Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
London
Inst. of Engineering and Technology
2008
|
| Schriftenreihe: | Circuits, devices and systems series
19 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | XX, 389 S. graph. Darst. |
| ISBN: | 9780863417450 0863417450 |
Internformat
MARC
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| 245 | 1 | 0 | |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits |b the system on chip approach |c ed. by Yichuang Sun |
| 264 | 1 | |a London |b Inst. of Engineering and Technology |c 2008 | |
| 300 | |a XX, 389 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Circuits, devices and systems series |v 19 | |
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Linear integrated circuits / Testing | |
| 650 | 4 | |a Mixed signal circuits / Testing | |
| 650 | 4 | |a Radio frequency integrated circuits / Testing | |
| 650 | 4 | |a Linear integrated circuits |x Testing | |
| 650 | 4 | |a Mixed signal circuits |x Testing | |
| 650 | 4 | |a Radio frequency integrated circuits |x Testing | |
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TEST AND DIAGNOSIS OF ANALOGUE, MIXED-SIGNAL AND RF INTEGRATED CIRCUITS
THE SYSTEM ON CHIP APPROACH EDITED BY YICHUANG SUN THE INSTITUTION OF
ENGINEERING AND TECHNOLOGY CONTENTS PREFACE XV LIST OF CONTRIBUTORS XIX
1 FAULT DIAGNOSIS OF LINEAR AND NON-LINEAR ANALOGUE CIRCUITS 1 YICHUANG
SUN 1.1 INTRODUCTION 1 1.2 MULTIPLE-FAULT DIAGNOSIS OF LINEAR CIRCUITS 3
1.2.1 FAULT INCREMENTAL CIRCUIT 3 1.2.2 BRANCH-FAULT DIAGNOSIS 4 1.2.3
TESTABILITY ANALYSIS AND DESIGN FOR TESTABILITY 6 1.2.4 BILINEAR
FUNCTION AND MULTIPLE EXCITATION METHOD 8 1.2.5 NODE-FAULT DIAGNOSIS 9
1.2.6 PARAMETER IDENTIFICATION AFTER -NODE FAULT LOCATION 10 1.2.7
CUTSET-FAULT DIAGNOSIS 12 1.2.8 TOLERANCE EFFECTS AND TREATMENT 15 1.3
CLASS-FAULT DIAGNOSIS OF ANALOGUE CIRCUITS 15 1.3.1 CLASS-FAULT
DIAGNOSIS AND GENERAL ALGEBRAIC METHOD FOR CLASSIFICATION 16 1.3.2
CLASS-FAULT DIAGNOSIS AND TOPOLOGICAL TECHNIQUE FOR CLASSIFICATION 18
1.3.3 F-CLASS-FAULT DIAGNOSIS AND TOPOLOGICAL METHOD FOR CLASSIFICATION
19 1.4 FAULT DIAGNOSIS OF NON-LINEAR CIRCUITS 21 1.4.1 FAULT MODELLING
AND FAULT INCREMENTAL CIRCUITS 21 1.4.2 FAULT LOCATION AND
IDENTIFICATION 24 1.4.3 ALTERNATIVE FAULT INCREMENTAL CIRCUITS AND FAULT
DIAGNOSIS 26 1.5 RECENT ADVANCES IN FAULT DIAGNOSIS OF ANALOGUE CIRCUITS
29 1.5.1 TEST NODE SELECTION AND TEST SIGNAL GENERATION 29 VIII TEST AND
DIAGNOSIS OF ANALOGUE, MIXED-SIGNAL AND RF INTEGRATED CIRCUITS 1.5.2
SYMBOLIC APPROACH FOR FAULT DIAGNOSIS OF ANALOGUE CIRCUITS 30 1.5.3
NEURAL-NETWORK- AND WAVELET-BASED METHODS FOR ANALOGUE FAULT DIAGNOSIS
31 1.5.4 HIERARCHICAL APPROACH FOR LARGE-SCALE CIRCUIT FAULT DIAGNOSIS
31 1.6 SUMMARY 32 1.7 REFERENCES 33 2 SYMBOLIC FUNCTION APPROACHES FOR
ANALOGUE FAULT DIAGNOSIS 37 STEFANO MANETTI AND MARIA CRISTINA
