Machine vision systems for inspection and metrology:
Gespeichert in:
| Vorheriger Titel: | Machine vision applications, architectures, and systems integration |
|---|---|
| Format: | Zeitschrift |
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1998-
|
| Schlagworte: | |
| Veröffentlicht: | 7.1998 - |
Internformat
MARC
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| 246 | 1 | 3 | |a Proceedings of SPIE / Machine vision systems for inspection and metrology |
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| 780 | 0 | 0 | |i Vorg.: |t Machine vision applications, architectures, and systems integration |d Bellingham, Wash. : SPIE, 1992-1997 |w (DE-604)BV035617184 |
| 787 | 0 | 8 | |i 7=3521; 8=3836 von |a SPIE, The International Society for Optical Engineering |t Proceedings / SPIE, International Society for Optical Engineering |d Berlin ; Offenbach : VDE-Verl., 1982-2006 |w (DE-604)BV035419705 |
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Datensatz im Suchindex
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| ctrlnum | 1455025-8 (OCoLC)916480268 (DE-599)ZDB1455025-8 |
| dateSpan | 7.1998 - |
| discipline | Allgemeines |
| format | Journal |
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| id | DE-604.BV035618209 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:41:42Z |
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| institution_GND | (DE-588)10040295-1 |
| language | English |
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| publishDate | 1998 |
| publishDateSearch | 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 8888 |
| publishDateSort | 2024 |
| publisher | SPIE |
| record_format | marc |
| spelling | Machine vision systems for inspection and metrology SPIE, the International Society for Optical Engineering Proceedings of SPIE / Machine vision systems for inspection and metrology Bellingham, Wash. SPIE 1998- txt rdacontent n rdamedia nc rdacarrier 7.1998 - 7 1998 (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content SPIE, The International Society for Optical Engineering (DE-588)10040295-1 isb Vorg.: Machine vision applications, architectures, and systems integration Bellingham, Wash. : SPIE, 1992-1997 (DE-604)BV035617184 7=3521; 8=3836 von SPIE, The International Society for Optical Engineering Proceedings / SPIE, International Society for Optical Engineering Berlin ; Offenbach : VDE-Verl., 1982-2006 (DE-604)BV035419705 |
| spellingShingle | Machine vision systems for inspection and metrology |
| subject_GND | (DE-588)4067488-5 (DE-588)1071861417 |
| title | Machine vision systems for inspection and metrology |
| title_alt | Proceedings of SPIE / Machine vision systems for inspection and metrology |
| title_auth | Machine vision systems for inspection and metrology |
| title_exact_search | Machine vision systems for inspection and metrology |
| title_full | Machine vision systems for inspection and metrology SPIE, the International Society for Optical Engineering |
| title_fullStr | Machine vision systems for inspection and metrology SPIE, the International Society for Optical Engineering |
| title_full_unstemmed | Machine vision systems for inspection and metrology SPIE, the International Society for Optical Engineering |
| title_old | Machine vision applications, architectures, and systems integration |
| title_short | Machine vision systems for inspection and metrology |
| title_sort | machine vision systems for inspection and metrology |
| topic_facet | Zeitschrift Konferenzschrift |
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