Practical scanning electron microscopy: electron and ion microprobe analysis
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Plenum Press
1976
|
| Ausgabe: | 2nd print. |
| Schlagworte: | |
| Beschreibung: | XVIII, 582 S.: Ill. |
| ISBN: | 0306308207 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV025241826 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s1976 |||| 00||| eng d | ||
| 020 | |a 0306308207 |9 0-306-30820-7 | ||
| 035 | |a (OCoLC)635855141 | ||
| 035 | |a (DE-599)BVBBV025241826 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 |a DE-188 | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 245 | 1 | 0 | |a Practical scanning electron microscopy |b electron and ion microprobe analysis |c Joseph I. Goldstein ... |
| 250 | |a 2nd print. | ||
| 264 | 1 | |a New York [u.a.] |b Plenum Press |c 1976 | |
| 300 | |a XVIII, 582 S.: Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenoptik |0 (DE-588)4151879-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Messtechnik |0 (DE-588)4114575-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Material |0 (DE-588)4169078-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenoptik |0 (DE-588)4151879-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Messtechnik |0 (DE-588)4114575-6 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a Material |0 (DE-588)4169078-3 |D s |
| 689 | 4 | |5 DE-604 | |
| 689 | 5 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 5 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Goldstein, Joseph I. |4 edt | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019880112 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804142297999212544 |
|---|---|
| any_adam_object | |
| author2 | Goldstein, Joseph I. |
| author2_role | edt |
| author2_variant | j i g ji jig |
| author_facet | Goldstein, Joseph I. |
| building | Verbundindex |
| bvnumber | BV025241826 |
| classification_rvk | UH 6300 UH 6310 |
| ctrlnum | (OCoLC)635855141 (DE-599)BVBBV025241826 |
| discipline | Physik |
| edition | 2nd print. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01864nam a2200517 c 4500</leader><controlfield tag="001">BV025241826</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s1976 |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0306308207</subfield><subfield code="9">0-306-30820-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)635855141</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025241826</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Practical scanning electron microscopy</subfield><subfield code="b">electron and ion microprobe analysis</subfield><subfield code="c">Joseph I. Goldstein ...</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2nd print.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York [u.a.]</subfield><subfield code="b">Plenum Press</subfield><subfield code="c">1976</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVIII, 582 S.: Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenoptik</subfield><subfield code="0">(DE-588)4151879-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Material</subfield><subfield code="0">(DE-588)4169078-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenoptik</subfield><subfield code="0">(DE-588)4151879-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Material</subfield><subfield code="0">(DE-588)4169078-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Goldstein, Joseph I.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019880112</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV025241826 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:29:32Z |
| institution | BVB |
| isbn | 0306308207 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019880112 |
| oclc_num | 635855141 |
| open_access_boolean | |
| owner | DE-11 DE-188 |
| owner_facet | DE-11 DE-188 |
| physical | XVIII, 582 S.: Ill. |
| publishDate | 1976 |
| publishDateSearch | 1976 |
| publishDateSort | 1976 |
| publisher | Plenum Press |
| record_format | marc |
| spelling | Practical scanning electron microscopy electron and ion microprobe analysis Joseph I. Goldstein ... 2nd print. New York [u.a.] Plenum Press 1976 XVIII, 582 S.: Ill. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Material (DE-588)4169078-3 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Elektronenoptik (DE-588)4151879-2 s Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Messtechnik (DE-588)4114575-6 s Material (DE-588)4169078-3 s Rasterelektronenmikroskopie (DE-588)4048455-5 s 1\p DE-604 Goldstein, Joseph I. edt 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Practical scanning electron microscopy electron and ion microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenoptik (DE-588)4151879-2 gnd Messtechnik (DE-588)4114575-6 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Material (DE-588)4169078-3 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4048455-5 (DE-588)4151879-2 (DE-588)4114575-6 (DE-588)4151898-6 (DE-588)4169078-3 |
| title | Practical scanning electron microscopy electron and ion microprobe analysis |
| title_auth | Practical scanning electron microscopy electron and ion microprobe analysis |
| title_exact_search | Practical scanning electron microscopy electron and ion microprobe analysis |
| title_full | Practical scanning electron microscopy electron and ion microprobe analysis Joseph I. Goldstein ... |
| title_fullStr | Practical scanning electron microscopy electron and ion microprobe analysis Joseph I. Goldstein ... |
| title_full_unstemmed | Practical scanning electron microscopy electron and ion microprobe analysis Joseph I. Goldstein ... |
| title_short | Practical scanning electron microscopy |
| title_sort | practical scanning electron microscopy electron and ion microprobe analysis |
| title_sub | electron and ion microprobe analysis |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenoptik (DE-588)4151879-2 gnd Messtechnik (DE-588)4114575-6 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Material (DE-588)4169078-3 gnd |
| topic_facet | Elektronenmikroskopie Rasterelektronenmikroskopie Elektronenoptik Messtechnik Elektronenstrahlmikroanalyse Material |
| work_keys_str_mv | AT goldsteinjosephi practicalscanningelectronmicroscopyelectronandionmicroprobeanalysis |