Practical X-ray spectrometry:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Eindhoven
Philips' Gloeilampenfabrieken
1968
|
| Ausgabe: | 2. impr. |
| Schriftenreihe: | Philips technical library
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | X, 183 S. graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
| _version_ | 1804145366022488064 |
|---|---|
| adam_text | PRACTICAL X-RAY
SPECTROMETRY
R JENKINS
J L DE VR1ES
PHILIPSTECHNICALLIBRARY
CONTENTS
PREFACE V
Chapter 1: PHYSICS OF X-RAYS I
1 1 Origin of X-rays 1
111 General 1
112 Continuous radiation 2
113 Characteristic radiation 3
114 Non-diagram lines 8
115 Auger effect 8
116 Fluorescent yield 8
1 2 Production of X-rays 9
121 General 9
122 X-ray tubes 10
123 Light element excitation 11
1 3 Properties of X-rays 12
131 Absorption 12
132 Scattering of X-rays 15
133 Absorption by composite materials 16
134 Diffraction of X-rays 17
135 Conditions for diffraction 18
1 4 Excitation of fluorescence radiation in the sample 19
141 General 19
142 Excitation by monochromatic radiation 20
143 Excitation by continuous spectra 22
Chapter 2: DISPERSION 26
2 1 General 26
2 2 Geometric arrangement of the spectrometer 26
2 3 Effective range of the spectrometer 29
2 4 Dispersion efficiency 30
2 5 Broadening of line profile 31
2 6 Collimation requirements of the spectrometer 32
2 7 Reflection efficiency 34
2 8 Filters to increase resolving power 35
281 Reducing secondary radiation 35
282 Reducing primary radiation 36
2 9 Problems experienced in the application of crystal dis
persion 36
291 General condition of the crystal 36
292 Temperature effects 37
VIII CONTENTS
293 Crystal fluorescence 38
294 Abnormal reflections 39
2 10 Dispersion of soft X-rays 42
2 10 1 Organo-metallic compounds 42
2 10 2 Pseudo crystals 43
2 10 3 Diffraction gratings 44
2 11 Comparison of the methods for long wavelength dis
persion 44
Chapter 3: DETECTION 47
3 1 General 47
3 2 Gas filled detectors 48
321 The Geiger-M iiller counter 52
322 The proportional counter 53
323 The gas flow proportional counter 58
3 3 The scintillation counter 59
331 The phosphor 59
332 The photomultiplier 60
333 Characteristics of the scintillation counter 62
3 4 Comparison of detectors 63
Chapter 4: PULSE HEIGHT SELECTION 66
4 1 Principle of pulse height selection 66
4 2 Automatic pulse height selection 67
421 Variation of pulse amplitude 68
422 Variation of base line and channel settings 69
4 3 Applications of pulse height selection 69
4 4 Theoretical application of pulse height selection 70
441 Flow counter 70
442 Scintillation counter 71
4 5 Practical problems arising in pulse height selection 73
4 6 Pulse amplitude shifts 74
461 Effect of counter voltage 74
462 Count rate effect 75
463 Gas density effect 76
464 Effect of ionisable gas atoms to quench gas ratio 78
4 7 Pulse amplitude distortions 78
471 Additional peaks arising from the same wave
length giving main peak 79
472 Additional peaks not arising from the measured
wavelength * 83
CONTENTS IX
Chapter 5: COUNTING STATISTICS 87
5 1 Introduction 87
5 2 Definition of statistical terms 88
5 3 Random distribution of X-rays 91
5 4 Choice of fixed time or fixed count 93
5 5 Limit of counting error 95
5 6 Counting error in the net intensity 96
5 7 Selection of optimum counting times 99
5 8 Selectiqn of best conditions for analysis 100
5 9 Selection of best conditions for low concentrations , 101
5 10 Errors in using the ratio method 101
5 11 Selection of ratio or absolute counting method 102
5 12 Counting error versus stability 103
5 13 Counting error as a function of total numbers of counts 104
Chapter 6: MATRIX EFFECTS 105
6 1 Errors in X-ray analysis 105
6 2 Elemental interactions 108
621 Absorption 108
622 Enhancement effects 113
6 3 Physical effects 114
631 Particle size and surface effects 114
632 Effects due to chemical state 117
Chapter 7: QUANTITATIVE ANALYSIS 122
7 1 General 122
7 2 Use of standards 124