PICCIRILLI 2.1 INTRODUCTION 37 2.2 SYMBOLIC ANALYSIS 39 2.2.1 SYMBOLIC
ANALYSIS TECHNIQUES 40 2.2.2 THE SAPWIN PROGRAM 40 2.3 TESTABILITY AND
AMBIGUITY GROUPS 41 2.3.1 ALGORITHMS FOR TESTABILITY EVALUATION 42 2.3.2
AMBIGUITY GROUPS 47 2.3.3 SINGULAR-VALUE DECOMPOSITION APPROACH 52 2.3.4
TESTABILITY ANALYSIS OF NON-LINEAR CIRCUITS 57 2.4 FAULT DIAGNOSIS OF
LINEAR ANALOGUE CIRCUITS 57 2.4.1 TECHNIQUES BASED ON BILINEAR
DECOMPOSITION OF FAULT EQUATIONS 59 2.4.2 NEWTON-RAPHSON-BASED APPROACH
62 2.4.3 SELECTION OF THE TEST FREQUENCIES 67 2.5 FAULT DIAGNOSIS OF
NON-LINEAR CIRCUITS 71 2.5.1 PWL MODELS 72 2.5.2 TRANSIENT ANALYSIS
MODELS FOR REACTIVE COMPONENTS 73 2.5.3 THE KATZNELSON-TYPE ALGORITHM 73
2.5.4 CIRCUIT FAULT DIAGNOSIS APPLICATION 74 2.5.5 THE SAPDEC PROGRAM 75
2.6 CONCLUSIONS 77 2.7 REFERENCES 77 3 NEURAL-NETWORK-BASED APPROACHES
FOR ANALOGUE CIRCUIT FAULT DIAGNOSIS 83 YICHUANG SUN AND YIGANG HE 3.1
INTRODUCTION 83 3.2 FAULT DIAGNOSIS OF ANALOGUE CIRCUITS WITH TOLERANCES
USING ARTIFICIAL NEURAL NETWORKS 84 3.2.1 ARTIFICIAL NEURAL NETWORKS 85
3.2.2 FAULT DIAGNOSIS OF ANALOGUE CIRCUITS 87 3.2.3 FAULT DIAGNOSIS
USING ANNS 88 LIST OF CONTENTS IX 3.2.4 NEURAL-NETWORK APPROACH FOR
FAULT DIAGNOSIS OF LARGE-SCALE ANALOGUE CIRCUITS 90 3.2.5 ILLUSTRATIVE
EXAMPLES 90 3.3 WAVELET-BASED NEURAL-NETWORK TECHNIQUE FOR FAULT
DIAGNOSIS OF ANALOGUE CIRCUITS WITH NOISE 94 3.3.1 . WAVELET
DECOMPOSITION 94 3.3.2 WAVELET FEATURE EXTRACTION OF NOISY SIGNALS 95
3.3.3 WNNS 96 3.3.4 WNN ALGORITHM FOR FAULT DIAGNOSIS 97 3.3.5 EXAMPLE
CIRCUITS AND RESULTS 98 3.4 NEURAL-NETWORK-BASED L\ -NORM OPTIMIZATION
APPROACH FOR FAULT DIAGNOSIS OF NON-LINEAR CIRCUITS 100 3.4.1 L\ -NORM
OPTIMIZATION APPROACH FOR FAULT LOCATION OF NON-LINEAR CIRCUITS 103
3.4.2 NNS APPLIED TO L\ -NORM FAULT DIAGNOSIS OF NON-LINEAR CIRCUITS 105
3.4.3 ILLUSTRATIVE EXAMPLE 109 3.5 SUMMARY 110 3.6 REFERENCES 111 4
HIERARCHICAL/DECOMPOSITION TECHNIQUES FOR LARGE-SCALE ANALOGUE DIAGNOSIS
113 PETER SHEPHERD 4.1 INTRODUCTION 113 4.1.1 DIAGNOSIS DEFINITIONS 114
4.2 BACKGROUND TO ANALOGUE FAULT DIAGNOSIS 115 4.2.1 SIMULATION BEFORE
TEST 115 4.2.2 SIMULATION AFTER TEST 116 4.3 HIERARCHICAL TECHNIQUES 121
4.3.1 SIMULATION AFTER TEST 121 4.3.2 SIMULATION BEFORE TEST 131 4.3.3
MIXED SBT/SAT APPROACHES 135 4.4 CONCLUSIONS 137 4.5 REFERENCES 138 5
DFT AND BIST TECHNIQUES FOR ANALOGUE AND MIXED-SIGNAL TEST 141 MONA
SAFI-HARB AND GORDON ROBERTS 5.1 INTRODUCTION 141 5.2 BACKGROUND 142 5.3
SIGNAL GENERATION 146 5.3.1 DIRECT DIGITAL FREQUENCY SYNTHESIS 146 5.3.2
OSCILLATOR-BASED APPROACHES 147 5.3.3 MEMORY-BASED SIGNAL GENERATION 148
X TEST AND DIAGNOSIS OF ANALOGUE, MIXED-SIGNAL AND RF INTEGRATED
CIRCUITS 5.3.4 MULTI-TONES 149 5.3.5 AREA OVERHEAD 150 5.4 SIGNAL
CAPTURE 151 5.5 TIMING MEASUREMENTS AND JITTER ANALYSERS 154 5.5.1
SINGLE COUNTER 154 5.5.2 ANALOGUE-BASED INTERPOLATION TECHNIQUES:
