Untersuchungen elektronischer Zustände an Korngrenzen in Silizium:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Abschlussarbeit Mikrofilm Buch |
Sprache: | German |
Veröffentlicht: |
1983
|
Schlagworte: | |
Beschreibung: | Mikrofiche-Ausg. |
Beschreibung: | 216 S. Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a22000002c 4500 | ||
---|---|---|---|
001 | BV024845529 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | he|uuuuuuuuuu | ||
008 | 100417s1983 ad|| bm||| 00||| ger d | ||
015 | |a 83,H10,0385 |2 dnb | ||
016 | 7 | |a 830974865 |2 DE-101 | |
035 | |a (OCoLC)916974912 | ||
035 | |a (DE-599)BVBBV024845529 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a ger | |
049 | |a DE-11 | ||
100 | 1 | |a Werner, Jürgen Heinz |e Verfasser |4 aut | |
245 | 1 | 0 | |a Untersuchungen elektronischer Zustände an Korngrenzen in Silizium |c Jürgen Heinz Werner |
264 | 1 | |c 1983 | |
300 | |a 216 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b h |2 rdamedia | ||
338 | |b he |2 rdacarrier | ||
500 | |a Mikrofiche-Ausg. | ||
502 | |a Stuttgart, Univ., Diss., 1983 | ||
650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenzustand |0 (DE-588)4263453-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Korngrenze |0 (DE-588)4137128-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Bandstruktur |0 (DE-588)4143994-6 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
689 | 0 | 0 | |a Silicium |0 (DE-588)4077445-4 |D s |
689 | 0 | 1 | |a Korngrenze |0 (DE-588)4137128-8 |D s |
689 | 0 | 2 | |a Elektronenzustand |0 (DE-588)4263453-2 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Korngrenze |0 (DE-588)4137128-8 |D s |
689 | 1 | 1 | |a Bandstruktur |0 (DE-588)4143994-6 |D s |
689 | 1 | |8 1\p |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-019522669 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804141844411449344 |
---|---|
any_adam_object | |
author | Werner, Jürgen Heinz |
author_facet | Werner, Jürgen Heinz |
author_role | aut |
author_sort | Werner, Jürgen Heinz |
author_variant | j h w jh jhw |
building | Verbundindex |
bvnumber | BV024845529 |
ctrlnum | (OCoLC)916974912 (DE-599)BVBBV024845529 |
format | Thesis Microfilm Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01545nam a22004452c 4500</leader><controlfield tag="001">BV024845529</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">he|uuuuuuuuuu</controlfield><controlfield tag="008">100417s1983 ad|| bm||| 00||| ger d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">83,H10,0385</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">830974865</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916974912</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024845529</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">ger</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Werner, Jürgen Heinz</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Untersuchungen elektronischer Zustände an Korngrenzen in Silizium</subfield><subfield code="c">Jürgen Heinz Werner</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1983</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">216 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">h</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">he</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Mikrofiche-Ausg.</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="a">Stuttgart, Univ., Diss., 1983</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenzustand</subfield><subfield code="0">(DE-588)4263453-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Korngrenze</subfield><subfield code="0">(DE-588)4137128-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bandstruktur</subfield><subfield code="0">(DE-588)4143994-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Korngrenze</subfield><subfield code="0">(DE-588)4137128-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Elektronenzustand</subfield><subfield code="0">(DE-588)4263453-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Korngrenze</subfield><subfield code="0">(DE-588)4137128-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Bandstruktur</subfield><subfield code="0">(DE-588)4143994-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019522669</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV024845529 |
illustrated | Illustrated |
indexdate | 2024-07-09T22:22:20Z |
institution | BVB |
language | German |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019522669 |
oclc_num | 916974912 |
open_access_boolean | |
owner | DE-11 |
owner_facet | DE-11 |
physical | 216 S. Ill., graph. Darst. |
publishDate | 1983 |
publishDateSearch | 1983 |
publishDateSort | 1983 |
record_format | marc |
spelling | Werner, Jürgen Heinz Verfasser aut Untersuchungen elektronischer Zustände an Korngrenzen in Silizium Jürgen Heinz Werner 1983 216 S. Ill., graph. Darst. txt rdacontent h rdamedia he rdacarrier Mikrofiche-Ausg. Stuttgart, Univ., Diss., 1983 Silicium (DE-588)4077445-4 gnd rswk-swf Elektronenzustand (DE-588)4263453-2 gnd rswk-swf Korngrenze (DE-588)4137128-8 gnd rswk-swf Bandstruktur (DE-588)4143994-6 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Korngrenze (DE-588)4137128-8 s Elektronenzustand (DE-588)4263453-2 s DE-604 Bandstruktur (DE-588)4143994-6 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Werner, Jürgen Heinz Untersuchungen elektronischer Zustände an Korngrenzen in Silizium Silicium (DE-588)4077445-4 gnd Elektronenzustand (DE-588)4263453-2 gnd Korngrenze (DE-588)4137128-8 gnd Bandstruktur (DE-588)4143994-6 gnd |
subject_GND | (DE-588)4077445-4 (DE-588)4263453-2 (DE-588)4137128-8 (DE-588)4143994-6 (DE-588)4113937-9 |
title | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium |
title_auth | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium |
title_exact_search | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium |
title_full | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium Jürgen Heinz Werner |
title_fullStr | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium Jürgen Heinz Werner |
title_full_unstemmed | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium Jürgen Heinz Werner |
title_short | Untersuchungen elektronischer Zustände an Korngrenzen in Silizium |
title_sort | untersuchungen elektronischer zustande an korngrenzen in silizium |
topic | Silicium (DE-588)4077445-4 gnd Elektronenzustand (DE-588)4263453-2 gnd Korngrenze (DE-588)4137128-8 gnd Bandstruktur (DE-588)4143994-6 gnd |
topic_facet | Silicium Elektronenzustand Korngrenze Bandstruktur Hochschulschrift |
work_keys_str_mv | AT wernerjurgenheinz untersuchungenelektronischerzustandeankorngrenzeninsilizium |