Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Washington
Gov. Print. Off.
2002
|
| Schriftenreihe: | Journal of research of the National Institute of Standards and Technology
107,6 |
| Schlagworte: | |
| Beschreibung: | VI S., S. 483 - 727 Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV026436440 | ||
| 003 | DE-604 | ||
| 005 | 20110228 | ||
| 007 | t | ||
| 008 | 110326s2002 ad|| |||| 00||| eng d | ||
| 035 | |a (OCoLC)918473733 | ||
| 035 | |a (DE-599)BVBBV026436440 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-188 | ||
| 245 | 1 | 0 | |a Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |c [Dale E. Newbury, special issue ed.] |
| 246 | 1 | 3 | |a Accuracy barriers of quantitative electron beam x-ray microanalysis |
| 264 | 1 | |a Washington |b Gov. Print. Off. |c 2002 | |
| 300 | |a VI S., S. 483 - 727 |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Journal of research of the National Institute of Standards and Technology |v 107,6 | |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Genauigkeit |0 (DE-588)4234398-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
| 689 | 0 | 1 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 2 | |a Genauigkeit |0 (DE-588)4234398-7 |D s |
| 689 | 0 | |5 DE-188 | |
| 700 | 1 | |a Newbury, Dale E. |4 edt | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-022007780 | ||
Datensatz im Suchindex
| _version_ | 1804145004456706048 |
|---|---|
| any_adam_object | |
| author2 | Newbury, Dale E. |
| author2_role | edt |
| author2_variant | d e n de den |
| author_facet | Newbury, Dale E. |
| building | Verbundindex |
| bvnumber | BV026436440 |
| ctrlnum | (OCoLC)918473733 (DE-599)BVBBV026436440 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01304nam a2200349 cb4500</leader><controlfield tag="001">BV026436440</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20110228 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">110326s2002 ad|| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)918473733</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV026436440</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-188</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis</subfield><subfield code="c">[Dale E. Newbury, special issue ed.]</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Accuracy barriers of quantitative electron beam x-ray microanalysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington</subfield><subfield code="b">Gov. Print. Off.</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI S., S. 483 - 727</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Journal of research of the National Institute of Standards and Technology</subfield><subfield code="v">107,6</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Genauigkeit</subfield><subfield code="0">(DE-588)4234398-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Genauigkeit</subfield><subfield code="0">(DE-588)4234398-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-188</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Newbury, Dale E.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-022007780</subfield></datafield></record></collection> |
| id | DE-604.BV026436440 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T23:12:33Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-022007780 |
| oclc_num | 918473733 |
| open_access_boolean | |
| owner | DE-188 |
| owner_facet | DE-188 |
| physical | VI S., S. 483 - 727 Ill., graph. Darst. |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Gov. Print. Off. |
| record_format | marc |
| series2 | Journal of research of the National Institute of Standards and Technology |
| spelling | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] Accuracy barriers of quantitative electron beam x-ray microanalysis Washington Gov. Print. Off. 2002 VI S., S. 483 - 727 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Journal of research of the National Institute of Standards and Technology 107,6 Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Genauigkeit (DE-588)4234398-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s Elektronenmikroskopie (DE-588)4014327-2 s Genauigkeit (DE-588)4234398-7 s DE-188 Newbury, Dale E. edt |
| spellingShingle | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis Mikroanalyse (DE-588)4169804-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Genauigkeit (DE-588)4234398-7 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4014327-2 (DE-588)4234398-7 |
| title | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_alt | Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_auth | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_exact_search | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_full | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] |
| title_fullStr | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] |
| title_full_unstemmed | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] |
| title_short | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_sort | special issue accuracy barriers of quantitative electron beam x ray microanalysis |
| topic | Mikroanalyse (DE-588)4169804-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Genauigkeit (DE-588)4234398-7 gnd |
| topic_facet | Mikroanalyse Elektronenmikroskopie Genauigkeit |
| work_keys_str_mv | AT newburydalee specialissueaccuracybarriersofquantitativeelectronbeamxraymicroanalysis AT newburydalee accuracybarriersofquantitativeelectronbeamxraymicroanalysis |