Reliability wearout mechanisms in advanced CMOS technologies:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Hoboken, NJ
Wiley [u.a.]
2009
|
| Series: | IEEE Press series on microelectronic systems
[8] |
| Subjects: | |
| Physical Description: | XV, 624 S. Ill., graph. Darst. |
| ISBN: | 9780471731726 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV035735626 | ||
| 003 | DE-604 | ||
| 005 | 20121022 | ||
| 007 | t | ||
| 008 | 090922s2009 ad|| |||| 00||| eng d | ||
| 020 | |a 9780471731726 |9 978-0-471-73172-6 | ||
| 035 | |a (OCoLC)176924613 | ||
| 035 | |a (DE-599)BVBBV035735626 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1050 |a DE-91 |a DE-83 | ||
| 050 | 0 | |a TK7871.99.M44 | |
| 082 | 0 | |a 621.381 | |
| 084 | |a ZN 4960 |0 (DE-625)157426: |2 rvk | ||
| 084 | |a ELT 358f |2 stub | ||
| 245 | 1 | 0 | |a Reliability wearout mechanisms in advanced CMOS technologies |c Alvin W. Strong ... |
| 264 | 1 | |a Hoboken, NJ |b Wiley [u.a.] |c 2009 | |
| 300 | |a XV, 624 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a IEEE Press series on microelectronic systems |v [8] | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Reliability | |
| 650 | 0 | 7 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |D s |
| 689 | 0 | 1 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Strong, Alvin W. |e Sonstige |4 oth | |
| 830 | 0 | |a IEEE Press series on microelectronic systems |v [8] |w (DE-604)BV040358802 |9 8 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018012136 | ||
Record in the Search Index
| _version_ | 1804140018452660224 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV035735626 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.99.M44 |
| callnumber-search | TK7871.99.M44 |
| callnumber-sort | TK 47871.99 M44 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4960 |
| classification_tum | ELT 358f |
| ctrlnum | (OCoLC)176924613 (DE-599)BVBBV035735626 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01388nam a2200397 cb4500</leader><controlfield tag="001">BV035735626</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20121022 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090922s2009 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780471731726</subfield><subfield code="9">978-0-471-73172-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)176924613</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV035735626</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1050</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.99.M44</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4960</subfield><subfield code="0">(DE-625)157426:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 358f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability wearout mechanisms in advanced CMOS technologies</subfield><subfield code="c">Alvin W. Strong ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, NJ</subfield><subfield code="b">Wiley [u.a.]</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XV, 624 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">IEEE Press series on microelectronic systems</subfield><subfield code="v">[8]</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metal oxide semiconductors, Complementary</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Strong, Alvin W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">IEEE Press series on microelectronic systems</subfield><subfield code="v">[8]</subfield><subfield code="w">(DE-604)BV040358802</subfield><subfield code="9">8</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018012136</subfield></datafield></record></collection> |
| id | DE-604.BV035735626 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:53:18Z |
| institution | BVB |
| isbn | 9780471731726 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018012136 |
| oclc_num | 176924613 |
| open_access_boolean | |
| owner | DE-1050 DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-1050 DE-91 DE-BY-TUM DE-83 |
| physical | XV, 624 S. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Wiley [u.a.] |
| record_format | marc |
| series | IEEE Press series on microelectronic systems |
| series2 | IEEE Press series on microelectronic systems |
| spelling | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... Hoboken, NJ Wiley [u.a.] 2009 XV, 624 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier IEEE Press series on microelectronic systems [8] Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 s Schaltungsentwurf (DE-588)4179389-4 s DE-604 Strong, Alvin W. Sonstige oth IEEE Press series on microelectronic systems [8] (DE-604)BV040358802 8 |
| spellingShingle | Reliability wearout mechanisms in advanced CMOS technologies IEEE Press series on microelectronic systems Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf (DE-588)4179389-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| subject_GND | (DE-588)4179389-4 (DE-588)4148111-2 |
| title | Reliability wearout mechanisms in advanced CMOS technologies |
| title_auth | Reliability wearout mechanisms in advanced CMOS technologies |
| title_exact_search | Reliability wearout mechanisms in advanced CMOS technologies |
| title_full | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... |
| title_fullStr | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... |
| title_full_unstemmed | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... |
| title_short | Reliability wearout mechanisms in advanced CMOS technologies |
| title_sort | reliability wearout mechanisms in advanced cmos technologies |
| topic | Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf (DE-588)4179389-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| topic_facet | Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf CMOS-Schaltung |
| volume_link | (DE-604)BV040358802 |
| work_keys_str_mv | AT strongalvinw reliabilitywearoutmechanismsinadvancedcmostechnologies |