Reliability wearout mechanisms in advanced CMOS technologies:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hoboken, NJ
Wiley [u.a.]
2009
|
| Schriftenreihe: | IEEE Press series on microelectronic systems
[8] |
| Schlagworte: | |
| Beschreibung: | XV, 624 S. Ill., graph. Darst. |
| ISBN: | 9780471731726 |
Internformat
MARC
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Datensatz im Suchindex
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| id | DE-604.BV035735626 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:53:18Z |
| institution | BVB |
| isbn | 9780471731726 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018012136 |
| oclc_num | 176924613 |
| open_access_boolean | |
| owner | DE-1050 DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-1050 DE-91 DE-BY-TUM DE-83 |
| physical | XV, 624 S. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Wiley [u.a.] |
| record_format | marc |
| series | IEEE Press series on microelectronic systems |
| series2 | IEEE Press series on microelectronic systems |
| spelling | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... Hoboken, NJ Wiley [u.a.] 2009 XV, 624 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier IEEE Press series on microelectronic systems [8] Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 s Schaltungsentwurf (DE-588)4179389-4 s DE-604 Strong, Alvin W. Sonstige oth IEEE Press series on microelectronic systems [8] (DE-604)BV040358802 8 |
| spellingShingle | Reliability wearout mechanisms in advanced CMOS technologies IEEE Press series on microelectronic systems Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf (DE-588)4179389-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| subject_GND | (DE-588)4179389-4 (DE-588)4148111-2 |
| title | Reliability wearout mechanisms in advanced CMOS technologies |
| title_auth | Reliability wearout mechanisms in advanced CMOS technologies |
| title_exact_search | Reliability wearout mechanisms in advanced CMOS technologies |
| title_full | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... |
| title_fullStr | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... |
| title_full_unstemmed | Reliability wearout mechanisms in advanced CMOS technologies Alvin W. Strong ... |
| title_short | Reliability wearout mechanisms in advanced CMOS technologies |
| title_sort | reliability wearout mechanisms in advanced cmos technologies |
| topic | Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf (DE-588)4179389-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| topic_facet | Metal oxide semiconductors, Complementary Reliability Schaltungsentwurf CMOS-Schaltung |
| volume_link | (DE-604)BV040358802 |
| work_keys_str_mv | AT strongalvinw reliabilitywearoutmechanismsinadvancedcmostechnologies |