Cressler, J. D. (2008). Measurement and modeling of silicon heterostructure devices. CRC Press.
Chicago Style (17th ed.) CitationCressler, John D. Measurement and Modeling of Silicon Heterostructure Devices. Boca Raton, Fla. [u.a.]: CRC Press, 2008.
MLA (9th ed.) CitationCressler, John D. Measurement and Modeling of Silicon Heterostructure Devices. CRC Press, 2008.
Warning: These citations may not always be 100% accurate.