TIME-TO-VOLTAGE CONVERTER 155 5.5.3 DIGITAL PHASE-INITERPOLATION
TECHNIQUES: DELAY LINE 156 5.5.4 VERNIER DELAY LINE 157 5.5.5
COMPONENT-INVARIANT VDL FOR JITTER MEASUREMENT 159 5.5.6 ANALOGUE-BASED
JITTER MEASUREMENT DEVICE 160 5.5.7 TIME AMPLIFICATION 162 5.5.8 PLL AND
DLL - INJECTION METHODS FOR PLL TESTS 163 5.6 CALIBRATION TECHNIQUES FOR
TMU AND TDC 164 5.7 COMPLETE ON-CHIP TEST CORE: PROPOSED ARCHITECTURE IN
REFERENCE 11 AND ITS VERSATILE APPLICATIONS 166 5.7.1 ATTRACTIVE AND
FLEXIBLE ARCHITECTURE 166 5.7.2 OSCILLOSCOPE/CURVE TRACING 168 5.7.3
COHERENT SAMPLING 169 5.7.4 TIME DOMAIN REFLECTOMETRY/TRANSMISSION 169
5.7.5 CROSSTALK 169 5.7.6 SUPPLY/SUBSTRATE NOISE 170 5.7.7 RF TESTING -
AMPLIFIER RESONANCE 171 5.7.8 LIMITATIONS OF THE PROPOSED ARCHITECTURE
IN REFERENCE 11 172 5.8 RECENT TRENDS 172 5.9 CONCLUSIONS 173 5.10
REFERENCES 174 DESIGN-FOR-TESTABILITY OF ANALOGUE FILTERS 179 YICHUANG
SUN AND MASOOD-UL HASAN 6.1 INTRODUCTION 179 6.2 DFT BY BYPASSING 181
6.2.1 BYPASSING BY BANDWIDTH BROADENING 181 6.2.2 BYPASSING USING
DUPLICATED/SWITCHED OPAMP 186 6.3 DFT BY MULTIPLEXING 188 6.3.1
TOW-THOMAS BIQUAD FILTER 188 6.3.2 THE KERWIN-HUELSMAN-NEWCOMB BIQUAD
FILTER 189 6.3.3 SECOND-ORDER OTA-C FILTER 190 6.4 OBT OF ANALOGUE
FILTERS 192 6.4.1 TEST TRANSFORMATIONS OF ACTIVE-RC FILTERS 193 6.4.2
OBT OF OTA-C FILTERS 196 6.4.3 OBT OF SC BIQUADRATIC FILTER 199 LIST OF
CONTENTS XI 6.5 TESTING OF HIGH-ORDER ANALOGUE FILTERS 201 6.5.1 TESTING
OF HIGH-ORDER FILTERS USING BYPASSING 202 6.5.2 TESTING OF HIGH-ORDER
CASCADE FILTERS USING . MULTIPLEXING 203 6.5.3 TEST OF MLF OTA-C FILTERS
USING MULTIPLEXING 205 6.5.4 OBT STRUCTURES FOR HIGH-ORDER OTA-C FILTERS
207 6.6 SUMMARY 210 6.7 REFERENCES 210 7 TEST OF A/D CONVERTERS: FROM
CONVERTER CHARACTERISTICS TO BUILT-IN SELF-TEST PROPOSALS 213 ANDREAS
LECHNER AND ANDREW RICHARDSON 7.1 INTRODUCTION 213 7.2 A/D CONVERSION
214 7.2.1 STATIC A/D CONVERTER PERFORMANCE PARAMETERS 216 7.2.2 DYNAMIC
A/D CONVERTER PERFORMANCE PARAMETERS 218 7.3 A/D CONVERTER TEST
APPROACHES 220 7.3.1 SET-UP FOR A/D CONVERTER TEST 220 7.3.2 CAPTURING
THE TEST RESPONSE 221 7.3.3 STATIC PERFORMANCE PARAMETER TEST 222 7.3.4
DYNAMIC PERFORMANCE PARAMETER TEST 226 7.4 A/D CONVERTER BUILT-IN
SELF-TEST 228 7.5 SUMMARY AND CONCLUSIONS 231 7.6 REFERENCES 232 8 TEST
OF E A CONVERTERS 235 GILDAS LEGER AND ADORACIOEN RUEDA 8.1 INTRODUCTION
235 8.2 AN OVERVIEW OF E A MODULATION: OPENING THE ADC BLACK BOX 236
8.2.1 PRINCIPLE OF OPERATION: ** MODULATION AND NOISE SHAPING 236 8.2.2
DIGITAL FILTERING AND DECIMATION 238 8.2.3 E A MODULATOR ARCHITECTURE
239 8.3 CHARACTERIZATION OF E A CONVERTERS 243 8.3.1 CONSEQUENCES OF E A
MODULATION FOR ADC CHARACTERIZATION 243 8.3.2 STATIC PERFORMANCE 244
8.3.3 DYNAMIC PERFORMANCE 246 8.3.4 APPLYING A FFT WITH SUCCESS 248 8.4
TEST OF E A CONVERTERS 254 8.4.1 LIMITATIONS OF THE FUNCTIONAL APPROACH
