Electron microscopy applications to materials science: proceedings of an International Workshop, held in China, Gauonzhou, August 1988
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Bibliographic Details
Other Authors: Kuo, K. H. (Editor)
Format: Book
Language:English
Published: Vaduz [u.a.] SCI-Tech Publ. 1989
Series:Diffusion and defect data B 5
Subjects:
Physical Description:209 S. Ill.
ISBN:3908044014

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Interlibrary loan Place Request Caution: Not in THWS collection!