Electron microscopy applications to materials science: proceedings of an International Workshop, held in China, Gauonzhou, August 1988
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Vaduz [u.a.]
SCI-Tech Publ.
1989
|
| Schriftenreihe: | Diffusion and defect data B
5 |
| Schlagworte: | |
| Beschreibung: | 209 S. Ill. |
| ISBN: | 3908044014 |
Internformat
MARC
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| 245 | 1 | 0 | |a Electron microscopy applications to materials science |b proceedings of an International Workshop, held in China, Gauonzhou, August 1988 |c ed.: K. H. Kuo |
| 264 | 1 | |a Vaduz [u.a.] |b SCI-Tech Publ. |c 1989 | |
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Datensatz im Suchindex
| _version_ | 1804142015078727680 |
|---|---|
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| author2 | Kuo, K. H. |
| author2_role | edt |
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| building | Verbundindex |
| bvnumber | BV024983740 |
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| ctrlnum | (OCoLC)916928901 (DE-599)BVBBV024983740 |
| discipline | Physik |
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| id | DE-604.BV024983740 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:25:02Z |
| institution | BVB |
| isbn | 3908044014 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019650365 |
| oclc_num | 916928901 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | 209 S. Ill. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | SCI-Tech Publ. |
| record_format | marc |
| series | Diffusion and defect data B |
| series2 | Diffusion and defect data : Part B, Solid state phenomena |
| spelling | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo Vaduz [u.a.] SCI-Tech Publ. 1989 209 S. Ill. txt rdacontent n rdamedia nc rdacarrier Diffusion and defect data : Part B, Solid state phenomena 5 Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Kuo, K. H. edt Diffusion and defect data B 5 (DE-604)BV021637351 5 |
| spellingShingle | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 Diffusion and defect data B Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4079184-1 |
| title | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 |
| title_auth | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 |
| title_exact_search | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 |
| title_full | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo |
| title_fullStr | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo |
| title_full_unstemmed | Electron microscopy applications to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo |
| title_short | Electron microscopy applications to materials science |
| title_sort | electron microscopy applications to materials science proceedings of an international workshop held in china gauonzhou august 1988 |
| title_sub | proceedings of an International Workshop, held in China, Gauonzhou, August 1988 |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Elektronenmikroskopie Werkstoffkunde |
| volume_link | (DE-604)BV021637351 |
| work_keys_str_mv | AT kuokh electronmicroscopyapplicationstomaterialsscienceproceedingsofaninternationalworkshopheldinchinagauonzhouaugust1988 |