255 8.4.2 THE BUILT-IN SELF-TEST APPROACH 255 8.5 MODEL-BASED TESTING
259 8.5.1 MODEL-BASED TEST CONCEPTS 259 XII TEST AND DIAGNOSIS OF
ANALOGUE, MIXED-SIGNAL AND RF INTEGRATED CIRCUITS 8.5.2 POLYNOMIAL
MODEL-BASED BIST 262 8.5.3 BEHAVIOURAL MODEL-BASED BIST 264 8.6
CONCLUSIONS 271 8.7 REFERENCES 273 9 PHASE-LOCKED LOOP TEST
METHODOLOGIES: CURRENT CHARACTERIZATION AND PRODUCTION TEST PRACTICES
277 MARTIN JOHN BURBIDGE AND ANDREW RICHARDSON 9.1 INTRODUCTION:
PHASE-LOCKED LOOP OPERATION AND TEST MOTIVATIONS 277 9.1.1 PLL KEY
ELEMENTS' OPERATION AND TEST ISSUES 277 9.1.2 TYPICAL CP-PLL TEST
SPECIFICATIONS 282 9.2 TRADITIONAL TEST TECHNIQUES 287 9.2.1
CHARACTERIZATION FOCUSED TESTS 287 9.2.2 PRODUCTION TEST FOCUSED 298 9.3
BIST TECHNIQUES 301 9.4 SUMMARY AND CONCLUSIONS 306 9.5 REFERENCES 306
10 ON-CHIP TESTING TECHNIQUES FOR RF WIRELESS TRANSCEIVER SYSTEMS AND
COMPONENTS 309 ALBERTO VALDES-GARCIA, JOSE SILVA-MARTINEZ, EDGAR
SANCHEZ-SINENCIO 10.1 INTRODUCTION 309 10.2 FREQUENCY-RESPONSE TEST
SYSTEM FOR ANALOGUE BASEBAND CIRCUITS 311 10.2.1 PRINCIPLE OF OPERATION
311 10.2.2 TESTING METHODOLOGY 313 10.2.3 IMPLEMENTATION AS A COMPLETE
ON-CHIP TEST SYSTEM WITH A DIGITAL INTERFACE 314 10.2.4 EXPERIMENTAL
EVALUATION OF THE FRCS 319 10.3 CMOS AMPLITUDE DETECTOR FOR ON-CHIP
TESTING OF RF CIRCUITS 324 10.3.1 GAIN AND 1-DB COMPRESSION POINT
MEASUREMENT WITH AMPLITUDE DETECTORS 327 10.3.2 CMOS RF AMPLITUDE
DETECTOR DESIGN 328 10.3.3 EXPERIMENTAL RESULTS 330 10.4 ARCHITECTURE
FOR ON-CHIP TESTING OF WIRELESS TRANSCEIVERS 333 10.4.1 SWITCHED
LOOP-BACK ARCHITECTURE 333 10.4.2 OVERALL TESTING STRATEGY * 337 10.4.3
SIMULATION RESULTS 339 10.5 SUMMARY AND OUTLOOK 342 10.6 REFERENCES 343
LIST OF CONTENTS XIII 11 TUNING AND CALIBRATION OF ANALOGUE,
MIXED-SIGNAL AND RF CIRCUITS 347 JAMES MORITZ AND YICHUANG SUN 11.1
INTRODUCTION 347 11.2 ON-CHIP FILTER TUNING 348 11.2.1 TUNING SYSTEM
REQUIREMENTS FOR ON-CHIP FILTERS 348 11.2.2 FREQUENCY TUNING AND Q
TUNING 349 11.2.3 ONLINE AND OFFLINE TUNING 352 11.2.4 MASTER-SLAVE
TUNING 354 11.2.5 FREQUENCY TUNING METHODS 355 11.2.6 Q TUNING
TECHNIQUES 359 11.2.7 TUNING OF HIGH-ORDER LEAPFROG FILTERS 360 11.3
SELF-CALIBRATION TECHNIQUES FOR PLL FREQUENCY SYNTHESIZERS 365 11.3.1
NEED FOR CALIBRATION IN PLL SYNTHESIZERS 365 11.3.2 PLL SYNTHESIZER WITH
CALIBRATED VCO 366 11.3.3 AUTOMATIC PLL CALIBRATION 368 11.3.4 OTHER PLL
SYNTHESIZER CALIBRATION APPLICATIONS 370 11.4 ON-CHIP ANTENNA IMPEDANCE
MATCHING 371 11.4.1 REQUIREMENT FOR ON-CHIP ANTENNA IMPEDANCE MATCHING
371 11.4.2 MATCHING NETWORK 373 11.4.3 IMPEDANCE SENSORS 376 11.4.4
TUNING ALGORITHMS 377 11.5 CONCLUSIONS 378 11.6 REFERENCES 378 INDEX 383 |
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| id | DE-604.BV035311338 |
| illustrated | Illustrated |
| indexdate | 2024-07-20T05:42:18Z |
| institution | BVB |
| isbn | 9780863417450 0863417450 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017116078 |
