Applied charged particle optics: B
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York
Acad. Pr.
(1980)
|
| Schriftenreihe: | Advances in electronics and electron physics Supplement
13 |
| Schlagworte: | |
| Beschreibung: | XVII, 392 S. Ill. |
| ISBN: | 012014574X |
Internformat
MARC
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| 245 | 1 | 0 | |a Applied charged particle optics |n B |c Hrsg. von Albert Septier* |
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| id | DE-604.BV025956805 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:15:32Z |
| institution | BVB |
| isbn | 012014574X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019200152 |
| oclc_num | 174192748 |
| open_access_boolean | |
| owner | DE-11 DE-12 |
| owner_facet | DE-11 DE-12 |
| physical | XVII, 392 S. Ill. |
| psigel | IFKMB1101 |
| publishDate | 1980 |
| publishDateSearch | 1980 |
| publishDateSort | 1980 |
| publisher | Acad. Pr. |
| record_format | marc |
| series | Advances in electronics and electron physics Supplement |
| series2 | Advances in electronics and electron physics : Supplement Advances in electronics and electron physics. Supplement. |
| spelling | Applied charged particle optics B Hrsg. von Albert Septier* New York Acad. Pr. (1980) XVII, 392 S. Ill. txt rdacontent n rdamedia nc rdacarrier Advances in electronics and electron physics : Supplement 13,B Advances in electronics and electron physics. Supplement. ... Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Teilchenoptik (DE-588)4184613-8 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektronenstrahl (DE-588)4151894-9 gnd rswk-swf Lithografie Halbleitertechnologie (DE-588)4191584-7 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Ionenimplantation (DE-588)4027606-5 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s DE-604 Teilchenoptik (DE-588)4184613-8 s Ionenimplantation (DE-588)4027606-5 s Elektronenstrahl (DE-588)4151894-9 s Lithografie Halbleitertechnologie (DE-588)4191584-7 s Massenspektrometrie (DE-588)4037882-2 s Elektronenspektroskopie (DE-588)4014332-6 s Septier, Albert Sonstige oth (DE-604)BV002406202 B Advances in electronics and electron physics Supplement 13 (DE-604)BV001889378 13 |
| spellingShingle | Applied charged particle optics Advances in electronics and electron physics Supplement Elektronenspektroskopie (DE-588)4014332-6 gnd Teilchenoptik (DE-588)4184613-8 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektronenstrahl (DE-588)4151894-9 gnd Lithografie Halbleitertechnologie (DE-588)4191584-7 gnd Massenspektrometrie (DE-588)4037882-2 gnd Ionenimplantation (DE-588)4027606-5 gnd |
| subject_GND | (DE-588)4014332-6 (DE-588)4184613-8 (DE-588)4169804-6 (DE-588)4151894-9 (DE-588)4191584-7 (DE-588)4037882-2 (DE-588)4027606-5 |
| title | Applied charged particle optics |
| title_auth | Applied charged particle optics |
| title_exact_search | Applied charged particle optics |
| title_full | Applied charged particle optics B Hrsg. von Albert Septier* |
| title_fullStr | Applied charged particle optics B Hrsg. von Albert Septier* |
| title_full_unstemmed | Applied charged particle optics B Hrsg. von Albert Septier* |
| title_short | Applied charged particle optics |
| title_sort | applied charged particle optics |
| topic | Elektronenspektroskopie (DE-588)4014332-6 gnd Teilchenoptik (DE-588)4184613-8 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektronenstrahl (DE-588)4151894-9 gnd Lithografie Halbleitertechnologie (DE-588)4191584-7 gnd Massenspektrometrie (DE-588)4037882-2 gnd Ionenimplantation (DE-588)4027606-5 gnd |
| topic_facet | Elektronenspektroskopie Teilchenoptik Mikroanalyse Elektronenstrahl Lithografie Halbleitertechnologie Massenspektrometrie Ionenimplantation |
| volume_link | (DE-604)BV002406202 (DE-604)BV001889378 |
| work_keys_str_mv | AT septieralbert appliedchargedparticleopticsb |