Verfügbarkeit: Evolvable designs of experiments

Evolvable designs of experiments: applications for circuits

Adopting a groundbreaking approach, Iordache shows how to design methods for planning increasingly complex experiments. He begins with an introduction to standard quality methods and the technology in standard electric circuits. He then gives examples of how to apply the proposed methodology in a se...

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1. Verfasser:	Iordache, Octavian (VerfasserIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	Weinheim Wiley-VCH-Verl. 2009
Schlagworte:	Versuchsplanung Mathematisches Modell Chemical engineering > Mathematical models Experimental design Printed circuits > Design and construction
Online-Zugang:	Inhaltstext Inhaltsverzeichnis
Zusammenfassung:	Adopting a groundbreaking approach, Iordache shows how to design methods for planning increasingly complex experiments. He begins with an introduction to standard quality methods and the technology in standard electric circuits. He then gives examples of how to apply the proposed methodology in a series of real-life case studies.
Beschreibung:	Literaturverz. S. 205 - 210
Beschreibung:	XIV, 216 S. Ill., graph. Darst. 25 cm
ISBN:	9783527324248

Internformat

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Datensatz im Suchindex

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adam_text	OCTAVIAN LORDACHE EVOLVABLE DESIGNS OF EXPERIMENTS APPLICATIONS FOR CIRCUITS WILEY- VCH WILEY-VCH VERLAG GMBH & CO. KGAA CONTENTS PREFACE XI ABBREVIATIONS XIII PART ONE INTRODUCTION 1 1 PRINTED CIRCUITS 3 1.1 TECHNOLOGY PRESENTATION 3 1.2 INNER-LAYER PROCESSING 4 1.3 MATERIALS PREPARATION 4 1.4 LAMINATION 5 1.5 DRILLING 5 1.6 MAKING THE HOLE CONDUCTIVE 6 1.7 IMAGING 7 1.8 ELECTROPLATING 8 1.9 COPPER ETCHING 9 1.10 SOLDER MASKING 9 1.11 SURFACE FINISHING 10 1.12 ROUTING 10 1.13 TESTING AND INSPECTION 10 1.14 ASSEMBLING 11 2 PROBLEM SOLVING FOR RELIABILITY AND QUALITY 15 2.1 CONVENTIONAL PARADIGMS 15 2.2 COMPLEXITY AND TIME FRAMES 18 2.3 QUASILINEARITY, CIRCULARITY, AND CLOSURE 21 2.4 ADVANCE OF RELIABILITY PARADIGMS 23 PART TWO EVOLVABLE DESIGNS OF EXPERIMENTS (EDOE) 27 3 POLYSTOCHASTIC MODELS 29 , 3.1 WHAT IS PSM? 29 3.2 BASIC NOTIONS FOR CATEGORICAL FRAME 32 3.3 ILLUSTRATIVE EXAMPLES OF PSM AND CATEGORICAL FRAMES 34 EVOLVABLE DESIGNS OF EXPERIMENTS: APPLICATIONS FOR CIRCUITS. OCTAVIAN IORDACHE COPYRIGHT 2009 WILEY-VCH VERLAG GMBH & CO. KGAA, WEINHEIM ISBN: 978-3-527-32424-8 VI I CONTENTS 3.3.1 LUMPED STOCHASTIC CHAINS 34 3.3.2 CONDITIONAL STOCHASTIC CHAINS 35 4 FIRST-ORDER WAVE EQUATION 37 4.1 ALGEBRAIC FRAMES FOR TIME "T" AND SPACE "Z" 37 42 THE FIRST-ORDER WAVE EQUATION 41 4.3 "KINETIC" MODEL: WALSH-HADAMARD MATRICES 42 4.4 "CONVECTION" MODEL: LATIN SQUARES 44 4.4.1 GF(3) SOLUTION 45 4.4.2 GF(4) SOLUTION 47 4.5 SPECTRAL ANALYSIS: CORRELATION 49 5 INFORMATIONAL ANALYSIS: EDOE MATRICES 51 5.1 WALSH-HADAMARD MATRICES AND LATIN SQUARE DESIGNS 51 5.2 CLASSIFICATION PROCEDURES: INFORMATIONAL CRITERIA 52 5.3 INFORMATIONAL ENTROPY AND DISTANCES 53 5.4 ADAPTABILITY IN CLASSIFICATION 54 5.5 INFORMATIONAL RESULTS 55 5.5.1 PROPOSITION 1 