Experimental high-resolution electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u. a.]
Oxford Univ. Press
1988
|
| Ausgabe: | [2nd. ed.] |
| Schlagworte: | |
| Beschreibung: | XII, 427 S. |
| ISBN: | 0195054059 |
Internformat
MARC
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Datensatz im Suchindex
| _version_ | 1804141344707313664 |
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| any_adam_object | |
| author | Spence, John C. H. |
| author_facet | Spence, John C. H. |
| author_role | aut |
| author_sort | Spence, John C. H. |
| author_variant | j c h s jch jchs |
| building | Verbundindex |
| bvnumber | BV025885543 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)263152121 (DE-599)BVBBV025885543 |
| discipline | Physik |
| edition | [2nd. ed.] |
| format | Book |
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| id | DE-604.BV025885543 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:14:23Z |
| institution | BVB |
| isbn | 0195054059 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019132255 |
| oclc_num | 263152121 |
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| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XII, 427 S. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| spelling | Spence, John C. H. Verfasser aut Experimental high-resolution electron microscopy John C. H. Spence [2nd. ed.] New York [u. a.] Oxford Univ. Press 1988 XII, 427 S. txt rdacontent n rdamedia nc rdacarrier Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Struktur (DE-588)4058125-1 s 1\p DE-604 Festkörper (DE-588)4016918-2 s 2\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 3\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Spence, John C. H. Experimental high-resolution electron microscopy Elektronenbeugung (DE-588)4151862-7 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Struktur (DE-588)4058125-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| subject_GND | (DE-588)4151862-7 (DE-588)4215608-7 (DE-588)4058125-1 (DE-588)4014327-2 (DE-588)4016918-2 (DE-588)4287503-1 |
| title | Experimental high-resolution electron microscopy |
| title_auth | Experimental high-resolution electron microscopy |
| title_exact_search | Experimental high-resolution electron microscopy |
| title_full | Experimental high-resolution electron microscopy John C. H. Spence |
| title_fullStr | Experimental high-resolution electron microscopy John C. H. Spence |
| title_full_unstemmed | Experimental high-resolution electron microscopy John C. H. Spence |
| title_short | Experimental high-resolution electron microscopy |
| title_sort | experimental high resolution electron microscopy |
| topic | Elektronenbeugung (DE-588)4151862-7 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Struktur (DE-588)4058125-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| topic_facet | Elektronenbeugung Durchstrahlungselektronenmikroskopie Struktur Elektronenmikroskopie Festkörper Hochauflösendes Verfahren |
| work_keys_str_mv | AT spencejohnch experimentalhighresolutionelectronmicroscopy |