Scanning probe microscopies: proceedings
Gespeichert in:
| Format: | Zeitschrift |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1992-
|
| Schlagworte: | |
| Veröffentlicht: | [1.]1992; 2.1993 - |
Internformat
MARC
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Datensatz im Suchindex
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| dateSpan | [1.]1992; 2.1993 - |
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| genre_facet | Zeitschrift Konferenzschrift |
| id | DE-604.BV035617091 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:41:41Z |
| institution | BVB |
| institution_GND | (DE-588)10040295-1 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017672277 |
| oclc_num | 649079617 |
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| owner | DE-83 DE-188 |
| owner_facet | DE-83 DE-188 |
| publishDate | 1992 |
| publishDateSearch | 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 8888 |
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| publisher | SPIE |
| record_format | marc |
| spelling | Scanning probe microscopies proceedings SPIE, The International Society for Optical Engineering Proceedings / Scanning probe microscopies Bellingham, Wash. SPIE 1992- txt rdacontent n rdamedia nc rdacarrier [1.]1992; 2.1993 - 1 1992 2 1993 Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 SPIE, The International Society for Optical Engineering (DE-588)10040295-1 isb [1]=1639; 2=1855; 3=2384 von SPIE, The International Society for Optical Engineering Proceedings / SPIE, International Society for Optical Engineering Berlin ; Offenbach : VDE-Verl., 1981-2006 0361-0748 (DE-604)BV035419705 |
| spellingShingle | Scanning probe microscopies proceedings Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)4067488-5 (DE-588)1071861417 |
| title | Scanning probe microscopies proceedings |
| title_alt | Proceedings / Scanning probe microscopies |
| title_auth | Scanning probe microscopies proceedings |
| title_exact_search | Scanning probe microscopies proceedings |
| title_full | Scanning probe microscopies proceedings SPIE, The International Society for Optical Engineering |
| title_fullStr | Scanning probe microscopies proceedings SPIE, The International Society for Optical Engineering |
| title_full_unstemmed | Scanning probe microscopies proceedings SPIE, The International Society for Optical Engineering |
| title_short | Scanning probe microscopies |
| title_sort | scanning probe microscopies proceedings |
| title_sub | proceedings |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie Zeitschrift Konferenzschrift |
| work_keys_str_mv | AT spietheinternationalsocietyforopticalengineering scanningprobemicroscopiesproceedings AT spietheinternationalsocietyforopticalengineering proceedingsscanningprobemicroscopies |
| zdb_num | 1192486-X (DE-599)ZDB1192486-X |