Stöchiometrie- und Schichtsdickenuntersuchungen an PVD-abgeschiedenen Al 2 O 3 - und Ta 2 O 5 -Dünnfilmen mit optischen Methoden:
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Bibliographic Details
Main Author: Beck, Uwe (Author)
Format: Thesis Book
Language:Undetermined
Published: 1990
Subjects:
Physical Description:133, 6 Bl. Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!