Data model patterns: a metadata map
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Bibliographic Details
Main Author: Hay, David C. (Author)
Format: Book
Language:English
Published: Amsterdam [u.a.] Elsevier Morgan Kaufmann 2006
Series:The Morgan Kaufmann series in data management systems
Subjects:
Online Access:Table of contents
Publisher description
Item Description:Includes bibliographical references (p. 391-394) and index
Physical Description:XX, 406 S. Ill.
ISBN:0120887983

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