Scanning electron microscopy and X-ray analysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Englewood Cliffs, NJ
PTR Prentice Hall
1993
|
| Beschreibung: | XIII, 458 S. Ill., graph. Darst. |
| ISBN: | 0138137595 |
Internformat
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Lee, Robert Edward |
| author_facet | Lee, Robert Edward |
| author_role | aut |
| author_sort | Lee, Robert Edward |
| author_variant | r e l re rel |
| building | Verbundindex |
| bvnumber | BV026150257 |
| classification_rvk | UH 6310 UH 6320 |
| ctrlnum | (OCoLC)917306599 (DE-599)BVBBV026150257 |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV026150257 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T23:06:07Z |
| institution | BVB |
| isbn | 0138137595 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-021737952 |
| oclc_num | 917306599 |
| open_access_boolean | |
| owner | DE-188 DE-B16 |
| owner_facet | DE-188 DE-B16 |
| physical | XIII, 458 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | PTR Prentice Hall |
| record_format | marc |
| spelling | Lee, Robert Edward Verfasser aut Scanning electron microscopy and X-ray analysis Robert Edward Lee Englewood Cliffs, NJ PTR Prentice Hall 1993 XIII, 458 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier |
| spellingShingle | Lee, Robert Edward Scanning electron microscopy and X-ray analysis |
| title | Scanning electron microscopy and X-ray analysis |
| title_auth | Scanning electron microscopy and X-ray analysis |
| title_exact_search | Scanning electron microscopy and X-ray analysis |
| title_full | Scanning electron microscopy and X-ray analysis Robert Edward Lee |
| title_fullStr | Scanning electron microscopy and X-ray analysis Robert Edward Lee |
| title_full_unstemmed | Scanning electron microscopy and X-ray analysis Robert Edward Lee |
| title_short | Scanning electron microscopy and X-ray analysis |
| title_sort | scanning electron microscopy and x ray analysis |
| work_keys_str_mv | AT leerobertedward scanningelectronmicroscopyandxrayanalysis |