Thin film analysis by X-Ray scattering:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | German |
| Veröffentlicht: |
Weinheim
WILEY-VCH
2006
|
| Schlagworte: | |
| Beschreibung: | Druckausg. u.d.T.: Thin film analysis by X-Ray scattering (XXII, 356 S.) |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 3527607595 9783527607594 |
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Datensatz im Suchindex
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| discipline | Physik |
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| id | DE-604.BV025413047 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:33:48Z |
| institution | BVB |
| isbn | 3527607595 9783527607594 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020033511 |
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| physical | 1 Online-Ressource |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | WILEY-VCH |
| record_format | marc |
| spelling | Thin film analysis by X-Ray scattering Mario Birkholz Weinheim WILEY-VCH 2006 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Druckausg. u.d.T.: Thin film analysis by X-Ray scattering (XXII, 356 S.) Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Röntgenstreuung (DE-588)4178324-4 s DE-604 Birkholz, Mario Sonstige oth |
| spellingShingle | Thin film analysis by X-Ray scattering Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4178324-4 (DE-588)4136925-7 |
| title | Thin film analysis by X-Ray scattering |
| title_auth | Thin film analysis by X-Ray scattering |
| title_exact_search | Thin film analysis by X-Ray scattering |
| title_full | Thin film analysis by X-Ray scattering Mario Birkholz |
| title_fullStr | Thin film analysis by X-Ray scattering Mario Birkholz |
| title_full_unstemmed | Thin film analysis by X-Ray scattering Mario Birkholz |
| title_short | Thin film analysis by X-Ray scattering |
| title_sort | thin film analysis by x ray scattering |
| topic | Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | Röntgenstreuung Dünne Schicht |
| work_keys_str_mv | AT birkholzmario thinfilmanalysisbyxrayscattering |