Scanning force microscopy: with applications to electric, magnetic, and atomic forces
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York [u.a.]
Oxford Univ. Press
1991
|
| Series: | Oxford series on optical sciences
2 |
| Subjects: | |
| Physical Description: | XI, 253 S. |
| ISBN: | 0195062701 |
Staff View
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Record in the Search Index
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| author | Sarid, Dror |
| author_facet | Sarid, Dror |
| author_role | aut |
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| building | Verbundindex |
| bvnumber | BV025885515 |
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| ctrlnum | (OCoLC)246734465 (DE-599)BVBBV025885515 |
| discipline | Physik |
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| id | DE-604.BV025885515 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:14:23Z |
| institution | BVB |
| isbn | 0195062701 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019132228 |
| oclc_num | 246734465 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XI, 253 S. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series | Oxford series on optical sciences |
| series2 | Oxford series on optical sciences |
| spelling | Sarid, Dror Verfasser aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid New York [u.a.] Oxford Univ. Press 1991 XI, 253 S. txt rdacontent n rdamedia nc rdacarrier Oxford series on optical sciences 2 Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 s DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s Oxford series on optical sciences 2 (DE-604)BV008283319 2 |
| spellingShingle | Sarid, Dror Scanning force microscopy with applications to electric, magnetic, and atomic forces Oxford series on optical sciences Rasterkraftmikroskopie (DE-588)4274473-8 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)4252995-5 |
| title | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_auth | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_fullStr | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_full_unstemmed | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_short | Scanning force microscopy |
| title_sort | scanning force microscopy with applications to electric magnetic and atomic forces |
| title_sub | with applications to electric, magnetic, and atomic forces |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| topic_facet | Rasterkraftmikroskopie Rastertunnelmikroskopie |
| volume_link | (DE-604)BV008283319 |
| work_keys_str_mv | AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces |