2nd European Congress on Optics Applied to Metrology: (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France
Gespeichert in:
| Körperschaft: | |
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| Weitere Verfasser: | |
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1979
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| Schriftenreihe: | Proceedings of the SPIE
210 |
| Schlagworte: | |
| Beschreibung: | X, 228 S. Ill. |
| ISBN: | 0892522380 |
Internformat
MARC
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| 111 | 2 | |a European Congress on Optics Applied to Metrology |n 2 |d 1979 |c Straßburg |j Verfasser |0 (DE-588)818380-6 |4 aut | |
| 245 | 1 | 0 | |a 2nd European Congress on Optics Applied to Metrology |b (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France |c Eds.: Michel Grosmann ... |
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Datensatz im Suchindex
| _version_ | 1804142299804860416 |
|---|---|
| any_adam_object | |
| author2 | Grosmann, Michel |
| author2_role | edt |
| author2_variant | m g mg |
| author_corporate | European Congress on Optics Applied to Metrology Straßburg |
| author_corporate_role | aut |
| author_facet | Grosmann, Michel European Congress on Optics Applied to Metrology Straßburg |
| author_sort | European Congress on Optics Applied to Metrology Straßburg |
| building | Verbundindex |
| bvnumber | BV025243271 |
| ctrlnum | (OCoLC)917018470 (DE-599)BVBBV025243271 |
| format | Conference Proceeding Book |
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| id | DE-604.BV025243271 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:29:34Z |
| institution | BVB |
| institution_GND | (DE-588)818380-6 |
| isbn | 0892522380 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019881352 |
| oclc_num | 917018470 |
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| owner | DE-11 |
| owner_facet | DE-11 |
| physical | X, 228 S. Ill. |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| publisher | SPIE |
| record_format | marc |
| series2 | Proceedings of the SPIE |
| spelling | European Congress on Optics Applied to Metrology 2 1979 Straßburg Verfasser (DE-588)818380-6 aut 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France Eds.: Michel Grosmann ... Bellingham, Wash. SPIE 1979 X, 228 S. Ill. txt rdacontent n rdamedia nc rdacarrier Proceedings of the SPIE 210 Holografie (DE-588)4025643-1 gnd rswk-swf Anwendung (DE-588)4196864-5 gnd rswk-swf Konferenz (DE-588)4032055-8 gnd rswk-swf Speckle-Interferometrie (DE-588)4182122-1 gnd rswk-swf Messung (DE-588)4038852-9 gnd rswk-swf Metrologie (DE-588)4169749-2 gnd rswk-swf Optik (DE-588)4043650-0 gnd rswk-swf Optik (DE-588)4043650-0 s DE-604 Anwendung (DE-588)4196864-5 s Metrologie (DE-588)4169749-2 s Speckle-Interferometrie (DE-588)4182122-1 s Holografie (DE-588)4025643-1 s Messung (DE-588)4038852-9 s Konferenz (DE-588)4032055-8 s Grosmann, Michel edt Society of Photo-Optical Instrumentation Engineers Proceedings of the SPIE 210 (DE-604)BV000010887 210 |
| spellingShingle | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France Holografie (DE-588)4025643-1 gnd Anwendung (DE-588)4196864-5 gnd Konferenz (DE-588)4032055-8 gnd Speckle-Interferometrie (DE-588)4182122-1 gnd Messung (DE-588)4038852-9 gnd Metrologie (DE-588)4169749-2 gnd Optik (DE-588)4043650-0 gnd |
| subject_GND | (DE-588)4025643-1 (DE-588)4196864-5 (DE-588)4032055-8 (DE-588)4182122-1 (DE-588)4038852-9 (DE-588)4169749-2 (DE-588)4043650-0 |
| title | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France |
| title_auth | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France |
| title_exact_search | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France |
| title_full | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France Eds.: Michel Grosmann ... |
| title_fullStr | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France Eds.: Michel Grosmann ... |
| title_full_unstemmed | 2nd European Congress on Optics Applied to Metrology (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France Eds.: Michel Grosmann ... |
| title_short | 2nd European Congress on Optics Applied to Metrology |
| title_sort | 2nd european congress on optics applied to metrology metrop presented as part of the optics photonics and ionics engineering meeting opiem november 26 30 1979 strasbourg france |
| title_sub | (METROP) ; presented as part of the Optics, Photonics, and Ionics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France |
| topic | Holografie (DE-588)4025643-1 gnd Anwendung (DE-588)4196864-5 gnd Konferenz (DE-588)4032055-8 gnd Speckle-Interferometrie (DE-588)4182122-1 gnd Messung (DE-588)4038852-9 gnd Metrologie (DE-588)4169749-2 gnd Optik (DE-588)4043650-0 gnd |
| topic_facet | Holografie Anwendung Konferenz Speckle-Interferometrie Messung Metrologie Optik |
| volume_link | (DE-604)BV000010887 |
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