55 5.5.2 PROPOSITION 2 56 5.5.3 PROPOSITION 3 56 5.6 RELATION WITH THERMODYNAMICS 58 5.7 RANKING, DISCARDING, AND REPLICATION OF THE COLUMNS 59 5.8 LUMPING AND SPLITTING COLUMNS 60 5.9 JUXTAPOSING AND CUTTING 61 5.10 TABLES OF DOE MATRICES 62 6 EDOE METHODOLOGY 65 6.1 SCIENTIFIC AND ENGINEERING METHODS 65 6.2 CENTER DESIGN AND HIERARCHY 66 6.3 RECURSIVITY AND FOCUSING 66 6.4 PROBLEM-SOLVING FRAMEWORK FOR PCB QUALITY 67 6.5 FORWARD AND BACKWARD SEARCH 69 6.6 INTERACTIONS: DISSOCIATION-INTEGRATION 71 6.7 EDOE BASIC STEPS 73 6.7.1 PROBLEM STATEMENT 73 6.7.2 PROPOSE THE PRELIMINARY PROBLEM-SOLVING FRAMEWORK 73 6.7.3 SELECT THE DOE MATRICES 73 6.7.4 RUN CENTER DESIGN 74 6.7.5 ANALYZE RESULTS 74 6.7.6 RUN MULTIPLE FORWARD AND BACKWARD STEPS 74 6.7.7 PERFORM DISSOCIATION-INTEGRATION EXPERIMENTS 74 6.7.8 ESTABLISH THE NEW CENTER DESIGN 75 6.7.9 REPEAT THE TESTING PROCEDURE FROM THE NEW CENTER DESIGN 75 6.7.10 RUN SIMULATIONS: ANALYZE THE SOLUTIONS OF THE PROBLEM 75 CONTENTS VII 6.8 EDOE FRAME AND SKUP SCHEMA 75 6.9 COMPARISON OF EDOE WITH OTHER METHODS 81 PART THREE CASE STUDIES 85 7 SOLDER WICKING 87 7.1 ILLUSTRATIVE FAILURE ANALYSIS 87 7.2 ILLUSTRATIVE EDOE FRAME 91 7.3 SKUP SCHEMA FOR SOLDER WICKING 92 8 RELIABILITY ANALYSIS 95 8.1 EDOE FOR RELIABILITY 95 8.2 SKUP SCHEMA FOR RELIABILITY 99 8.3 RELIABILITY MANAGEMENT SYSTEM: MAIN ELEMENTS 100 8.4 RELIABILITY PREDICTION SOFTWARE 101 8.5 MINICOUPONS 103 8.6 RELIABILITY ANALYSIS 104 8.7 1ST ELECTRICAL RESISTANCE ANALYSIS 105 9 DRILLING 111 9.1 DRILLING QUALITY FRAMEWORK 111 9.2 TEST COUPONS 111 9.3 TESTING SMALL PLATED THROUGH HOLES: SKUP SCHEMA FOR DRILLING 113 9.4 RELIABILITY TESTS 116 9.5 LIFETIME MAPS 117 9.6 DRILLING QUALITY EVALUATIONS 119 9.7 TESTING THE DESIGN, D 121 9.8 TESTING FOR PROCESSING, P 122 9.9 RELIABILITY EVALUATIONS 123 10 SURFACE FINISH SOLDERABILITY 125 10.1 FINISH SOLDERABILITY FRAME 125 10.2 SKUP SCHEMA FOR SURFACE FINISH 128 11 DIRECT PLATE 133 11.1 DIRECT PLATE RELIABILITY 131 11.2 MICROSECTIONING RESULTS 132 11.3 ELECTRICAL RESISTANCE VERSUS THE NUMBER OF CYCLES CLASSIFICATION METHOD 132 11.4 ASSOCIATED VECTORS-GRIDS 135 11.5 FIRST STEP OF CLASSIFICATION 136 11.6 SECOND STEP OF CLASSIFICATION 137 11.7 1ST LIFETIME AND ELECTROPLATED CU THICKNESS 138 11.8 SUMMARY 138 11.9 SKUP SCHEMA FOR DIRECT PLATE 139 VIII CONTENTS 12 PLATING VOIDS 141 12.1 PLATING VOIDS TYPE 141 12.2 THE SKUP SCHEMA FOR PLATING VOIDS 145 PART FOUR EVOLVABILITY 149 13 SELF-ADAPTIVE CIRCUITS 151 13.1 EVOLVABILITY LEVELS 151 13.2 SELF-ADAPTIVITY 152 13.3 SELF-ADAPTIVE DESIGNS AND CONSTRUCTIONS 152 13.4 SELF-ADAPTIVE MATERIALS 153 13.5 SELF-ADAPTIVE PROCESSING 155 13.6 SELF-ADAPTABILITY TO TESTING AND FIELD CONDITIONS 156 14 PROACTIVE CIRCUITS 159 14.1 PROACTIVENESS FOR CIRCUITS 159 14.2 EVOLUTIONARY HARDWARE 160 14.3 ELECTROCHEMICAL FILAMENT CIRCUITS 161 14.3.1 ECFC DESIGN 162 14.3.2 MATERIALS FOR ECFC 163 14.3.3 ECFC PROCESSING 163 14.3.4 POTENTIAL ECFC PRODUCTS AND APPLICATIONS 164 15 EVOLVABLE CIRCUITS 165 15.1 EVOLVABILITY CHALLENGES 365 15.2 MOLECULAR ELECTRONICS 166 15.3 BACTERIORHODOPSIN FOR OPTOELECTRONIC CIRCUITRY 167 15.4 EMBEDDED SYMBOLIC-CONNECTIONISTS HYBRIDS 168 15.5 