LSI/VLSI Testability Design:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
New York <<[u.a.]>>
McGraw-Hill
1987
|
| Ausgabe: | 1. [print] |
| Schlagworte: | |
| Beschreibung: | XV, 702 S. Ill. |
| ISBN: | 0070653410 |
Internformat
MARC
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| 035 | |a (OCoLC)299600047 | ||
| 035 | |a (DE-599)BVBBV024693414 | ||
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| 041 | |a und | ||
| 049 | |a DE-83 | ||
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| 100 | 1 | |a Tsui, Frank F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a LSI/VLSI Testability Design |
| 250 | |a 1. [print] | ||
| 264 | 1 | |a New York <<[u.a.]>> |b McGraw-Hill |c 1987 | |
| 300 | |a XV, 702 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
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Datensatz im Suchindex
| _version_ | 1804140105993027584 |
|---|---|
| any_adam_object | |
| author | Tsui, Frank F. |
| author_facet | Tsui, Frank F. |
| author_role | aut |
| author_sort | Tsui, Frank F. |
| author_variant | f f t ff fft |
| building | Verbundindex |
| bvnumber | BV024693414 |
| classification_rvk | ST 190 ZN 4030 ZN 4950 |
| ctrlnum | (OCoLC)299600047 (DE-599)BVBBV024693414 |
| dewey-full | 621.3950287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3950287 |
| dewey-search | 621.3950287 |
| dewey-sort | 3621.3950287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. [print] |
| format | Book |
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| id | DE-604.BV024693414 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:54:42Z |
| institution | BVB |
| isbn | 0070653410 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018104271 |
| oclc_num | 299600047 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XV, 702 S. Ill. |
| psigel | TUB-nve |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | McGraw-Hill |
| record_format | marc |
| spelling | Tsui, Frank F. Verfasser aut LSI/VLSI Testability Design 1. [print] New York <<[u.a.]>> McGraw-Hill 1987 XV, 702 S. Ill. txt rdacontent n rdamedia nc rdacarrier Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 s DE-604 |
| spellingShingle | Tsui, Frank F. LSI/VLSI Testability Design Schaltungsentwurf (DE-588)4179389-4 gnd |
| subject_GND | (DE-588)4179389-4 |
| title | LSI/VLSI Testability Design |
| title_auth | LSI/VLSI Testability Design |
| title_exact_search | LSI/VLSI Testability Design |
| title_full | LSI/VLSI Testability Design |
| title_fullStr | LSI/VLSI Testability Design |
| title_full_unstemmed | LSI/VLSI Testability Design |
| title_short | LSI/VLSI Testability Design |
| title_sort | lsi vlsi testability design |
| topic | Schaltungsentwurf (DE-588)4179389-4 gnd |
| topic_facet | Schaltungsentwurf |
| work_keys_str_mv | AT tsuifrankf lsivlsitestabilitydesign |