Measurement techniques for thin films:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
New York, NY
Electrochemical Society
1967
|
Schlagworte: | |
Beschreibung: | VI, 364 S. graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV026831523 | ||
003 | DE-604 | ||
005 | 20130612 | ||
007 | t | ||
008 | 110326s1967 d||| |||| 00||| eng d | ||
035 | |a (OCoLC)615009581 | ||
035 | |a (DE-599)BVBBV026831523 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-188 | ||
084 | |a UP 7990 |0 (DE-625)146446: |2 rvk | ||
245 | 1 | 0 | |a Measurement techniques for thin films |c Electrochemical Society. Ed. by Bertram Schwartz ... |
264 | 1 | |a New York, NY |b Electrochemical Society |c 1967 | |
300 | |a VI, 364 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
655 | 7 | |8 1\p |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Schwartz, Bertram |e Sonstige |4 oth | |
710 | 2 | |a Electrochemical Society |e Sonstige |0 (DE-588)342-6 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-022361593 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804145461203828736 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV026831523 |
classification_rvk | UP 7990 |
ctrlnum | (OCoLC)615009581 (DE-599)BVBBV026831523 |
discipline | Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00991nam a2200289 c 4500</leader><controlfield tag="001">BV026831523</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130612 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">110326s1967 d||| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)615009581</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV026831523</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-188</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7990</subfield><subfield code="0">(DE-625)146446:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Measurement techniques for thin films</subfield><subfield code="c">Electrochemical Society. Ed. by Bertram Schwartz ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Electrochemical Society</subfield><subfield code="c">1967</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 364 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schwartz, Bertram</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electrochemical Society</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)342-6</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-022361593</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | 1\p (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV026831523 |
illustrated | Illustrated |
indexdate | 2024-07-09T23:19:49Z |
institution | BVB |
institution_GND | (DE-588)342-6 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022361593 |
oclc_num | 615009581 |
open_access_boolean | |
owner | DE-188 |
owner_facet | DE-188 |
physical | VI, 364 S. graph. Darst. |
publishDate | 1967 |
publishDateSearch | 1967 |
publishDateSort | 1967 |
publisher | Electrochemical Society |
record_format | marc |
spelling | Measurement techniques for thin films Electrochemical Society. Ed. by Bertram Schwartz ... New York, NY Electrochemical Society 1967 VI, 364 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier 1\p (DE-588)1071861417 Konferenzschrift gnd-content Schwartz, Bertram Sonstige oth Electrochemical Society Sonstige (DE-588)342-6 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Measurement techniques for thin films |
subject_GND | (DE-588)1071861417 |
title | Measurement techniques for thin films |
title_auth | Measurement techniques for thin films |
title_exact_search | Measurement techniques for thin films |
title_full | Measurement techniques for thin films Electrochemical Society. Ed. by Bertram Schwartz ... |
title_fullStr | Measurement techniques for thin films Electrochemical Society. Ed. by Bertram Schwartz ... |
title_full_unstemmed | Measurement techniques for thin films Electrochemical Society. Ed. by Bertram Schwartz ... |
title_short | Measurement techniques for thin films |
title_sort | measurement techniques for thin films |
topic_facet | Konferenzschrift |
work_keys_str_mv | AT schwartzbertram measurementtechniquesforthinfilms AT electrochemicalsociety measurementtechniquesforthinfilms |