TEMPORAL SYNCHRONY FOR EMBEDDED SYMBOLIC-CONNECTIONIST HYBRIDS 370 15.6 EMBEDDED EDOE 172 15.7 HYBRID CONTROLLED MICROFLUIDIC CIRCUITS 373 15.8 RECONFIGURABLE MICROFLUIDIC CIRCUITS 174 15.9 SELF-CONSTRUCTED MOLECULAR CIRCUITS AND COMPUTING 175 15.10 GENETIC CODE-LIKE MECHANISM FOR MOLECULAR CIRCUITRY 377 15.11 CONVENTIONAL CIRCUITS VERSUS EVOLVABLE CIRCUITS 382 16 EVOLVABLE MANUFACTURING SYSTEMS 385 16.1 MANUFACTURING PARADIGMS 185 16.2 FRACTAL MANUFACTURING SYSTEM 387 16.3 HOLONIC MANUFACTURING SYSTEM 187 16.4 BIOLOGIC MANUFACTURING SYSTEM 389 16.5 VIRTUAL MANUFACTURING SYSTEM 190 16.6 SKUP SCHEMA FOR VIRTUAL MANUFACTURING SYSTEMS 390 16.7 MULTIAGENT MANUFACTURING SYSTEMS: ARCHITECTURE 192 16.8 MULRIAGENT-BASED VERSUS CONVENTIONAL MANUFACTURING SYSTEMS 195 CONTENTS IX PART FIVE 17 17.1 17.2 17.3 17.4 17.5 CONCLUDING REMARKS 199 RELATED CONCEPTS 203 COMPLEXITY 201 EVOLVABILITY 202 POLYSTOCHASTIC METHOD 202 CONSTRUCTIVISM 203 CYBERNETICS AND THE CYCLE OF SCIENCES 203 REFERENCES 205 INDEX 233
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dewey-sort	3621.3192
dewey-tens	620 - Engineering and allied operations 510 - Mathematics
discipline	Mathematik Elektrotechnik / Elektronik / Nachrichtentechnik
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spelling	Iordache, Octavian Verfasser aut Evolvable designs of experiments applications for circuits Octavian Iordache Weinheim Wiley-VCH-Verl. 2009 XIV, 216 S. Ill., graph. Darst. 25 cm txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 205 - 210 Adopting a groundbreaking approach, Iordache shows how to design methods for planning increasingly complex experiments. He begins with an introduction to standard quality methods and the technology in standard electric circuits. He then gives examples of how to apply the proposed methodology in a series of real-life case studies. Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction Versuchsplanung (DE-588)4078859-3 gnd rswk-swf Versuchsplanung (DE-588)4078859-3 s DE-604 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=3152860&prov=M&dok_var=1&dok_ext=htm Inhaltstext HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017727171&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis
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subject_GND	(DE-588)4078859-3
title	Evolvable designs of experiments applications for circuits
title_auth	Evolvable designs of experiments applications for circuits
title_exact_search	Evolvable designs of experiments applications for circuits
title_full	Evolvable designs of experiments applications for circuits Octavian Iordache
title_fullStr	Evolvable designs of experiments applications for circuits Octavian Iordache
title_full_unstemmed	Evolvable designs of experiments applications for circuits Octavian Iordache
title_short	Evolvable designs of experiments
title_sort	evolvable designs of experiments applications for circuits
title_sub	applications for circuits
topic	Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction Versuchsplanung (DE-588)4078859-3 gnd
topic_facet	Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction
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