| spellingShingle | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test Frontiers in Electronic Testing Nanoelektronik (DE-588)4732034-5 gnd RAM (DE-588)4176909-0 gnd CMOS (DE-588)4010319-5 gnd |
| subject_GND | (DE-588)4732034-5 (DE-588)4176909-0 (DE-588)4010319-5 |
| title | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test |
| title_auth | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test |
| title_exact_search | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test |
| title_full | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test Andrei Pavlov ; Manoj Sachdev |
| title_fullStr | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test Andrei Pavlov ; Manoj Sachdev |
| title_full_unstemmed | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test Andrei Pavlov ; Manoj Sachdev |
| title_short | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies |
| title_sort | cmos sram circuit design and parametric test in nano scaled technologies process aware sram design and test |
| title_sub | Process-Aware SRAM Design and Test |
| topic | Nanoelektronik (DE-588)4732034-5 gnd RAM (DE-588)4176909-0 gnd CMOS (DE-588)4010319-5 gnd |
| topic_facet | Nanoelektronik RAM CMOS |
| url | https://doi.org/10.1007/978-1-4020-8363-1 |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT pavlovandrei cmossramcircuitdesignandparametrictestinnanoscaledtechnologiesprocessawaresramdesignandtest AT sachdevmanoj cmossramcircuitdesignandparametrictestinnanoscaledtechnologiesprocessawaresramdesignandtest |