Verfügbarkeit: Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers

Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers:

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Bibliographische Detailangaben
1. Verfasser:	Emtsev, Konstantin 1979- (VerfasserIn)
Format:	Abschlussarbeit Buch
Sprache:	English
Veröffentlicht:	2009
Schlagworte:	Graphen Halbleiteroberfläche Photoelektronenspektroskopie Siliciumcarbid Hochschulschrift
Online-Zugang:	Volltext https://nbn-resolving.org/urn:nbn:de:bvb:29-opus-13608 http://d-nb.info/994948255/34
Beschreibung:	139 S. Ill., graph. Darst.

Internformat

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Datensatz im Suchindex

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spelling	Emtsev, Konstantin 1979- Verfasser (DE-588)138471991 aut Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers von Konstantin Emtsev 2009 139 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Erlangen-Nürnberg, Univ., Diss., 2009 Langzeitarchivierung Nationalbibliothek gewährleistet Graphen (DE-588)7591667-8 gnd rswk-swf Halbleiteroberfläche (DE-588)4137418-6 gnd rswk-swf Photoelektronenspektroskopie (DE-588)4174491-3 gnd rswk-swf Siliciumcarbid (DE-588)4055009-6 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Graphen (DE-588)7591667-8 s Halbleiteroberfläche (DE-588)4137418-6 s Siliciumcarbid (DE-588)4055009-6 s Photoelektronenspektroskopie (DE-588)4174491-3 s DE-604 Erscheint auch als Online-Ausgabe urn:nbn:de:bvb:29-opus-13608 https://open.fau.de/handle/openfau/883 Verlag kostenfrei Volltext https://nbn-resolving.org/urn:nbn:de:bvb:29-opus-13608 Resolvingsystem http://d-nb.info/994948255/34
spellingShingle	Emtsev, Konstantin 1979- Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers Graphen (DE-588)7591667-8 gnd Halbleiteroberfläche (DE-588)4137418-6 gnd Photoelektronenspektroskopie (DE-588)4174491-3 gnd Siliciumcarbid (DE-588)4055009-6 gnd
subject_GND	(DE-588)7591667-8 (DE-588)4137418-6 (DE-588)4174491-3 (DE-588)4055009-6 (DE-588)4113937-9
title	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers
title_auth	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers
title_exact_search	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers
title_full	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers von Konstantin Emtsev
title_fullStr	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers von Konstantin Emtsev
title_full_unstemmed	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers von Konstantin Emtsev
title_short	Electronic and structural characterizations of unreconstructed SiC{0001} surfaces and the growth of graphene overlayers
title_sort	electronic and structural characterizations of unreconstructed sic 0001 surfaces and the growth of graphene overlayers
topic	Graphen (DE-588)7591667-8 gnd Halbleiteroberfläche (DE-588)4137418-6 gnd Photoelektronenspektroskopie (DE-588)4174491-3 gnd Siliciumcarbid (DE-588)4055009-6 gnd
topic_facet	Graphen Halbleiteroberfläche Photoelektronenspektroskopie Siliciumcarbid Hochschulschrift
url	https://open.fau.de/handle/openfau/883 https://nbn-resolving.org/urn:nbn:de:bvb:29-opus-13608 http://d-nb.info/994948255/34
work_keys_str_mv	AT emtsevkonstantin electronicandstructuralcharacterizationsofunreconstructedsic0001surfacesandthegrowthofgrapheneoverlayers

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