APA (7th ed.) Citation

(2008). Wafer level reliability of advanced CMOS devices and processes. Nova Science Publ.

Chicago Style (17th ed.) Citation

Wafer Level Reliability of Advanced CMOS Devices and Processes. New York: Nova Science Publ, 2008.

MLA (9th ed.) Citation

Wafer Level Reliability of Advanced CMOS Devices and Processes. Nova Science Publ, 2008.

Warning: These citations may not always be 100% accurate.