Failure mechanisms in semiconductor devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Chichester <<[u.a.]>>
Wiley
1987
|
| Schlagworte: | |
| Beschreibung: | XIII, 205 S. Ill., graph. Darst. |
| ISBN: | 0471914347 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024631967 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s1987 ad|| |||| 00||| und d | ||
| 020 | |a 0471914347 |9 0-471-91434-7 | ||
| 035 | |a (OCoLC)246635870 | ||
| 035 | |a (DE-599)BVBBV024631967 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 100 | 1 | |a Amerasekera, E. A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Failure mechanisms in semiconductor devices |c E. A. Amerasekera and D. S. Campbell |
| 264 | 1 | |a Chichester <<[u.a.]>> |b Wiley |c 1987 | |
| 300 | |a XIII, 205 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Defekt |0 (DE-588)4202158-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Defekt |0 (DE-588)4202158-3 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 1 | 1 | |a Störstelle |0 (DE-588)4193400-3 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 700 | 1 | |a Campbell, David S. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018044345 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804140046941421568 |
|---|---|
| any_adam_object | |
| author | Amerasekera, E. A. |
| author_facet | Amerasekera, E. A. |
| author_role | aut |
| author_sort | Amerasekera, E. A. |
| author_variant | e a a ea eaa |
| building | Verbundindex |
| bvnumber | BV024631967 |
| ctrlnum | (OCoLC)246635870 (DE-599)BVBBV024631967 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01431nam a2200397 c 4500</leader><controlfield tag="001">BV024631967</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1987 ad|| |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0471914347</subfield><subfield code="9">0-471-91434-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)246635870</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024631967</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Amerasekera, E. A.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Failure mechanisms in semiconductor devices</subfield><subfield code="c">E. A. Amerasekera and D. S. Campbell</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chichester <<[u.a.]>></subfield><subfield code="b">Wiley</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 205 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Defekt</subfield><subfield code="0">(DE-588)4202158-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Defekt</subfield><subfield code="0">(DE-588)4202158-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Campbell, David S.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018044345</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV024631967 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:53:45Z |
| institution | BVB |
| isbn | 0471914347 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018044345 |
| oclc_num | 246635870 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XIII, 205 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Wiley |
| record_format | marc |
| spelling | Amerasekera, E. A. Verfasser aut Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell Chichester <<[u.a.]>> Wiley 1987 XIII, 205 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Defekt (DE-588)4202158-3 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Defekt (DE-588)4202158-3 s 1\p DE-604 Störstelle (DE-588)4193400-3 s 2\p DE-604 Campbell, David S. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Amerasekera, E. A. Failure mechanisms in semiconductor devices Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4202158-3 (DE-588)4193400-3 (DE-588)4113826-0 |
| title | Failure mechanisms in semiconductor devices |
| title_auth | Failure mechanisms in semiconductor devices |
| title_exact_search | Failure mechanisms in semiconductor devices |
| title_full | Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell |
| title_fullStr | Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell |
| title_full_unstemmed | Failure mechanisms in semiconductor devices E. A. Amerasekera and D. S. Campbell |
| title_short | Failure mechanisms in semiconductor devices |
| title_sort | failure mechanisms in semiconductor devices |
| topic | Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Defekt Störstelle Halbleiterbauelement |
| work_keys_str_mv | AT amerasekeraea failuremechanismsinsemiconductordevices AT campbelldavids failuremechanismsinsemiconductordevices |