Applications of optical metrology - techniques and measurements II: April 7-8, 1983, Arlington, Virginia
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1983
|
| Schriftenreihe: | Proceedings of the SPIE
416 |
| Schlagworte: | |
| Beschreibung: | VI, 214 S. Ill. |
| ISBN: | 0892524510 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV025243211 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s1983 a||| |||| 00||| und d | ||
| 020 | |a 0892524510 |9 0-89252-451-0 | ||
| 035 | |a (OCoLC)917018216 | ||
| 035 | |a (DE-599)BVBBV025243211 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-11 |a DE-83 | ||
| 245 | 1 | 0 | |a Applications of optical metrology - techniques and measurements II |b April 7-8, 1983, Arlington, Virginia |c Ed.: John J. Lee |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1983 | |
| 300 | |a VI, 214 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Proceedings of the SPIE |v 416 | |
| 650 | 0 | 7 | |a Messung |0 (DE-588)4038852-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Technik |0 (DE-588)4059205-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Radiometrie |0 (DE-588)4048219-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optik |0 (DE-588)4043650-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Metrologie |0 (DE-588)4169749-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Holografie |0 (DE-588)4025643-1 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Optik |0 (DE-588)4043650-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Metrologie |0 (DE-588)4169749-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Technik |0 (DE-588)4059205-4 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Messung |0 (DE-588)4038852-9 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a Radiometrie |0 (DE-588)4048219-4 |D s |
| 689 | 4 | |5 DE-604 | |
| 689 | 5 | 0 | |a Holografie |0 (DE-588)4025643-1 |D s |
| 689 | 5 | |5 DE-604 | |
| 700 | 1 | |a Lee, John J. |4 edt | |
| 810 | 2 | |a Society of Photo-Optical Instrumentation Engineers |t Proceedings of the SPIE |v 416 |w (DE-604)BV000010887 |9 416 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019881294 | ||
Datensatz im Suchindex
| _version_ | 1804142299700002816 |
|---|---|
| any_adam_object | |
| author2 | Lee, John J. |
| author2_role | edt |
| author2_variant | j j l jj jjl |
| author_facet | Lee, John J. |
| building | Verbundindex |
| bvnumber | BV025243211 |
| ctrlnum | (OCoLC)917018216 (DE-599)BVBBV025243211 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01705nam a2200493 cb4500</leader><controlfield tag="001">BV025243211</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s1983 a||| |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0892524510</subfield><subfield code="9">0-89252-451-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)917018216</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025243211</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Applications of optical metrology - techniques and measurements II</subfield><subfield code="b">April 7-8, 1983, Arlington, Virginia</subfield><subfield code="c">Ed.: John J. Lee</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1983</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 214 S.</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings of the SPIE</subfield><subfield code="v">416</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messung</subfield><subfield code="0">(DE-588)4038852-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Technik</subfield><subfield code="0">(DE-588)4059205-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Radiometrie</subfield><subfield code="0">(DE-588)4048219-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optik</subfield><subfield code="0">(DE-588)4043650-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Metrologie</subfield><subfield code="0">(DE-588)4169749-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Holografie</subfield><subfield code="0">(DE-588)4025643-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Optik</subfield><subfield code="0">(DE-588)4043650-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Metrologie</subfield><subfield code="0">(DE-588)4169749-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Technik</subfield><subfield code="0">(DE-588)4059205-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Messung</subfield><subfield code="0">(DE-588)4038852-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Radiometrie</subfield><subfield code="0">(DE-588)4048219-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Holografie</subfield><subfield code="0">(DE-588)4025643-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lee, John J.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="t">Proceedings of the SPIE</subfield><subfield code="v">416</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">416</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019881294</subfield></datafield></record></collection> |
| id | DE-604.BV025243211 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:29:34Z |
| institution | BVB |
| isbn | 0892524510 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019881294 |
| oclc_num | 917018216 |
| open_access_boolean | |
| owner | DE-11 DE-83 |
| owner_facet | DE-11 DE-83 |
| physical | VI, 214 S. Ill. |
| publishDate | 1983 |
| publishDateSearch | 1983 |
| publishDateSort | 1983 |
| publisher | SPIE |
| record_format | marc |
| series2 | Proceedings of the SPIE |
| spelling | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia Ed.: John J. Lee Bellingham, Wash. SPIE 1983 VI, 214 S. Ill. txt rdacontent n rdamedia nc rdacarrier Proceedings of the SPIE 416 Messung (DE-588)4038852-9 gnd rswk-swf Technik (DE-588)4059205-4 gnd rswk-swf Radiometrie (DE-588)4048219-4 gnd rswk-swf Optik (DE-588)4043650-0 gnd rswk-swf Metrologie (DE-588)4169749-2 gnd rswk-swf Holografie (DE-588)4025643-1 gnd rswk-swf Optik (DE-588)4043650-0 s DE-604 Metrologie (DE-588)4169749-2 s Technik (DE-588)4059205-4 s Messung (DE-588)4038852-9 s Radiometrie (DE-588)4048219-4 s Holografie (DE-588)4025643-1 s Lee, John J. edt Society of Photo-Optical Instrumentation Engineers Proceedings of the SPIE 416 (DE-604)BV000010887 416 |
| spellingShingle | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia Messung (DE-588)4038852-9 gnd Technik (DE-588)4059205-4 gnd Radiometrie (DE-588)4048219-4 gnd Optik (DE-588)4043650-0 gnd Metrologie (DE-588)4169749-2 gnd Holografie (DE-588)4025643-1 gnd |
| subject_GND | (DE-588)4038852-9 (DE-588)4059205-4 (DE-588)4048219-4 (DE-588)4043650-0 (DE-588)4169749-2 (DE-588)4025643-1 |
| title | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia |
| title_auth | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia |
| title_exact_search | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia |
| title_full | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia Ed.: John J. Lee |
| title_fullStr | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia Ed.: John J. Lee |
| title_full_unstemmed | Applications of optical metrology - techniques and measurements II April 7-8, 1983, Arlington, Virginia Ed.: John J. Lee |
| title_short | Applications of optical metrology - techniques and measurements II |
| title_sort | applications of optical metrology techniques and measurements ii april 7 8 1983 arlington virginia |
| title_sub | April 7-8, 1983, Arlington, Virginia |
| topic | Messung (DE-588)4038852-9 gnd Technik (DE-588)4059205-4 gnd Radiometrie (DE-588)4048219-4 gnd Optik (DE-588)4043650-0 gnd Metrologie (DE-588)4169749-2 gnd Holografie (DE-588)4025643-1 gnd |
| topic_facet | Messung Technik Radiometrie Optik Metrologie Holografie |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT leejohnj applicationsofopticalmetrologytechniquesandmeasurementsiiapril781983arlingtonvirginia |