Characterization of high Tc materials and devices by electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge [u.a.]
Cambridge Univ. Press
1999
|
| Schlagworte: | |
| Beschreibung: | XII, 391 S. Ill. |
| ISBN: | 052155490X |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV024984219 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s1999 a||| |||| 00||| eng d | ||
| 020 | |a 052155490X |9 0-521-55490-X | ||
| 035 | |a (OCoLC)611235420 | ||
| 035 | |a (DE-599)BVBBV024984219 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 | ||
| 082 | 0 | |a 537.6230284 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UP 2200 |0 (DE-625)146356: |2 rvk | ||
| 100 | 1 | |a Browning, Nigel D. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Characterization of high Tc materials and devices by electron microscopy |c ed. by Nigel D. Browning ... |
| 264 | 1 | |a Cambridge [u.a.] |b Cambridge Univ. Press |c 1999 | |
| 300 | |a XII, 391 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hochtemperatursupraleiter |0 (DE-588)4220922-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Hochtemperatursupraleiter |0 (DE-588)4220922-5 |D s |
| 689 | 0 | 1 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019650774 | ||
Datensatz im Suchindex
| _version_ | 1804142015547441152 |
|---|---|
| any_adam_object | |
| author | Browning, Nigel D. |
| author_facet | Browning, Nigel D. |
| author_role | aut |
| author_sort | Browning, Nigel D. |
| author_variant | n d b nd ndb |
| building | Verbundindex |
| bvnumber | BV024984219 |
| classification_rvk | UH 6300 UP 2200 |
| ctrlnum | (OCoLC)611235420 (DE-599)BVBBV024984219 |
| dewey-full | 537.6230284 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6230284 |
| dewey-search | 537.6230284 |
| dewey-sort | 3537.6230284 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01181nam a2200349zc 4500</leader><controlfield tag="001">BV024984219</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s1999 a||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">052155490X</subfield><subfield code="9">0-521-55490-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)611235420</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024984219</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.6230284</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2200</subfield><subfield code="0">(DE-625)146356:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Browning, Nigel D.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Characterization of high Tc materials and devices by electron microscopy</subfield><subfield code="c">ed. by Nigel D. Browning ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge [u.a.]</subfield><subfield code="b">Cambridge Univ. Press</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 391 S.</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochtemperatursupraleiter</subfield><subfield code="0">(DE-588)4220922-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Hochtemperatursupraleiter</subfield><subfield code="0">(DE-588)4220922-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019650774</subfield></datafield></record></collection> |
| id | DE-604.BV024984219 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:25:03Z |
| institution | BVB |
| isbn | 052155490X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019650774 |
| oclc_num | 611235420 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XII, 391 S. Ill. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Cambridge Univ. Press |
| record_format | marc |
| spelling | Browning, Nigel D. Verfasser aut Characterization of high Tc materials and devices by electron microscopy ed. by Nigel D. Browning ... Cambridge [u.a.] Cambridge Univ. Press 1999 XII, 391 S. Ill. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hochtemperatursupraleiter (DE-588)4220922-5 gnd rswk-swf Hochtemperatursupraleiter (DE-588)4220922-5 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 |
| spellingShingle | Browning, Nigel D. Characterization of high Tc materials and devices by electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Hochtemperatursupraleiter (DE-588)4220922-5 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4220922-5 |
| title | Characterization of high Tc materials and devices by electron microscopy |
| title_auth | Characterization of high Tc materials and devices by electron microscopy |
| title_exact_search | Characterization of high Tc materials and devices by electron microscopy |
| title_full | Characterization of high Tc materials and devices by electron microscopy ed. by Nigel D. Browning ... |
| title_fullStr | Characterization of high Tc materials and devices by electron microscopy ed. by Nigel D. Browning ... |
| title_full_unstemmed | Characterization of high Tc materials and devices by electron microscopy ed. by Nigel D. Browning ... |
| title_short | Characterization of high Tc materials and devices by electron microscopy |
| title_sort | characterization of high tc materials and devices by electron microscopy |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Hochtemperatursupraleiter (DE-588)4220922-5 gnd |
| topic_facet | Elektronenmikroskopie Hochtemperatursupraleiter |
| work_keys_str_mv | AT browningnigeld characterizationofhightcmaterialsanddevicesbyelectronmicroscopy |