X-rays in materials analysis: Novel applications and recent developments
Gespeichert in:
| Format: | Zeitschrift |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1986-
|
| Schlagworte: | |
| Veröffentlicht: | [1.]1986; 2.1991 - |
Internformat
MARC
| LEADER | 00000nas a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV035616671 | ||
| 003 | DE-604 | ||
| 005 | 20220903133622 | ||
| 007 | t | ||
| 008 | 991121c19869999xxu|| p| |||| 1 ||und d | ||
| 016 | 7 | |a 016737563 |2 DE-101 | |
| 016 | 7 | |a 1145070-8 |2 DE-600 | |
| 035 | |a (OCoLC)916475800 | ||
| 035 | |a (DE-599)ZDB1145070-8 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | |a und | ||
| 044 | |a xxu |c XD-US | ||
| 049 | |a DE-83 | ||
| 084 | |a 670 |2 22sdnb | ||
| 245 | 1 | 0 | |a X-rays in materials analysis |b Novel applications and recent developments |c SPIE, the International Society for Optical Engineering |
| 246 | 1 | 3 | |a Proceedings / X-rays in materials analysis |
| 264 | 3 | 1 | |a Bellingham, Wash. |b SPIE |c 1986- |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 362 | 0 | |a [1.]1986; 2.1991 - | |
| 363 | 0 | 0 | |a 1 |i 1986 |
| 363 | 0 | 1 | |a 2 |i 1991 |
| 655 | 7 | |0 (DE-588)4067488-5 |a Zeitschrift |2 gnd-content | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a SPIE, The International Society for Optical Engineering |0 (DE-588)10040295-1 |4 isb | |
| 787 | 0 | 8 | |i [1]=690; 2=1550 von |a SPIE, The International Society for Optical Engineering |t Proceedings / SPIE, International Society for Optical Engineering |d Berlin ; Offenbach : VDE-Verl., 1981-2006 |x 0361-0748 |w (DE-604)BV035419705 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-017671857 | ||
Datensatz im Suchindex
| _version_ | 1804139286535077888 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV035616671 |
| ctrlnum | 1145070-8 (OCoLC)916475800 (DE-599)ZDB1145070-8 |
| dateSpan | [1.]1986; 2.1991 - |
| format | Journal |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01365nas a2200361 c 4500</leader><controlfield tag="001">BV035616671</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220903133622 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">991121c19869999xxu|| p| |||| 1 ||und d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">016737563</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1145070-8</subfield><subfield code="2">DE-600</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916475800</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)ZDB1145070-8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">670</subfield><subfield code="2">22sdnb</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-rays in materials analysis</subfield><subfield code="b">Novel applications and recent developments</subfield><subfield code="c">SPIE, the International Society for Optical Engineering</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings / X-rays in materials analysis</subfield></datafield><datafield tag="264" ind1="3" ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1986-</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="362" ind1="0" ind2=" "><subfield code="a">[1.]1986; 2.1991 -</subfield></datafield><datafield tag="363" ind1="0" ind2="0"><subfield code="a">1</subfield><subfield code="i">1986</subfield></datafield><datafield tag="363" ind1="0" ind2="1"><subfield code="a">2</subfield><subfield code="i">1991</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4067488-5</subfield><subfield code="a">Zeitschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">SPIE, The International Society for Optical Engineering</subfield><subfield code="0">(DE-588)10040295-1</subfield><subfield code="4">isb</subfield></datafield><datafield tag="787" ind1="0" ind2="8"><subfield code="i">[1]=690; 2=1550 von</subfield><subfield code="a">SPIE, The International Society for Optical Engineering</subfield><subfield code="t">Proceedings / SPIE, International Society for Optical Engineering</subfield><subfield code="d">Berlin ; Offenbach : VDE-Verl., 1981-2006</subfield><subfield code="x">0361-0748</subfield><subfield code="w">(DE-604)BV035419705</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017671857</subfield></datafield></record></collection> |
| genre | (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Zeitschrift Konferenzschrift |
| id | DE-604.BV035616671 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:41:40Z |
| institution | BVB |
| institution_GND | (DE-588)10040295-1 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017671857 |
| oclc_num | 916475800 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| publishDate | 1986 |
| publishDateSearch | 1986 1987 1988 1989 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 8888 |
| publishDateSort | 2024 |
| publisher | SPIE |
| record_format | marc |
| spelling | X-rays in materials analysis Novel applications and recent developments SPIE, the International Society for Optical Engineering Proceedings / X-rays in materials analysis Bellingham, Wash. SPIE 1986- txt rdacontent n rdamedia nc rdacarrier [1.]1986; 2.1991 - 1 1986 2 1991 (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content SPIE, The International Society for Optical Engineering (DE-588)10040295-1 isb [1]=690; 2=1550 von SPIE, The International Society for Optical Engineering Proceedings / SPIE, International Society for Optical Engineering Berlin ; Offenbach : VDE-Verl., 1981-2006 0361-0748 (DE-604)BV035419705 |
| spellingShingle | X-rays in materials analysis Novel applications and recent developments |
| subject_GND | (DE-588)4067488-5 (DE-588)1071861417 |
| title | X-rays in materials analysis Novel applications and recent developments |
| title_alt | Proceedings / X-rays in materials analysis |
| title_auth | X-rays in materials analysis Novel applications and recent developments |
| title_exact_search | X-rays in materials analysis Novel applications and recent developments |
| title_full | X-rays in materials analysis Novel applications and recent developments SPIE, the International Society for Optical Engineering |
| title_fullStr | X-rays in materials analysis Novel applications and recent developments SPIE, the International Society for Optical Engineering |
| title_full_unstemmed | X-rays in materials analysis Novel applications and recent developments SPIE, the International Society for Optical Engineering |
| title_short | X-rays in materials analysis |
| title_sort | x rays in materials analysis novel applications and recent developments |
| title_sub | Novel applications and recent developments |
| topic_facet | Zeitschrift Konferenzschrift |
| work_keys_str_mv | AT spietheinternationalsocietyforopticalengineering xraysinmaterialsanalysisnovelapplicationsandrecentdevelopments AT spietheinternationalsocietyforopticalengineering proceedingsxraysinmaterialsanalysis |
| zdb_num | 1145070-8 (DE-599)ZDB1145070-8 |