Scanning force microscopy: with applications to electric, magnetic, and atomic forces
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Oxford Univ. Press
1994
|
| Ausgabe: | Rev. ed. |
| Schriftenreihe: | Oxford series in optical and imaging sciences
5 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIII, 263 S. Ill., graph. Darst. |
| ISBN: | 019509204X |
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Datensatz im Suchindex
| _version_ | 1804141382891208704 |
|---|---|
| adam_text | SCANNING FORCE MICROSCOPY WITH APPLICATIONS TO ELECTRIC, MAGNETIC AND
ATOMIC FORCES REVISED EDITION DROR SARID OPTICAL SCIENCES CENTER
UNIVERSITY OF ARIZONA-TUCSON NEW YORK OXFORD OXFORD UNIVERSITY PRESS
1994 CONTENTS PREFACE TO THE REVISED EDITION VII PREFACE IX PART ONE.
LEVERS AND NOISE CHAPTER 1 MECHANICAL PROPERTIES OF LEVERS 1 1.1.
INTRODUCTION 1 1.2. STRESS AND STRAIN 2 1.3. MOMENTS 4 1.4. SPRING
CONSTANT 5 1.5. THE RAYLEIGH SOLUTION TO A VIBRATING LEVER 7 1.6. THE
CLASSICAL SOLUTION TO A VIBRATING LEVER 9 1.7. NORMAL MODES 10 1.8.
LUMPED SYSTEMS 12 1.9. EXAMPLES 13 1.10. SUMMARY 17 CHAPTER 2 RESONANCE
ENHANCEMENT 19 2.1. INTRODUCTION 19 2.2. BIMORPH DRIVER 19 2.3.
EFFECTIVE SPRING CONSTANT 21 2.4. BIMORPH-DRIVEN LEVER 22 2.5.
SAMPLE-DRIVEN LEVER 32 2.6. TIP-DRIVEN LEVER 35 2.7. SUMMARY 37 CHAPTER
3 SOURCES OF NOISE 39 3.1. INTRODUCTION 39 3.2. GENERAL DISCUSSION OF
NOISE 39 3.3. SHOT NOISE 41 3.4. RESISTOR JOHNSON NOISE 42 3.5. LASER
INTENSITY NOISE 42 3.6. LASER PHASE NOISE 43 3.7. THERMALLY INDUCED
LEVER NOISE 46 3.8. BIMORPH NOISE 49 3.9. LEVER NOISE-LIMITED SNR 49
3.10. EXPERIMENTAL CHARACTERIZATION OF NOISE 50 3.11. SUMMARY 53 PART
TWO. SCANNING FORCE MICROSCOPES CHAPTER 4 TUNNELING DETECTION SYSTEM 55
4.1. INTRODUCTION 55 4.2. THEORY 55 4.3. PERPENDICULAR ARRANGEMENT 57
4.4. CROSS ARRANGEMENT 64 4.5. PARALLEL ARRANGEMENT 64 4.6. SERIAL
ARRANGEMENT 64 4.7. SINGLE-LEVER ARRANGEMENT 64 4.8. SUMMARY 64 CHAPTER
5 CAPACITANCE DETECTION SYSTEM 65 5.1. INTRODUCTION 65 5.2. THEORY 66
5.3. NOISE CONSIDERATIONS 68 5.4. PERFORMANCE OF SYSTEMS 69 5.5. SUMMARY
73 CHAPTER 6 HOMODYNE DETECTION SYSTEM 75 6.1. INTRODUCTION 75 6.2.
THEORY 76 6.3. NOISE CONSIDERATIONS 81 6.4. SYSTEM PERFORMANCE 84 6.5.
SUMMARY 89 CHAPTER 7 HETERODYNE DETECTION SYSTEM 91 7.1. INTRODUCTION 91
7.2. THEORY 92 7.3. NOISE CONSIDERATIONS 95 7.4. PERFORMANCE 96 7.5.
SUMMARY 99 CHAPTER 8 LASER-DIODE FEEDBACK DETECTION SYSTEM 101 8.1.
