Proceedings of the international symposium: Brookhaven, NY, August 31 - September 4, 1987
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Bibliographic Details
Corporate Author: International Symposium X-Ray Microscopy Brookhaven, NY (Author)
Other Authors: Sayre, David (Editor)
Format: Conference Proceeding Book
Language:English
Published: Berlin <<[u.a.]>> Springer 1988
Series:X-ray microscopy 2
Springer series in optical sciences 56
Subjects:
Physical Description:XIV, 454 S. Ill., graph. Darst.
ISBN:3540193928
0387193928

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