721 External standards 124
722 Internal standard (different element) 125
723 Internal standard (same element) 128
724 Use of scattered tube lines 129
7 3 Dilution techniques 130
7 4 Thin film techniques 132
7 5 Mathematical corrections 133
751 Principle of the influence factor method 133
752 Absorption correction methods 136
Chapter 8: SAMPLE PREPARATION 140
8 1 General 140
8 2 Samples requiring only a simple treatment 141
CONTENTS
821 Bulk solids (a) metals 141
822 Bulk solids (b) non-metals 144
823 Powders 145
824 Liquids 146
8 3 Samples requiring significant pre-treatment 148
831 Bulk solids 148
832 Powders 150
8 4 Samples requiring special handling treatment 151
841 Very small samples 151
842 Very dilute samples 155
843 Radioactive samples 156
Chapter 9: TRACE ANALYSIS 159
9 1 General 159
9 2 Analysis of low concentrations 159
9 3 Theoretical considerations 160
9 4 Statistical definition 160
9 5 Figure of merit (or quality function) 161
9 6 Generator stability 161
9 7 Effect of long term drift 162
9 8 Variation of detection limit with atomic number 163
9 9 Choice of excitation conditions 164
991 Choice of X-ray tube 164
992 Choice of tube current and potential 165
9 10 Effect of background 167
9 11 Removal of background by polarisation 167
9 12 Use of filters 169
9 13 Effect of the matrix 169
9 14 Analysis of limited quantities of material 171
9 15 Theoretical considerations 172
9 16 Ultimate requirements in sample size 172
9 17 Handling of small samples 173
Appendix 1(a) 175
Appendix 2 (a) 177
Appendix 2 (b) 178
Appendix 3 (a) 179
Appendix 3 (b) 180
Appendix 4 182
Index _ 184
|
| any_adam_object | 1 |
| author | Jenkins, Ron DeVries, J. L. |
| author_facet | Jenkins, Ron DeVries, J. L. |
| author_role | aut aut |
| author_sort | Jenkins, Ron |
| author_variant | r j rj j l d jl jld |
| building | Verbundindex |
| bvnumber | BV026749526 |
| classification_rvk | VG 8970 |
| ctrlnum | (OCoLC)250999391 (DE-599)BSZ044932537 |
| discipline | Chemie / Pharmazie |
| edition | 2. impr. |
| format | Book |
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| id | DE-604.BV026749526 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T23:18:18Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022287011 |
| oclc_num | 250999391 |
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| owner | DE-188 |
| owner_facet | DE-188 |
| physical | X, 183 S. graph. Darst. |
| publishDate | 1968 |
| publishDateSearch | 1968 |
| publishDateSort | 1968 |
| publisher | Philips' Gloeilampenfabrieken |
| record_format | marc |
| series2 | Philips technical library |
| spelling | Jenkins, Ron Verfasser aut Practical X-ray spectrometry R. Jenkins ; J. L. DeVries 2. impr. Eindhoven Philips' Gloeilampenfabrieken 1968 X, 183 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Philips technical library Röntgenspektroskopie (DE-588)4050331-8 gnd rswk-swf Röntgenspektroskopie (DE-588)4050331-8 s 1\p DE-604 DeVries, J. L. Verfasser aut HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=022287011&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Jenkins, Ron DeVries, J. L. Practical X-ray spectrometry Röntgenspektroskopie (DE-588)4050331-8 gnd |
| subject_GND | (DE-588)4050331-8 |
| title | Practical X-ray spectrometry |
| title_auth | Practical X-ray spectrometry |
| title_exact_search | Practical X-ray spectrometry |
| title_full | Practical X-ray spectrometry R. Jenkins ; J. L. DeVries |
| title_fullStr | Practical X-ray spectrometry R. Jenkins ; J. L. DeVries |
| title_full_unstemmed | Practical X-ray spectrometry R. Jenkins ; J. L. DeVries |
| title_short | Practical X-ray spectrometry |
| title_sort | practical x ray spectrometry |
| topic | Röntgenspektroskopie (DE-588)4050331-8 gnd |
| topic_facet | Röntgenspektroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=022287011&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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