Evolvable designs of experiments: applications for circuits
Adopting a groundbreaking approach, Iordache shows how to design methods for planning increasingly complex experiments. He begins with an introduction to standard quality methods and the technology in standard electric circuits. He then gives examples of how to apply the proposed methodology in a se...
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1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Weinheim
Wiley-VCH-Verl.
2009
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Schlagworte: | |
Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
Zusammenfassung: | Adopting a groundbreaking approach, Iordache shows how to design methods for planning increasingly complex experiments. He begins with an introduction to standard quality methods and the technology in standard electric circuits. He then gives examples of how to apply the proposed methodology in a series of real-life case studies. |
Beschreibung: | Literaturverz. S. 205 - 210 |
Beschreibung: | XIV, 216 S. Ill., graph. Darst. 25 cm |
ISBN: | 9783527324248 |
Internformat
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Datensatz im Suchindex
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adam_text |
OCTAVIAN LORDACHE EVOLVABLE DESIGNS OF EXPERIMENTS APPLICATIONS FOR
CIRCUITS WILEY- VCH WILEY-VCH VERLAG GMBH & CO. KGAA CONTENTS PREFACE XI
ABBREVIATIONS XIII PART ONE INTRODUCTION 1 1 PRINTED CIRCUITS 3 1.1
TECHNOLOGY PRESENTATION 3 1.2 INNER-LAYER PROCESSING 4 1.3 MATERIALS
PREPARATION 4 1.4 LAMINATION 5 1.5 DRILLING 5 1.6 MAKING THE HOLE
CONDUCTIVE 6 1.7 IMAGING 7 1.8 ELECTROPLATING 8 1.9 COPPER ETCHING 9
1.10 SOLDER MASKING 9 1.11 SURFACE FINISHING 10 1.12 ROUTING 10 1.13
TESTING AND INSPECTION 10 1.14 ASSEMBLING 11 2 PROBLEM SOLVING FOR
RELIABILITY AND QUALITY 15 2.1 CONVENTIONAL PARADIGMS 15 2.2 COMPLEXITY
AND TIME FRAMES 18 2.3 QUASILINEARITY, CIRCULARITY, AND CLOSURE 21 2.4
ADVANCE OF RELIABILITY PARADIGMS 23 PART TWO EVOLVABLE DESIGNS OF
EXPERIMENTS (EDOE) 27 3 POLYSTOCHASTIC MODELS 29 , 3.1 WHAT IS PSM? 29
3.2 BASIC NOTIONS FOR CATEGORICAL FRAME 32 3.3 ILLUSTRATIVE EXAMPLES OF
PSM AND CATEGORICAL FRAMES 34 EVOLVABLE DESIGNS OF EXPERIMENTS:
APPLICATIONS FOR CIRCUITS. OCTAVIAN IORDACHE COPYRIGHT 2009 WILEY-VCH
VERLAG GMBH & CO. KGAA, WEINHEIM ISBN: 978-3-527-32424-8 VI I CONTENTS
3.3.1 LUMPED STOCHASTIC CHAINS 34 3.3.2 CONDITIONAL STOCHASTIC CHAINS 35
4 FIRST-ORDER WAVE EQUATION 37 4.1 ALGEBRAIC FRAMES FOR TIME "T" AND
SPACE "Z" 37 42 THE FIRST-ORDER WAVE EQUATION 41 4.3 "KINETIC" MODEL:
WALSH-HADAMARD MATRICES 42 4.4 "CONVECTION" MODEL: LATIN SQUARES 44
4.4.1 GF(3) SOLUTION 45 4.4.2 GF(4) SOLUTION 47 4.5 SPECTRAL ANALYSIS:
CORRELATION 49 5 INFORMATIONAL ANALYSIS: EDOE MATRICES 51 5.1
WALSH-HADAMARD MATRICES AND LATIN SQUARE DESIGNS 51 5.2 CLASSIFICATION
PROCEDURES: INFORMATIONAL CRITERIA 52 5.3 INFORMATIONAL ENTROPY AND
DISTANCES 53 5.4 ADAPTABILITY IN CLASSIFICATION 54 5.5 INFORMATIONAL
RESULTS 55 5.5.1 PROPOSITION 1 55 5.5.2 PROPOSITION 2 56 5.5.3
PROPOSITION 3 56 5.6 RELATION WITH THERMODYNAMICS 58 5.7 RANKING,
DISCARDING, AND REPLICATION OF THE COLUMNS 59 5.8 LUMPING AND SPLITTING
COLUMNS 60 5.9 JUXTAPOSING AND CUTTING 61 5.10 TABLES OF DOE MATRICES 62
6 EDOE METHODOLOGY 65 6.1 SCIENTIFIC AND ENGINEERING METHODS 65 6.2
CENTER DESIGN AND HIERARCHY 66 6.3 RECURSIVITY AND FOCUSING 66 6.4
PROBLEM-SOLVING FRAMEWORK FOR PCB QUALITY 67 6.5 FORWARD AND BACKWARD
SEARCH 69 6.6 INTERACTIONS: DISSOCIATION-INTEGRATION 71 6.7 EDOE BASIC
