Testing static random access memories: defects, fault models, and test patterns
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer Academic
2004
|
| Schriftenreihe: | Frontiers in electronic testing
|
| Schlagworte: | |
| Online-Zugang: | Table of contents Publisher description |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xx, 221 p. ill. 25 cm |
| ISBN: | 1402077521 9781402077524 |
Internformat
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| 245 | 1 | 0 | |a Testing static random access memories |b defects, fault models, and test patterns |c by Said Hamdioui |
| 264 | 1 | |a Boston |b Kluwer Academic |c 2004 | |
| 300 | |a xx, 221 p. |b ill. |c 25 cm | ||
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| 490 | 0 | |a Frontiers in electronic testing | |
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Random access memory |x Testing | |
| 856 | 4 | |u http://www.loc.gov/catdir/toc/fy046/2004041373.html |3 Table of contents | |
| 856 | 4 | |u http://www.loc.gov/catdir/enhancements/fy0821/2004041373-d.html |3 Publisher description | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-016695071 | ||
Datensatz im Suchindex
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| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Illustrated |
| index_date | 2024-07-02T21:47:54Z |
| indexdate | 2024-07-09T21:20:30Z |
| institution | BVB |
| isbn | 1402077521 9781402077524 |
| language | English |
| lccn | 2004041373 |
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| physical | xx, 221 p. ill. 25 cm |
| publishDate | 2004 |
| publishDateSearch | 2004 |
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| publisher | Kluwer Academic |
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| series2 | Frontiers in electronic testing |
| spelling | Hamdioui, Said Verfasser aut Testing static random access memories defects, fault models, and test patterns by Said Hamdioui Boston Kluwer Academic 2004 xx, 221 p. ill. 25 cm txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing Includes bibliographical references and index Random access memory Testing http://www.loc.gov/catdir/toc/fy046/2004041373.html Table of contents http://www.loc.gov/catdir/enhancements/fy0821/2004041373-d.html Publisher description |
| spellingShingle | Hamdioui, Said Testing static random access memories defects, fault models, and test patterns Random access memory Testing |
| title | Testing static random access memories defects, fault models, and test patterns |
| title_auth | Testing static random access memories defects, fault models, and test patterns |
| title_exact_search | Testing static random access memories defects, fault models, and test patterns |
| title_exact_search_txtP | Testing static random access memories defects, fault models, and test patterns |
| title_full | Testing static random access memories defects, fault models, and test patterns by Said Hamdioui |
| title_fullStr | Testing static random access memories defects, fault models, and test patterns by Said Hamdioui |
| title_full_unstemmed | Testing static random access memories defects, fault models, and test patterns by Said Hamdioui |
| title_short | Testing static random access memories |
| title_sort | testing static random access memories defects fault models and test patterns |
| title_sub | defects, fault models, and test patterns |
| topic | Random access memory Testing |
| topic_facet | Random access memory Testing |
| url | http://www.loc.gov/catdir/toc/fy046/2004041373.html http://www.loc.gov/catdir/enhancements/fy0821/2004041373-d.html |
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