Electron microscopy and analysis:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London [u.a.]
Taylor & Francis
2000
|
| Ausgabe: | 3. ed. |
| Schlagworte: | |
| Beschreibung: | X, 251 S. Ill. |
| ISBN: | 0748409688 |
Internformat
MARC
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| 100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| 250 | |a 3. ed. | ||
| 264 | 1 | |a London [u.a.] |b Taylor & Francis |c 2000 | |
| 300 | |a X, 251 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
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| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
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| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Humphreys, John |e Verfasser |4 aut | |
| 700 | 1 | |a Beanland, Richard |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019833589 | ||
Datensatz im Suchindex
| _version_ | 1804142241042661376 |
|---|---|
| any_adam_object | |
| author | Goodhew, Peter J. Humphreys, John Beanland, Richard |
| author_facet | Goodhew, Peter J. Humphreys, John Beanland, Richard |
| author_role | aut aut aut |
| author_sort | Goodhew, Peter J. |
| author_variant | p j g pj pjg j h jh r b rb |
| building | Verbundindex |
| bvnumber | BV025192652 |
| classification_rvk | UH 6300 WC 3100 |
| ctrlnum | (OCoLC)247548201 (DE-599)BVBBV025192652 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik Biologie |
| edition | 3. ed. |
| format | Book |
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| id | DE-604.BV025192652 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:28:38Z |
| institution | BVB |
| isbn | 0748409688 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019833589 |
| oclc_num | 247548201 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | X, 251 S. Ill. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Taylor & Francis |
| record_format | marc |
| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland 3. ed. London [u.a.] Taylor & Francis 2000 X, 251 S. Ill. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Humphreys, John Verfasser aut Beanland, Richard Verfasser aut |
| spellingShingle | Goodhew, Peter J. Humphreys, John Beanland, Richard Electron microscopy and analysis Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Electron microscopy and analysis |
| title_auth | Electron microscopy and analysis |
| title_exact_search | Electron microscopy and analysis |
| title_full | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| title_fullStr | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| title_short | Electron microscopy and analysis |
| title_sort | electron microscopy and analysis |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenmikroskopie |
| work_keys_str_mv | AT goodhewpeterj electronmicroscopyandanalysis AT humphreysjohn electronmicroscopyandanalysis AT beanlandrichard electronmicroscopyandanalysis |