Verfügbarkeit: LSI VLSI testability design

LSI VLSI testability design:

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	Tsui, Frank F. (VerfasserIn)
Format:	Buch
Sprache:	Undetermined
Veröffentlicht:	New York, Hamburg <<[u.a.]>> McGraw-Hill 1987
Schlagworte:	Entwurf Testen Prüftechnik Integrierte Schaltung LSI Schaltungsentwurf VLSI
Beschreibung:	XV, 702 S.

Internformat

MARC


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Datensatz im Suchindex

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dewey-tens	620 - Engineering and allied operations
discipline	Informatik Elektrotechnik / Elektronik / Nachrichtentechnik
format	Book
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illustrated	Not Illustrated
indexdate	2024-07-09T21:54:00Z
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owner	DE-83
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physical	XV, 702 S.
publishDate	1987
publishDateSearch	1987
publishDateSort	1987
publisher	McGraw-Hill
record_format	marc
spelling	Tsui, Frank F. Verfasser aut LSI VLSI testability design Frank F. Tsui New York, Hamburg <<[u.a.]>> McGraw-Hill 1987 XV, 702 S. txt rdacontent n rdamedia nc rdacarrier Entwurf (DE-588)4121208-3 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf LSI (DE-588)4168200-2 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Entwurf (DE-588)4121208-3 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 LSI (DE-588)4168200-2 s Testen (DE-588)4367264-4 s 2\p DE-604 VLSI (DE-588)4117388-0 s 3\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Tsui, Frank F. LSI VLSI testability design Entwurf (DE-588)4121208-3 gnd Testen (DE-588)4367264-4 gnd Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd LSI (DE-588)4168200-2 gnd Schaltungsentwurf (DE-588)4179389-4 gnd VLSI (DE-588)4117388-0 gnd
subject_GND	(DE-588)4121208-3 (DE-588)4367264-4 (DE-588)4047610-8 (DE-588)4027242-4 (DE-588)4168200-2 (DE-588)4179389-4 (DE-588)4117388-0
title	LSI VLSI testability design
title_auth	LSI VLSI testability design
title_exact_search	LSI VLSI testability design
title_full	LSI VLSI testability design Frank F. Tsui
title_fullStr	LSI VLSI testability design Frank F. Tsui
title_full_unstemmed	LSI VLSI testability design Frank F. Tsui
title_short	LSI VLSI testability design
title_sort	lsi vlsi testability design
topic	Entwurf (DE-588)4121208-3 gnd Testen (DE-588)4367264-4 gnd Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd LSI (DE-588)4168200-2 gnd Schaltungsentwurf (DE-588)4179389-4 gnd VLSI (DE-588)4117388-0 gnd
topic_facet	Entwurf Testen Prüftechnik Integrierte Schaltung LSI Schaltungsentwurf VLSI
work_keys_str_mv	AT tsuifrankf lsivlsitestabilitydesign

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