Are all patent examiners equal?: The impact of characteristics on patent statistics and litigation outcomes
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, Mass.
2002
|
| Schriftenreihe: | Working paper series / National Bureau of Economic Research
8980 |
| Beschreibung: | 34, [8] S. graph. Darst |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV026945455 | ||
| 003 | DE-604 | ||
| 005 | 20110228 | ||
| 007 | t | ||
| 008 | 110326s2002 d||| |||| 00||| eng d | ||
| 035 | |a (OCoLC)248201729 | ||
| 035 | |a (DE-599)BVBBV026945455 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-188 | ||
| 100 | 1 | |a Cockburn, Iain |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Are all patent examiners equal? |b The impact of characteristics on patent statistics and litigation outcomes |c Iain M. Cockburn ; Samuel Kortum ; Scott Stern |
| 264 | 1 | |a Cambridge, Mass. |c 2002 | |
| 300 | |a 34, [8] S. |b graph. Darst | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Working paper series / National Bureau of Economic Research |v 8980 | |
| 700 | 1 | |a Kortum, Samuel |e Verfasser |4 aut | |
| 700 | 1 | |a Stern, Scott |e Verfasser |4 aut | |
| 810 | 2 | |a National Bureau of Economic Research <Cambridge, Mass.> |t Working paper series |v 8980 |w (DE-604)BV002801238 |9 8980 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-021606583 | ||
Datensatz im Suchindex
| _version_ | 1804144403782041600 |
|---|---|
| any_adam_object | |
| author | Cockburn, Iain Kortum, Samuel Stern, Scott |
| author_facet | Cockburn, Iain Kortum, Samuel Stern, Scott |
| author_role | aut aut aut |
| author_sort | Cockburn, Iain |
| author_variant | i c ic s k sk s s ss |
| building | Verbundindex |
| bvnumber | BV026945455 |
| ctrlnum | (OCoLC)248201729 (DE-599)BVBBV026945455 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01059nam a2200289 cb4500</leader><controlfield tag="001">BV026945455</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20110228 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">110326s2002 d||| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)248201729</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV026945455</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-188</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Cockburn, Iain</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Are all patent examiners equal?</subfield><subfield code="b">The impact of characteristics on patent statistics and litigation outcomes</subfield><subfield code="c">Iain M. Cockburn ; Samuel Kortum ; Scott Stern</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge, Mass.</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">34, [8] S.</subfield><subfield code="b">graph. Darst</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Working paper series / National Bureau of Economic Research</subfield><subfield code="v">8980</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kortum, Samuel</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Stern, Scott</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">National Bureau of Economic Research <Cambridge, Mass.></subfield><subfield code="t">Working paper series</subfield><subfield code="v">8980</subfield><subfield code="w">(DE-604)BV002801238</subfield><subfield code="9">8980</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-021606583</subfield></datafield></record></collection> |
| id | DE-604.BV026945455 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T23:03:00Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-021606583 |
| oclc_num | 248201729 |
| open_access_boolean | |
| owner | DE-188 |
| owner_facet | DE-188 |
| physical | 34, [8] S. graph. Darst |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| record_format | marc |
| series2 | Working paper series / National Bureau of Economic Research |
| spelling | Cockburn, Iain Verfasser aut Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes Iain M. Cockburn ; Samuel Kortum ; Scott Stern Cambridge, Mass. 2002 34, [8] S. graph. Darst txt rdacontent n rdamedia nc rdacarrier Working paper series / National Bureau of Economic Research 8980 Kortum, Samuel Verfasser aut Stern, Scott Verfasser aut National Bureau of Economic Research <Cambridge, Mass.> Working paper series 8980 (DE-604)BV002801238 8980 |
| spellingShingle | Cockburn, Iain Kortum, Samuel Stern, Scott Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes |
| title | Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes |
| title_auth | Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes |
| title_exact_search | Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes |
| title_full | Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes Iain M. Cockburn ; Samuel Kortum ; Scott Stern |
| title_fullStr | Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes Iain M. Cockburn ; Samuel Kortum ; Scott Stern |
| title_full_unstemmed | Are all patent examiners equal? The impact of characteristics on patent statistics and litigation outcomes Iain M. Cockburn ; Samuel Kortum ; Scott Stern |
| title_short | Are all patent examiners equal? |
| title_sort | are all patent examiners equal the impact of characteristics on patent statistics and litigation outcomes |
| title_sub | The impact of characteristics on patent statistics and litigation outcomes |
| volume_link | (DE-604)BV002801238 |
| work_keys_str_mv | AT cockburniain areallpatentexaminersequaltheimpactofcharacteristicsonpatentstatisticsandlitigationoutcomes AT kortumsamuel areallpatentexaminersequaltheimpactofcharacteristicsonpatentstatisticsandlitigationoutcomes AT sternscott areallpatentexaminersequaltheimpactofcharacteristicsonpatentstatisticsandlitigationoutcomes |