Testing semiconductor memories: theory and practice
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Gouda, The Netherlands
A.J. van de Goor
1998
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xxiii, 512 p. ill. 24 cm |
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Datensatz im Suchindex
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| id | DE-604.BV035077341 |
| illustrated | Illustrated |
| index_date | 2024-07-02T22:06:01Z |
| indexdate | 2024-07-09T21:21:40Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016745638 |
| oclc_num | 41111453 |
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| physical | xxiii, 512 p. ill. 24 cm |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | A.J. van de Goor |
| record_format | marc |
| spelling | Goor, A. J. +van +de Verfasser aut Testing semiconductor memories theory and practice A.J. van de Goor Gouda, The Netherlands A.J. van de Goor 1998 xxiii, 512 p. ill. 24 cm txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Semiconductor storage devices / Testing Semiconductor storage devices Testing Test (DE-588)4059549-3 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Halbleiterspeicher (DE-588)4120419-0 gnd rswk-swf Halbleiterspeicher (DE-588)4120419-0 s Test (DE-588)4059549-3 s DE-604 Testen (DE-588)4367264-4 s |
| spellingShingle | Goor, A. J. +van +de Testing semiconductor memories theory and practice Semiconductor storage devices / Testing Semiconductor storage devices Testing Test (DE-588)4059549-3 gnd Testen (DE-588)4367264-4 gnd Halbleiterspeicher (DE-588)4120419-0 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4367264-4 (DE-588)4120419-0 |
| title | Testing semiconductor memories theory and practice |
| title_auth | Testing semiconductor memories theory and practice |
| title_exact_search | Testing semiconductor memories theory and practice |
| title_exact_search_txtP | Testing semiconductor memories theory and practice |
| title_full | Testing semiconductor memories theory and practice A.J. van de Goor |
| title_fullStr | Testing semiconductor memories theory and practice A.J. van de Goor |
| title_full_unstemmed | Testing semiconductor memories theory and practice A.J. van de Goor |
| title_short | Testing semiconductor memories |
| title_sort | testing semiconductor memories theory and practice |
| title_sub | theory and practice |
| topic | Semiconductor storage devices / Testing Semiconductor storage devices Testing Test (DE-588)4059549-3 gnd Testen (DE-588)4367264-4 gnd Halbleiterspeicher (DE-588)4120419-0 gnd |
| topic_facet | Semiconductor storage devices / Testing Semiconductor storage devices Testing Test Testen Halbleiterspeicher |
| work_keys_str_mv | AT goorajvande testingsemiconductormemoriestheoryandpractice |