STEPS 73 6.7.1 PROBLEM STATEMENT 73 6.7.2 PROPOSE THE PRELIMINARY
PROBLEM-SOLVING FRAMEWORK 73 6.7.3 SELECT THE DOE MATRICES 73 6.7.4 RUN
CENTER DESIGN 74 6.7.5 ANALYZE RESULTS 74 6.7.6 RUN MULTIPLE FORWARD AND
BACKWARD STEPS 74 6.7.7 PERFORM DISSOCIATION-INTEGRATION EXPERIMENTS 74
6.7.8 ESTABLISH THE NEW CENTER DESIGN 75 6.7.9 REPEAT THE TESTING
PROCEDURE FROM THE NEW CENTER DESIGN 75 6.7.10 RUN SIMULATIONS: ANALYZE
THE SOLUTIONS OF THE PROBLEM 75 CONTENTS VII 6.8 EDOE FRAME AND SKUP
SCHEMA 75 6.9 COMPARISON OF EDOE WITH OTHER METHODS 81 PART THREE CASE
STUDIES 85 7 SOLDER WICKING 87 7.1 ILLUSTRATIVE FAILURE ANALYSIS 87 7.2
ILLUSTRATIVE EDOE FRAME 91 7.3 SKUP SCHEMA FOR SOLDER WICKING 92 8
RELIABILITY ANALYSIS 95 8.1 EDOE FOR RELIABILITY 95 8.2 SKUP SCHEMA FOR
RELIABILITY 99 8.3 RELIABILITY MANAGEMENT SYSTEM: MAIN ELEMENTS 100 8.4
RELIABILITY PREDICTION SOFTWARE 101 8.5 MINICOUPONS 103 8.6 RELIABILITY
ANALYSIS 104 8.7 1ST ELECTRICAL RESISTANCE ANALYSIS 105 9 DRILLING 111
9.1 DRILLING QUALITY FRAMEWORK 111 9.2 TEST COUPONS 111 9.3 TESTING
SMALL PLATED THROUGH HOLES: SKUP SCHEMA FOR DRILLING 113 9.4 RELIABILITY
TESTS 116 9.5 LIFETIME MAPS 117 9.6 DRILLING QUALITY EVALUATIONS 119 9.7
TESTING THE DESIGN, D 121 9.8 TESTING FOR PROCESSING, P 122 9.9
RELIABILITY EVALUATIONS 123 10 SURFACE FINISH SOLDERABILITY 125 10.1
FINISH SOLDERABILITY FRAME 125 10.2 SKUP SCHEMA FOR SURFACE FINISH 128
11 DIRECT PLATE 133 11.1 DIRECT PLATE RELIABILITY 131 11.2
MICROSECTIONING RESULTS 132 11.3 ELECTRICAL RESISTANCE VERSUS THE NUMBER
OF CYCLES CLASSIFICATION METHOD 132 11.4 ASSOCIATED VECTORS-GRIDS 135
11.5 FIRST STEP OF CLASSIFICATION 136 11.6 SECOND STEP OF CLASSIFICATION
137 11.7 1ST LIFETIME AND ELECTROPLATED CU THICKNESS 138 11.8 SUMMARY
138 11.9 SKUP SCHEMA FOR DIRECT PLATE 139 VIII CONTENTS 12 PLATING VOIDS
141 12.1 PLATING VOIDS TYPE 141 12.2 THE SKUP SCHEMA FOR PLATING VOIDS
145 PART FOUR EVOLVABILITY 149 13 SELF-ADAPTIVE CIRCUITS 151 13.1
EVOLVABILITY LEVELS 151 13.2 SELF-ADAPTIVITY 152 13.3 SELF-ADAPTIVE
DESIGNS AND CONSTRUCTIONS 152 13.4 SELF-ADAPTIVE MATERIALS 153 13.5
SELF-ADAPTIVE PROCESSING 155 13.6 SELF-ADAPTABILITY TO TESTING AND FIELD
CONDITIONS 156 14 PROACTIVE CIRCUITS 159 14.1 PROACTIVENESS FOR CIRCUITS
159 14.2 EVOLUTIONARY HARDWARE 160 14.3 ELECTROCHEMICAL FILAMENT
CIRCUITS 161 14.3.1 ECFC DESIGN 162 14.3.2 MATERIALS FOR ECFC 163 14.3.3
ECFC PROCESSING 163 14.3.4 POTENTIAL ECFC PRODUCTS AND APPLICATIONS 164
15 EVOLVABLE CIRCUITS 165 15.1 EVOLVABILITY CHALLENGES 365 15.2
MOLECULAR ELECTRONICS 166 15.3 BACTERIORHODOPSIN FOR OPTOELECTRONIC
CIRCUITRY 167 15.4 EMBEDDED SYMBOLIC-CONNECTIONISTS HYBRIDS 168 15.5
TEMPORAL SYNCHRONY FOR EMBEDDED SYMBOLIC-CONNECTIONIST HYBRIDS 370 15.6
EMBEDDED EDOE 172 15.7 HYBRID CONTROLLED MICROFLUIDIC CIRCUITS 373 15.8
RECONFIGURABLE MICROFLUIDIC CIRCUITS 174 15.9 SELF-CONSTRUCTED MOLECULAR
CIRCUITS AND COMPUTING 175 15.10 GENETIC CODE-LIKE MECHANISM FOR
MOLECULAR CIRCUITRY 377 15.11 CONVENTIONAL CIRCUITS VERSUS EVOLVABLE
CIRCUITS 382 16 EVOLVABLE MANUFACTURING SYSTEMS 385 16.1 MANUFACTURING
PARADIGMS 185 16.2 FRACTAL MANUFACTURING SYSTEM 387 16.3 HOLONIC
MANUFACTURING SYSTEM 187 16.4 BIOLOGIC MANUFACTURING SYSTEM 389 16.5
VIRTUAL MANUFACTURING SYSTEM 190 16.6 SKUP SCHEMA FOR VIRTUAL
MANUFACTURING SYSTEMS 390 16.7 MULTIAGENT MANUFACTURING SYSTEMS:
ARCHITECTURE 192 16.8 MULRIAGENT-BASED VERSUS CONVENTIONAL MANUFACTURING
SYSTEMS 195 CONTENTS IX PART FIVE 17 17.1 17.2 17.3 17.4 17.5 CONCLUDING
REMARKS 199 RELATED CONCEPTS 203 COMPLEXITY 201 EVOLVABILITY 202