INTRODUCTION 101 8.2. THEORY 102 8.3. NOISE CONSIDERATIONS 105 8.4.
PERFORMANCE 107 8.5. SUMMARY 108 CHAPTER 9 POLARIZATION DETECTION SYSTEM
109 9.1. INTRODUCTION 109 9.2. THEORY 109 9.3. NOISE CONSIDERATIONS 113
9.4. PERFORMANCE 116 CHAPTER 10 DEFLECTION DETECTION SYSTEM 119 10.1.
INTRODUCTION 119 10.2. THEORY 120 10.3. NOISE CONSIDERATIONS 122 10.4.
PERFORMANCE 125 10.5. SUMMARY 128 PART THREE. SCANNING FORCE MICROSCOPY
CHAPTER 11 ELECTRIC FORCE MICROSCOPY 129 11.1. INTRODUCTION 129 11.2.
BASIC CONCEPTS 129 11.3. EXAMPLES 131 11.4. PRINCIPLES OF OPERATION 137
11.5. NOISE CONSIDERATIONS 145 11.6. APPLICATIONS 146 11.7. PERFORMANCE
148 11.8. SUMMARY 151 CHAPTER 12 MAGNETIC FORCE MICROSCOPY 153 12.1.
INTRODUCTION 153 12.2. BASIC CONCEPTS 153 12.3. EXAMPLES 156 12.4.
PRINCIPLES OF OPERATION 167 12.5. NOISE CONSIDERATIONS 173 12.6.
APPLICATIONS 174 12.7. PERFORMANCE 174 12.8. SUMMARY 180 CHAPTER 13
ATOMIC FORCE MICROSCOPY 181 13.1. INTRODUCTION 181 13.2. INTERMOLECULAR
MICROSCOPIC INTERACTIONS 182 13.3. INTERMOLECULAR MACROSCOPIC
INTERACTIONS 189 13.4. LEVER-TIP-SAMPLE CONTACT INTERACTIONS 197 13.5.
LEVER-TIP-SAMPLE NONCONTACT INTERACTIONS 210 13.6. EXPERIMENTAL RESULTS
FOR THE CONTACT MODE 218 REFERENCES 233 INDEX 261
|
| any_adam_object | 1 |
| author | Sarid, Dror |
| author_facet | Sarid, Dror |
| author_role | aut |
| author_sort | Sarid, Dror |
| author_variant | d s ds |
| building | Verbundindex |
| bvnumber | BV025921312 |
| classification_rvk | UH 6310 |
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| dewey-full | 502.82 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.82 |
| dewey-search | 502.82 |
| dewey-sort | 3502.82 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | Rev. ed. |
| format | Book |
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| spelling | Sarid, Dror Verfasser aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid Rev. ed. New York [u.a.] Oxford Univ. Press 1994 XIII, 263 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Oxford series in optical and imaging sciences 5 Abtastsystem (DE-588)4129844-5 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Tunneleffekt (DE-588)4136216-0 s 2\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 3\p DE-604 Abtastsystem (DE-588)4129844-5 s 4\p DE-604 Oxford series in optical and imaging sciences 5 (DE-604)BV008283319 5 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=019166281&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sarid, Dror Scanning force microscopy with applications to electric, magnetic, and atomic forces Oxford series in optical and imaging sciences Abtastsystem (DE-588)4129844-5 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Tunneleffekt (DE-588)4136216-0 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
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| title | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_auth | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_fullStr | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_full_unstemmed | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_short | Scanning force microscopy |
| title_sort | scanning force microscopy with applications to electric magnetic and atomic forces |
| title_sub | with applications to electric, magnetic, and atomic forces |
| topic | Abtastsystem (DE-588)4129844-5 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Tunneleffekt (DE-588)4136216-0 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
| topic_facet | Abtastsystem Rastertunnelmikroskopie Rasterkraftmikroskopie Tunneleffekt Elektronenmikroskop Festkörperoberfläche |
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