| oclc_num | 180473599 |
| open_access_boolean | |
| owner | DE-29T DE-83 |
| owner_facet | DE-29T DE-83 |
| physical | XX, 389 S. graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Inst. of Engineering and Technology |
| record_format | marc |
| series | Circuits, devices and systems series |
| series2 | Circuits, devices and systems series |
| spelling | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun London Inst. of Engineering and Technology 2008 XX, 389 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Circuits, devices and systems series 19 Includes bibliographical references and index Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Funktionstest (DE-588)4155698-7 gnd rswk-swf Hochfrequenzschaltung (DE-588)4160147-6 gnd rswk-swf Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Analoge integrierte Schaltung (DE-588)4112519-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Analoge integrierte Schaltung (DE-588)4112519-8 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Hochfrequenzschaltung (DE-588)4160147-6 s Funktionstest (DE-588)4155698-7 s DE-604 Sun, Yichuang Sonstige oth Circuits, devices and systems series 19 (DE-604)BV035311331 19 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017116078&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach Circuits, devices and systems series Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4155698-7 (DE-588)4160147-6 (DE-588)4756481-7 (DE-588)4112519-8 |
| title | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_auth | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_exact_search | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_full | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
| title_fullStr | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
| title_full_unstemmed | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach ed. by Yichuang Sun |
| title_short | Test and diagnosis of analogue, mixed-signal and RF integrated circuits |
| title_sort | test and diagnosis of analogue mixed signal and rf integrated circuits the system on chip approach |
| title_sub | the system on chip approach |
| topic | Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung (DE-588)4027242-4 gnd Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd |
| topic_facet | Linear integrated circuits / Testing Mixed signal circuits / Testing Radio frequency integrated circuits / Testing Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Integrierte Schaltung Funktionstest Hochfrequenzschaltung Mixed-Signal-Schaltung Analoge integrierte Schaltung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017116078&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV035311331 |
| work_keys_str_mv | AT sunyichuang testanddiagnosisofanaloguemixedsignalandrfintegratedcircuitsthesystemonchipapproach |