POLYSTOCHASTIC METHOD 202 CONSTRUCTIVISM 203 CYBERNETICS AND THE CYCLE
OF SCIENCES 203 REFERENCES 205 INDEX 233 |
any_adam_object | 1 |
author | Iordache, Octavian |
author_facet | Iordache, Octavian |
author_role | aut |
author_sort | Iordache, Octavian |
author_variant | o i oi |
building | Verbundindex |
bvnumber | BV035672928 |
callnumber-first | T - Technology |
callnumber-label | TP155 |
callnumber-raw | TP155.2.M35 |
callnumber-search | TP155.2.M35 |
callnumber-sort | TP 3155.2 M35 |
callnumber-subject | TP - Chemical Technology |
classification_rvk | SK 840 |
ctrlnum | (OCoLC)262720626 (DE-599)DNB990246450 |
dewey-full | 621.3192 519.57 |
dewey-hundreds | 600 - Technology (Applied sciences) 500 - Natural sciences and mathematics |
dewey-ones | 621 - Applied physics 519 - Probabilities and applied mathematics |
dewey-raw | 621.3192 519.57 |
dewey-search | 621.3192 519.57 |
dewey-sort | 3621.3192 |
dewey-tens | 620 - Engineering and allied operations 510 - Mathematics |
discipline | Mathematik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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indexdate | 2024-07-20T10:16:38Z |
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isbn | 9783527324248 |
language | English |
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physical | XIV, 216 S. Ill., graph. Darst. 25 cm |
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spelling | Iordache, Octavian Verfasser aut Evolvable designs of experiments applications for circuits Octavian Iordache Weinheim Wiley-VCH-Verl. 2009 XIV, 216 S. Ill., graph. Darst. 25 cm txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 205 - 210 Adopting a groundbreaking approach, Iordache shows how to design methods for planning increasingly complex experiments. He begins with an introduction to standard quality methods and the technology in standard electric circuits. He then gives examples of how to apply the proposed methodology in a series of real-life case studies. Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction Versuchsplanung (DE-588)4078859-3 gnd rswk-swf Versuchsplanung (DE-588)4078859-3 s DE-604 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=3152860&prov=M&dok_var=1&dok_ext=htm Inhaltstext HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017727171&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Iordache, Octavian Evolvable designs of experiments applications for circuits Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction Versuchsplanung (DE-588)4078859-3 gnd |
subject_GND | (DE-588)4078859-3 |
title | Evolvable designs of experiments applications for circuits |
title_auth | Evolvable designs of experiments applications for circuits |
title_exact_search | Evolvable designs of experiments applications for circuits |
title_full | Evolvable designs of experiments applications for circuits Octavian Iordache |
title_fullStr | Evolvable designs of experiments applications for circuits Octavian Iordache |
title_full_unstemmed | Evolvable designs of experiments applications for circuits Octavian Iordache |
title_short | Evolvable designs of experiments |
title_sort | evolvable designs of experiments applications for circuits |
title_sub | applications for circuits |
topic | Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction Versuchsplanung (DE-588)4078859-3 gnd |
topic_facet | Versuchsplanung Mathematisches Modell Chemical engineering Mathematical models Experimental design Printed circuits Design and construction |
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