Microelectronic reliability: 1 Reliability, test and diagnostics
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Norwood, MA
Artech House
1989
|
| Beschreibung: | XVIII, 374 S. |
| ISBN: | 0890062846 |
Internformat
MARC
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| 245 | 1 | 0 | |a Microelectronic reliability |n 1 |p Reliability, test and diagnostics |c Edward B. Hakim |
| 264 | 1 | |a Norwood, MA |b Artech House |c 1989 | |
| 300 | |a XVIII, 374 S. | ||
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| 700 | 1 | |a Hakim, Edward B. |4 edt | |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-019364344 | ||
Datensatz im Suchindex
| _version_ | 1804141618649890816 |
|---|---|
| any_adam_object | |
| author2 | Hakim, Edward B. |
| author2_role | edt |
| author2_variant | e b h eb ebh |
| author_facet | Hakim, Edward B. |
| building | Verbundindex |
| bvnumber | BV025760012 |
| ctrlnum | (OCoLC)311345044 (DE-599)BVBBV025760012 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV025760012 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:18:44Z |
| institution | BVB |
| isbn | 0890062846 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019364344 |
| oclc_num | 311345044 |
| open_access_boolean | |
| owner | DE-11 |
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| physical | XVIII, 374 S. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Artech House |
| record_format | marc |
| spelling | Microelectronic reliability 1 Reliability, test and diagnostics Edward B. Hakim Norwood, MA Artech House 1989 XVIII, 374 S. txt rdacontent n rdamedia nc rdacarrier Hakim, Edward B. edt (DE-604)BV025242204 1 |
| spellingShingle | Microelectronic reliability |
| title | Microelectronic reliability |
| title_auth | Microelectronic reliability |
| title_exact_search | Microelectronic reliability |
| title_full | Microelectronic reliability 1 Reliability, test and diagnostics Edward B. Hakim |
| title_fullStr | Microelectronic reliability 1 Reliability, test and diagnostics Edward B. Hakim |
| title_full_unstemmed | Microelectronic reliability 1 Reliability, test and diagnostics Edward B. Hakim |
| title_short | Microelectronic reliability |
| title_sort | microelectronic reliability reliability test and diagnostics |
| volume_link | (DE-604)BV025242204 |
| work_keys_str_mv | AT hakimedwardb microelectronicreliability1 |