Failure mechanisms in semiconductor devices:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | Undetermined |
| Published: |
Chichester <<[u.a.]>>
Wiley
1987
|
| Subjects: | |
| Physical Description: | XIII, 205 S. Ill., graph. Darst. |
| ISBN: | 0471914347 |
Staff View
MARC
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Record in the Search Index
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| id | DE-604.BV024631967 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:53:45Z |
| institution | BVB |
| isbn | 0471914347 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018044345 |
| oclc_num | 246635870 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XIII, 205 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Wiley |
| record_format | marc |
| spelling | Amerasekera, E. A. Verfasser aut Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell Chichester <<[u.a.]>> Wiley 1987 XIII, 205 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Defekt (DE-588)4202158-3 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Defekt (DE-588)4202158-3 s 1\p DE-604 Störstelle (DE-588)4193400-3 s 2\p DE-604 Campbell, David S. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Amerasekera, E. A. Failure mechanisms in semiconductor devices Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4202158-3 (DE-588)4193400-3 (DE-588)4113826-0 |
| title | Failure mechanisms in semiconductor devices |
| title_auth | Failure mechanisms in semiconductor devices |
| title_exact_search | Failure mechanisms in semiconductor devices |
| title_full | Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell |
| title_fullStr | Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell |
| title_full_unstemmed | Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell |
| title_short | Failure mechanisms in semiconductor devices |
| title_sort | failure mechanisms in semiconductor devices |
| topic | Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Defekt Störstelle Halbleiterbauelement |
| work_keys_str_mv | AT amerasekeraea failuremechanismsinsemiconductordevices AT campbelldavids failuremechanismsinsemiconductordevices |