Three-dimensional imaging, optical metrology, and inspection:
Gespeichert in:
Vorheriger Titel: | Three-dimensional imaging and laser-based systems for metrology and inspection |
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Format: | Zeitschrift |
Sprache: | English |
Veröffentlicht: |
Bellingham, Wash.
SPIE
1998-
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Schlagworte: | |
Veröffentlicht: | 4.1998 - |
Internformat
MARC
LEADER | 00000nas a2200000 c 4500 | ||
---|---|---|---|
001 | BV035618259 | ||
003 | DE-604 | ||
005 | 20171201122909 | ||
007 | t | ||
008 | 991122c19989999xxu|| p| |||| 1 ||eng d | ||
016 | 7 | |a 019642830 |2 DE-101 | |
016 | 7 | |a 1471168-0 |2 DE-600 | |
035 | |a (OCoLC)916480369 | ||
035 | |a (DE-599)ZDB1471168-0 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
044 | |a xxu |c XD-US | ||
049 | |a DE-83 | ||
084 | |a 000 |2 sdnb | ||
084 | |a 530 |2 sdnb | ||
245 | 1 | 0 | |a Three-dimensional imaging, optical metrology, and inspection |c SPIE, the International Society for Optical Engineering |
246 | 1 | 3 | |a Proceedings of SPIE / Three-dimensional imaging, optical metrology, and inspection |
264 | 3 | 1 | |a Bellingham, Wash. |b SPIE |c 1998- |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
362 | 0 | |a 4.1998 - | |
363 | 0 | 1 | |a 4 |i 1998 |
655 | 7 | |0 (DE-588)4067488-5 |a Zeitschrift |2 gnd-content | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
710 | 2 | |a SPIE, The International Society for Optical Engineering |0 (DE-588)10040295-1 |4 isb | |
780 | 0 | 0 | |i Vorg.: |t Three-dimensional imaging and laser-based systems for metrology and inspection |d Bellingham, Wash. : SPIE, 1997-1997 |w (DE-604)BV035617814 |
787 | 0 | 8 | |i 4=3520 von |a SPIE, The International Society for Optical Engineering |t Proceedings / SPIE, International Society for Optical Engineering |d Berlin ; Offenbach : VDE-Verl., 1982-2006 |w (DE-604)BV035419705 |
999 | |a oai:aleph.bib-bvb.de:BVB01-017673445 |
Datensatz im Suchindex
_version_ | 1804139288203362304 |
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any_adam_object | |
building | Verbundindex |
bvnumber | BV035618259 |
ctrlnum | 1471168-0 (OCoLC)916480369 (DE-599)ZDB1471168-0 |
dateSpan | 4.1998 - |
discipline | Allgemeines Physik |
format | Journal |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01524nas a2200373 c 4500</leader><controlfield tag="001">BV035618259</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20171201122909 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">991122c19989999xxu|| p| |||| 1 ||eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">019642830</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1471168-0</subfield><subfield code="2">DE-600</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916480369</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)ZDB1471168-0</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">000</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">530</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Three-dimensional imaging, optical metrology, and inspection</subfield><subfield code="c">SPIE, the International Society for Optical Engineering</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of SPIE / Three-dimensional imaging, optical metrology, and inspection</subfield></datafield><datafield tag="264" ind1="3" ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1998-</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="362" ind1="0" ind2=" "><subfield code="a">4.1998 -</subfield></datafield><datafield tag="363" ind1="0" ind2="1"><subfield code="a">4</subfield><subfield code="i">1998</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4067488-5</subfield><subfield code="a">Zeitschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">SPIE, The International Society for Optical Engineering</subfield><subfield code="0">(DE-588)10040295-1</subfield><subfield code="4">isb</subfield></datafield><datafield tag="780" ind1="0" ind2="0"><subfield code="i">Vorg.:</subfield><subfield code="t">Three-dimensional imaging and laser-based systems for metrology and inspection</subfield><subfield code="d">Bellingham, Wash. : SPIE, 1997-1997</subfield><subfield code="w">(DE-604)BV035617814</subfield></datafield><datafield tag="787" ind1="0" ind2="8"><subfield code="i">4=3520 von</subfield><subfield code="a">SPIE, The International Society for Optical Engineering</subfield><subfield code="t">Proceedings / SPIE, International Society for Optical Engineering</subfield><subfield code="d">Berlin ; Offenbach : VDE-Verl., 1982-2006</subfield><subfield code="w">(DE-604)BV035419705</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017673445</subfield></datafield></record></collection> |
genre | (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Zeitschrift Konferenzschrift |
id | DE-604.BV035618259 |
illustrated | Illustrated |
indexdate | 2024-07-09T21:41:42Z |
institution | BVB |
institution_GND | (DE-588)10040295-1 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017673445 |
oclc_num | 916480369 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
publishDate | 1998 |
publishDateSearch | 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 8888 |
publishDateSort | 2024 |
publisher | SPIE |
record_format | marc |
spelling | Three-dimensional imaging, optical metrology, and inspection SPIE, the International Society for Optical Engineering Proceedings of SPIE / Three-dimensional imaging, optical metrology, and inspection Bellingham, Wash. SPIE 1998- txt rdacontent n rdamedia nc rdacarrier 4.1998 - 4 1998 (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content SPIE, The International Society for Optical Engineering (DE-588)10040295-1 isb Vorg.: Three-dimensional imaging and laser-based systems for metrology and inspection Bellingham, Wash. : SPIE, 1997-1997 (DE-604)BV035617814 4=3520 von SPIE, The International Society for Optical Engineering Proceedings / SPIE, International Society for Optical Engineering Berlin ; Offenbach : VDE-Verl., 1982-2006 (DE-604)BV035419705 |
spellingShingle | Three-dimensional imaging, optical metrology, and inspection |
subject_GND | (DE-588)4067488-5 (DE-588)1071861417 |
title | Three-dimensional imaging, optical metrology, and inspection |
title_alt | Proceedings of SPIE / Three-dimensional imaging, optical metrology, and inspection |
title_auth | Three-dimensional imaging, optical metrology, and inspection |
title_exact_search | Three-dimensional imaging, optical metrology, and inspection |
title_full | Three-dimensional imaging, optical metrology, and inspection SPIE, the International Society for Optical Engineering |
title_fullStr | Three-dimensional imaging, optical metrology, and inspection SPIE, the International Society for Optical Engineering |
title_full_unstemmed | Three-dimensional imaging, optical metrology, and inspection SPIE, the International Society for Optical Engineering |
title_old | Three-dimensional imaging and laser-based systems for metrology and inspection |
title_short | Three-dimensional imaging, optical metrology, and inspection |
title_sort | three dimensional imaging optical metrology and inspection |
topic_facet | Zeitschrift Konferenzschrift |
work_keys_str_mv | AT spietheinternationalsocietyforopticalengineering threedimensionalimagingopticalmetrologyandinspection AT spietheinternationalsocietyforopticalengineering proceedingsofspiethreedimensionalimagingopticalmetrologyandinspection |
zdb_num | 1471168-0 (DE-599)ZDB1471168-0 |