Fault behavior and testability of asynchronous CMOS circuits:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Darmstadt
GMD
1993
|
| Schriftenreihe: | Arbeitspapiere der GMD
721 |
| Beschreibung: | 12 S. graph. Darst. : 30 cm |
Internformat
MARC
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| 041 | |a und | ||
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| 100 | 1 | |a Vierhaus, Heinrich Theodor |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Fault behavior and testability of asynchronous CMOS circuits |c Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| 264 | 1 | |a Darmstadt |b GMD |c 1993 | |
| 300 | |a 12 S. |b graph. Darst. : 30 cm | ||
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| 490 | 1 | |a Arbeitspapiere der GMD |v 721 | |
| 700 | 1 | |a Meyer, Wolfgang |e Verfasser |4 aut | |
| 700 | 1 | |a Camposano, Raúl |e Verfasser |4 aut | |
| 830 | 0 | |a Arbeitspapiere der GMD |v 721 |w (DE-604)BV000613796 |9 721 | |
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Datensatz im Suchindex
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| author | Vierhaus, Heinrich Theodor Meyer, Wolfgang Camposano, Raúl |
| author_facet | Vierhaus, Heinrich Theodor Meyer, Wolfgang Camposano, Raúl |
| author_role | aut aut aut |
| author_sort | Vierhaus, Heinrich Theodor |
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| bvnumber | BV025995890 |
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| id | DE-604.BV025995890 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:40:53Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020376681 |
| oclc_num | 75330449 |
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| physical | 12 S. graph. Darst. : 30 cm |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | GMD |
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| series | Arbeitspapiere der GMD |
| series2 | Arbeitspapiere der GMD |
| spelling | Vierhaus, Heinrich Theodor Verfasser aut Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. Darmstadt GMD 1993 12 S. graph. Darst. : 30 cm txt rdacontent n rdamedia nc rdacarrier Arbeitspapiere der GMD 721 Meyer, Wolfgang Verfasser aut Camposano, Raúl Verfasser aut Arbeitspapiere der GMD 721 (DE-604)BV000613796 721 |
| spellingShingle | Vierhaus, Heinrich Theodor Meyer, Wolfgang Camposano, Raúl Fault behavior and testability of asynchronous CMOS circuits Arbeitspapiere der GMD |
| title | Fault behavior and testability of asynchronous CMOS circuits |
| title_auth | Fault behavior and testability of asynchronous CMOS circuits |
| title_exact_search | Fault behavior and testability of asynchronous CMOS circuits |
| title_full | Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| title_fullStr | Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| title_full_unstemmed | Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| title_short | Fault behavior and testability of asynchronous CMOS circuits |
| title_sort | fault behavior and testability of asynchronous cmos circuits |
| volume_link | (DE-604)BV000613796 |
| work_keys_str_mv | AT vierhausheinrichtheodor faultbehaviorandtestabilityofasynchronouscmoscircuits AT meyerwolfgang faultbehaviorandtestabilityofasynchronouscmoscircuits AT camposanoraul faultbehaviorandtestabilityofasynchronouscmoscircuits |