Adaptability of scanning electron microscopy to studies of pollen morphology:
Gespeichert in:
Hauptverfasser: | , , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
1988
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Ausgabe: | [Sonderdr.] |
Beschreibung: | Aus: Aliso ; 12,1 |
Beschreibung: | S. 119 - 175 |
Internformat
MARC
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005 | 20110228 | ||
007 | t | ||
008 | 110326s1988 2||| 00||| eng d | ||
035 | |a (OCoLC)918428622 | ||
035 | |a (DE-599)BVBBV026879282 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-188 | ||
100 | 1 | |a Skvarla, John J. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Adaptability of scanning electron microscopy to studies of pollen morphology |c John J. Skvarla ; John R. Rowley ; William F. Chissoe |
250 | |a [Sonderdr.] | ||
264 | 1 | |c 1988 | |
300 | |a S. 119 - 175 | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Aus: Aliso ; 12,1 | ||
700 | 1 | |a Rowley, John R. |e Verfasser |4 aut | |
700 | 1 | |a Chissoe, William F. |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-022405597 |
Datensatz im Suchindex
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any_adam_object | |
author | Skvarla, John J. Rowley, John R. Chissoe, William F. |
author_facet | Skvarla, John J. Rowley, John R. Chissoe, William F. |
author_role | aut aut aut |
author_sort | Skvarla, John J. |
author_variant | j j s jj jjs j r r jr jrr w f c wf wfc |
building | Verbundindex |
bvnumber | BV026879282 |
ctrlnum | (OCoLC)918428622 (DE-599)BVBBV026879282 |
edition | [Sonderdr.] |
format | Book |
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id | DE-604.BV026879282 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T23:20:41Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022405597 |
oclc_num | 918428622 |
open_access_boolean | |
owner | DE-188 |
owner_facet | DE-188 |
physical | S. 119 - 175 |
publishDate | 1988 |
publishDateSearch | 1988 |
publishDateSort | 1988 |
record_format | marc |
spelling | Skvarla, John J. Verfasser aut Adaptability of scanning electron microscopy to studies of pollen morphology John J. Skvarla ; John R. Rowley ; William F. Chissoe [Sonderdr.] 1988 S. 119 - 175 txt rdacontent n rdamedia nc rdacarrier Aus: Aliso ; 12,1 Rowley, John R. Verfasser aut Chissoe, William F. Verfasser aut |
spellingShingle | Skvarla, John J. Rowley, John R. Chissoe, William F. Adaptability of scanning electron microscopy to studies of pollen morphology |
title | Adaptability of scanning electron microscopy to studies of pollen morphology |
title_auth | Adaptability of scanning electron microscopy to studies of pollen morphology |
title_exact_search | Adaptability of scanning electron microscopy to studies of pollen morphology |
title_full | Adaptability of scanning electron microscopy to studies of pollen morphology John J. Skvarla ; John R. Rowley ; William F. Chissoe |
title_fullStr | Adaptability of scanning electron microscopy to studies of pollen morphology John J. Skvarla ; John R. Rowley ; William F. Chissoe |
title_full_unstemmed | Adaptability of scanning electron microscopy to studies of pollen morphology John J. Skvarla ; John R. Rowley ; William F. Chissoe |
title_short | Adaptability of scanning electron microscopy to studies of pollen morphology |
title_sort | adaptability of scanning electron microscopy to studies of pollen morphology |
work_keys_str_mv | AT skvarlajohnj adaptabilityofscanningelectronmicroscopytostudiesofpollenmorphology AT rowleyjohnr adaptabilityofscanningelectronmicroscopytostudiesofpollenmorphology AT chissoewilliamf adaptabilityofscanningelectronmicroscopytostudiesofpollenmorphology |