Surface defect classification based on one-dimensional sensors and structured illumination:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Aachen
Shaker
2008
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| Schriftenreihe: | Berichte aus der Informatik
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | VI, 170 S. Ill., graph. Darst. 24 cm |
| ISBN: | 9783832275020 |
Internformat
MARC
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|---|---|---|---|
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| 007 | t | ||
| 008 | 090119s2008 ad|| m||| 00||| eng d | ||
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| 020 | |a 9783832275020 |c kart. : EUR 45.80 (DE), EUR 45.80 (AT), sfr 91.60 (freier Pr.) |9 978-3-8322-7502-0 | ||
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| 100 | 1 | |a Caulier, Yannick |e Verfasser |0 (DE-588)136824358 |4 aut | |
| 245 | 1 | 0 | |a Surface defect classification based on one-dimensional sensors and structured illumination |c Yannick Caulier |
| 264 | 1 | |a Aachen |b Shaker |c 2008 | |
| 300 | |a VI, 170 S. |b Ill., graph. Darst. |c 24 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Berichte aus der Informatik | |
| 502 | |a Zugl.: Erlangen-Nürnberg, Univ., Diss., 2008 | ||
| 650 | 4 | |a Freiformfläche - Spiegelung - Oberflächenprüfung - Texturanalyse - Beleuchtung - Deflektometrie | |
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| 650 | 0 | 7 | |a Deflektometrie |0 (DE-588)4832784-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Freiformfläche |0 (DE-588)4198736-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Beleuchtung |0 (DE-588)4112704-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Texturanalyse |0 (DE-588)4184965-6 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-017060007 | ||
Datensatz im Suchindex
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|---|---|
| adam_text | TABLE OF CONTENTS ACKNOWLEDGEMENTS I T&BLE OF CONTENTS III 1
INTRODUCTION AND OVERVIEW 1 1.1 INTRODUCTION 1 1.2 OVERVIEW 2 2
STATE-OF-THE-ART 5 2.1 MACHINE VISION SYSTEMS 6 2.1.1 VISION 6 2.1.2
MACHINE VISION 10 2.1.3 VISION SYSTEMS 12 2.2 SPECIFIC IMAGE GENERATION
AND ACQUISITION 18 2.2.1 ILLUMINATION 18 2.2.2 RECORDING GEOMETRY 20 2.3
SPECIFIC IMAGE TREATMENT AND INFORMATION 22 2.3.1 PROCESSING THE
INFORMATION 22 2.3.2 IMAGE SEGMENTATION 23 2.3.3 FEATURE EXTRACTION 24
2.3.4 CLASSIFICATION PROCEDURE 26 3 NEW CONTRIBUTIONS 29 3.1 PROBLEM
FORMULATION: CYLINDRICAL SPECULAR SURFACES 30 3.2 PROBLEM
GENERALIZATION: FREE-FORM SPECULAR AND MATT SURFACES 30 3.3 STRUCTURED
ILLUMINATION FOR SPECULAR CYLINDRICAL SURFACES 34 3.4 REFERENCE IMAGE
DATABASE 34 3.5 CLASSIFICATION USING TEXTURAL FEATURES 35 3.6
CLASSIFICATION USING SPECIFIC STRIPE FEATURES 35 3.7 CLASSIFICATION
USING COMBINED AND SELECTED FEATURES 36 4 ILLUMINATION OF SPECULAR
SURFACES: APPLICATION ON CYLINDRICAL OBJECTS 37 4.1 PROPOSED
ILLUMINATION TECHNIQUE 38 4.1.1 ADAPTED SPECULAR LIGHTING FOR THE
INSPECTION TASK 38 4.1.2 GEOMETRY OF THE STRIPE STRUCTURE IN AN IMAGE 42
BIBLIOGRAFISCHE INFORMATIONEN HTTP://D-NB.INFO/991379101 DIGITALISIERT
DURCH 4.2 INTERPRETING THE DISTURBED STRIPE STRUCTURES 44 4.2.1 STRIPE
DISTURBANCES CORRESPONDING TO 3D AND 2D DEFECTS 44 4.2.2 STRIPE
