ESD protection devices for CMOS technologies: processing impact, modeling, and testing issues
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Aachen
Shaker
1999
|
| Ausgabe: | Als Ms. gedr. |
| Schriftenreihe: | Berichte aus der Halbleitertechnik
|
| Schlagworte: | |
| Beschreibung: | XI, 316 S. Ill., graph. Darst. |
| ISBN: | 3826566645 |
Internformat
MARC
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| 100 | 1 | |a Russ, Christian |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ESD protection devices for CMOS technologies |b processing impact, modeling, and testing issues |c Christian Russ |
| 250 | |a Als Ms. gedr. | ||
| 264 | 1 | |a Aachen |b Shaker |c 1999 | |
| 300 | |a XI, 316 S. |b Ill., graph. Darst. | ||
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| 502 | |b Dissertation |c Technische Universität München |d 1999 | ||
| 650 | 0 | 7 | |a Schutz |g Elektrotechnik |0 (DE-588)4128586-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
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| 655 | 7 | |8 1\p |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
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| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
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| any_adam_object | |
| author | Russ, Christian |
| author_facet | Russ, Christian |
| author_role | aut |
| author_sort | Russ, Christian |
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| bvnumber | BV024701598 |
| ctrlnum | (OCoLC)957987480 (DE-599)BVBBV024701598 |
| edition | Als Ms. gedr. |
| format | Thesis Book |
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| genre | 1\p (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV024701598 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:08:09Z |
| institution | BVB |
| isbn | 3826566645 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018823072 |
| oclc_num | 957987480 |
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| owner_facet | DE-634 |
| physical | XI, 316 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Shaker |
| record_format | marc |
| series2 | Berichte aus der Halbleitertechnik |
| spelling | Russ, Christian Verfasser aut ESD protection devices for CMOS technologies processing impact, modeling, and testing issues Christian Russ Als Ms. gedr. Aachen Shaker 1999 XI, 316 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Berichte aus der Halbleitertechnik Dissertation Technische Universität München 1999 Schutz Elektrotechnik (DE-588)4128586-4 gnd rswk-swf CMOS (DE-588)4010319-5 gnd rswk-swf Elektrostatische Entladung (DE-588)4401020-5 gnd rswk-swf 1\p (DE-588)4113937-9 Hochschulschrift gnd-content CMOS (DE-588)4010319-5 s Elektrostatische Entladung (DE-588)4401020-5 s Schutz Elektrotechnik (DE-588)4128586-4 s DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Russ, Christian ESD protection devices for CMOS technologies processing impact, modeling, and testing issues Schutz Elektrotechnik (DE-588)4128586-4 gnd CMOS (DE-588)4010319-5 gnd Elektrostatische Entladung (DE-588)4401020-5 gnd |
| subject_GND | (DE-588)4128586-4 (DE-588)4010319-5 (DE-588)4401020-5 (DE-588)4113937-9 |
| title | ESD protection devices for CMOS technologies processing impact, modeling, and testing issues |
| title_auth | ESD protection devices for CMOS technologies processing impact, modeling, and testing issues |
| title_exact_search | ESD protection devices for CMOS technologies processing impact, modeling, and testing issues |
| title_full | ESD protection devices for CMOS technologies processing impact, modeling, and testing issues Christian Russ |
| title_fullStr | ESD protection devices for CMOS technologies processing impact, modeling, and testing issues Christian Russ |
| title_full_unstemmed | ESD protection devices for CMOS technologies processing impact, modeling, and testing issues Christian Russ |
| title_short | ESD protection devices for CMOS technologies |
| title_sort | esd protection devices for cmos technologies processing impact modeling and testing issues |
| title_sub | processing impact, modeling, and testing issues |
| topic | Schutz Elektrotechnik (DE-588)4128586-4 gnd CMOS (DE-588)4010319-5 gnd Elektrostatische Entladung (DE-588)4401020-5 gnd |
| topic_facet | Schutz Elektrotechnik CMOS Elektrostatische Entladung Hochschulschrift |
| work_keys_str_mv | AT russchristian esdprotectiondevicesforcmostechnologiesprocessingimpactmodelingandtestingissues |