Verfügbarkeit: Practical Scanning Electron Microscopy

Practical Scanning Electron Microscopy: electron and ion microprobe analysis

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Bibliographische Detailangaben
Weitere Verfasser:	Goldstein, Joseph I. (HerausgeberIn)
Format:	Buch
Sprache:	Undetermined
Veröffentlicht:	New York Plenum Pr. 1975
Schlagworte:	Material Messtechnik Rasterelektronenmikroskopie Elektronenoptik Elektronenmikroskopie Elektronenstrahlmikroanalyse
Beschreibung:	XVIII, 582 S.
ISBN:	0306308207

Internformat

MARC


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Datensatz im Suchindex

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author_facet	Goldstein, Joseph I.
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format	Book
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illustrated	Not Illustrated
indexdate	2024-07-09T21:54:37Z
institution	BVB
isbn	0306308207
language	Undetermined
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owner	DE-83
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physical	XVIII, 582 S.
psigel	TUB-nse
publishDate	1975
publishDateSearch	1975
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publisher	Plenum Pr.
record_format	marc
spelling	Practical Scanning Electron Microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ... New York Plenum Pr. 1975 XVIII, 582 S. txt rdacontent n rdamedia nc rdacarrier Material (DE-588)4169078-3 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s 1\p DE-604 Elektronenoptik (DE-588)4151879-2 s 2\p DE-604 Material (DE-588)4169078-3 s 3\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 4\p DE-604 Messtechnik (DE-588)4114575-6 s 5\p DE-604 Goldstein, Joseph I. edt 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Practical Scanning Electron Microscopy electron and ion microprobe analysis Material (DE-588)4169078-3 gnd Messtechnik (DE-588)4114575-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenoptik (DE-588)4151879-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd
subject_GND	(DE-588)4169078-3 (DE-588)4114575-6 (DE-588)4048455-5 (DE-588)4151879-2 (DE-588)4014327-2 (DE-588)4151898-6
title	Practical Scanning Electron Microscopy electron and ion microprobe analysis
title_auth	Practical Scanning Electron Microscopy electron and ion microprobe analysis
title_exact_search	Practical Scanning Electron Microscopy electron and ion microprobe analysis
title_full	Practical Scanning Electron Microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...
title_fullStr	Practical Scanning Electron Microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...
title_full_unstemmed	Practical Scanning Electron Microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...
title_short	Practical Scanning Electron Microscopy
title_sort	practical scanning electron microscopy electron and ion microprobe analysis
title_sub	electron and ion microprobe analysis
topic	Material (DE-588)4169078-3 gnd Messtechnik (DE-588)4114575-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenoptik (DE-588)4151879-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd
topic_facet	Material Messtechnik Rasterelektronenmikroskopie Elektronenoptik Elektronenmikroskopie Elektronenstrahlmikroanalyse
work_keys_str_mv	AT goldsteinjosephi practicalscanningelectronmicroscopyelectronandionmicroprobeanalysis

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