DISTURBANCES CORRESPONDING TO ARTEFACTS 46 4.3 CONCLUSION 48
ILLUMINATION OF MATT SURFACES: APPLICATION ON PLANAR OBJECTS 51 5.1
ADAPTED LIGHTING TECHNIQUE FOR MATT PLANAR SURFACES 51 5.2 INFLUENCE OF
THE CAMERA POSITION ON THE STRIPE STRUCTURE 53 5.3 DEFINING THE MOST
APPROPRIATE CAMERA POSITION 54 5.4 CONCLUSION 57 PATTERN CLASSIFLCATION
PROCESS 59 6.1 REFERENCE STRIPE PATTERNS 59 6.2 INVOLVED CLASSIFICATION
ALGORITHMS 61 6.3 INVOLVED CLASSIFICATION METHODS 63 6.4 PERFORMANCE
MEASURE OF A SET OF FEATURES 64 6.5 CONCLUSION 67 STRIPE IMAGE
CLASSIFICATION USING TEXTURAL FEATURES 69 7.1 TEXTURE ANALYSIS 69 7.2
STRUCTURAL AND STATISTICAL APPROACHES 72 7.2.1 NOTATIONS IN THE IMAGE
SPACE DOMAIN 72 7.2.2 CHEN S STRUCTURAL FEATURES 72 7.2.3 HARALICK S AND
UNSER S STATISTICAL FEATURES 74 7.3 TRANSFORM APPROACHES 78 7.3.1
DEFINITION OF THE FOURIER TRANSFORM 78 7.3.2 WAVELET S TRANSFORM
APPROACH 82 7.4 TEXTURAL APPROACH: CLASSIFICATION RESULTS SUMMARY 90
STRUCTURED ILLUMINATED SURFACE CHARACTERIZATION (SISC) METHOD 93 8.1
DESCRIPTION OF THE METHOD 94 8.1.1 DEFINING THE MOST RELEVANT
INFORMATION IN THE IMAGES 94 8.2 SEGMENTING THE BRIGHT AND DARK STRIPE
STRUCTURES 95 8.2. 8.6 SISC METHOD: SUMMARIZING THE RESULTS 124 9
FEATURE SELECTION TO IMPROVE THE CLASSIFICATION RATES 127 9.1 FEATURE
SELECTION PROCESS 128 9.1.1 GENERAL OVERVIEW 128 9.1.2 FEATURE SELECTION
FOR STRIPE PATTERNS CLASSIFICATION 130 9.2 FEATURE SELECTION FOR
SPECULAR SURFACES CHARACTERIZATION 132 9.3 CONCLUSION 134 10
GENERALIZATION OF THE METHOD TO MATT SURFACES 135 10.1 CLASSIFICATION OF
MATT SURFACES: PRINCIPLE 136 10.2 CLASSIFICATION OF FREE-FORM MATT
SURFACES 138 10.3 EVALUATION OF THE WRAPPER 1-NN APPROACH 140 10.4
CONCLUSION 142 11 CONCLUSION AND FUTURE WORK 145 11.1 CONCLUSION 145
11.2 FUTURE WORK 147 A REFERENCE IMAGE DATASETS 149 NOTATIONS AND
ABBREVIATIONS 155 INDEX 157 BIBLIOGRAPHY 159 RESUME EN FRANC,AIS 170
ZUSAMMENFASSUNG AUF DEUSTCH 170
|
| any_adam_object | 1 |
| author | Caulier, Yannick |
| author_GND | (DE-588)136824358 |
| author_facet | Caulier, Yannick |
| author_role | aut |
| author_sort | Caulier, Yannick |
| author_variant | y c yc |
| building | Verbundindex |
| bvnumber | BV035254402 |
| ctrlnum | (OCoLC)316577010 (DE-599)DNB991379101 |
| dewey-full | 670.42501535323 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 670 - Manufacturing |
| dewey-raw | 670.42501535323 |
| dewey-search | 670.42501535323 |
| dewey-sort | 3670.42501535323 |
| dewey-tens | 670 - Manufacturing |
| discipline | Werkstoffwissenschaften / Fertigungstechnik |
| format | Thesis Book |
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| genre_facet | Hochschulschrift |
| id | DE-604.BV035254402 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:29:43Z |
| institution | BVB |
| isbn | 9783832275020 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017060007 |
| oclc_num | 316577010 |
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| physical | VI, 170 S. Ill., graph. Darst. 24 cm |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Shaker |
| record_format | marc |
| series2 | Berichte aus der Informatik |
| spelling | Caulier, Yannick Verfasser (DE-588)136824358 aut Surface defect classification based on one-dimensional sensors and structured illumination Yannick Caulier Aachen Shaker 2008 VI, 170 S. Ill., graph. Darst. 24 cm txt rdacontent n rdamedia nc rdacarrier Berichte aus der Informatik Zugl.: Erlangen-Nürnberg, Univ., Diss., 2008 Freiformfläche - Spiegelung - Oberflächenprüfung - Texturanalyse - Beleuchtung - Deflektometrie Spiegelung (DE-588)4133182-5 gnd rswk-swf Oberflächenprüfung (DE-588)4172254-1 gnd rswk-swf Deflektometrie (DE-588)4832784-0 gnd rswk-swf Freiformfläche (DE-588)4198736-6 gnd rswk-swf Beleuchtung (DE-588)4112704-3 gnd rswk-swf Texturanalyse (DE-588)4184965-6 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Freiformfläche (DE-588)4198736-6 s Spiegelung (DE-588)4133182-5 s Oberflächenprüfung (DE-588)4172254-1 s Texturanalyse (DE-588)4184965-6 s Beleuchtung (DE-588)4112704-3 s Deflektometrie (DE-588)4832784-0 s DE-604 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017060007&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Caulier, Yannick Surface defect classification based on one-dimensional sensors and structured illumination Freiformfläche - Spiegelung - Oberflächenprüfung - Texturanalyse - Beleuchtung - Deflektometrie Spiegelung (DE-588)4133182-5 gnd Oberflächenprüfung (DE-588)4172254-1 gnd Deflektometrie (DE-588)4832784-0 gnd Freiformfläche (DE-588)4198736-6 gnd Beleuchtung (DE-588)4112704-3 gnd Texturanalyse (DE-588)4184965-6 gnd |
| subject_GND | (DE-588)4133182-5 (DE-588)4172254-1 (DE-588)4832784-0 (DE-588)4198736-6 (DE-588)4112704-3 (DE-588)4184965-6 (DE-588)4113937-9 |
| title | Surface defect classification based on one-dimensional sensors and structured illumination |
| title_auth | Surface defect classification based on one-dimensional sensors and structured illumination |
| title_exact_search | Surface defect classification based on one-dimensional sensors and structured illumination |
| title_full | Surface defect classification based on one-dimensional sensors and structured illumination Yannick Caulier |
| title_fullStr | Surface defect classification based on one-dimensional sensors and structured illumination Yannick Caulier |
| title_full_unstemmed | Surface defect classification based on one-dimensional sensors and structured illumination Yannick Caulier |
| title_short | Surface defect classification based on one-dimensional sensors and structured illumination |
| title_sort | surface defect classification based on one dimensional sensors and structured illumination |
| topic | Freiformfläche - Spiegelung - Oberflächenprüfung - Texturanalyse - Beleuchtung - Deflektometrie Spiegelung (DE-588)4133182-5 gnd Oberflächenprüfung (DE-588)4172254-1 gnd Deflektometrie (DE-588)4832784-0 gnd Freiformfläche (DE-588)4198736-6 gnd Beleuchtung (DE-588)4112704-3 gnd Texturanalyse (DE-588)4184965-6 gnd |
| topic_facet | Freiformfläche - Spiegelung - Oberflächenprüfung - Texturanalyse - Beleuchtung - Deflektometrie Spiegelung Oberflächenprüfung Deflektometrie Freiformfläche Beleuchtung Texturanalyse Hochschulschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017060007&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT caulieryannick surfacedefectclassificationbasedononedimensionalsensorsandstructuredillumination |